Research paperTheoreticalComputational MultiscaleConsiderations for extracting moiré-level strain from dark field intensities in transmission electron microscopyIsaac M. Craig, Madeline Van Winkle, Colin Ophus, D. Kwabena BediakoarXiv·2024·10.1063/5.0222102·arXiv:2406.04515AbstractBragg interferometry (BI) is an imaging technique based on four-dimensional scanning transmission electron microscopy (4D-STEM) wherein the intensities of select overlapping Bragg disks are fit or more qualitatively analyzed to determine local stacking order. This work analyzes limitations of BI for extracting moiré-scale strain, compares numerical approaches for strain extraction, and illustrates current capabilities using simulated multi-slice data and re-processing of published data.Read more
Simulated twisted bilayer graphene / moiré system used to test Bragg interferometry intensity fitting and strain extraction.No measurements recordedCStudied MaterialExpand
Research paperTheoreticalComputational MultiscaleConsiderations for extracting moiré-level strain from dark field intensities in transmission electron microscopyIsaac M. Craig, Madeline Van Winkle, Colin Ophus, D. Kwabena BediakoarXiv·2024·10.1063/5.0222102·arXiv:2406.04515AbstractBragg interferometry (BI) is an imaging technique based on four-dimensional scanning transmission electron microscopy (4D-STEM) wherein the intensities of select overlapping Bragg disks are fit or more qualitatively analyzed to determine local stacking order. This work analyzes limitations of BI for extracting moiré-scale strain, compares numerical approaches for strain extraction, and illustrates current capabilities using simulated multi-slice data and re-processing of published data.Read more
Simulated twisted bilayer graphene / moiré system used to test Bragg interferometry intensity fitting and strain extraction.No measurements recordedCStudied MaterialExpand
Research paperTheoreticalComputational MultiscaleConsiderations for extracting moiré-level strain from dark field intensities in transmission electron microscopyIsaac M. Craig, Madeline Van Winkle, Colin Ophus, D. Kwabena BediakoarXiv·2024·10.1063/5.0222102·arXiv:2406.04515AbstractBragg interferometry (BI) is an imaging technique based on four-dimensional scanning transmission electron microscopy (4D-STEM) wherein the intensities of select overlapping Bragg disks are fit or more qualitatively analyzed to determine local stacking order. This work analyzes limitations of BI for extracting moiré-scale strain, compares numerical approaches for strain extraction, and illustrates current capabilities using simulated multi-slice data and re-processing of published data.Read more
Simulated twisted bilayer graphene / moiré system used to test Bragg interferometry intensity fitting and strain extraction.No measurements recordedCStudied MaterialExpand
Research paperTheoreticalComputational MultiscaleConsiderations for extracting moiré-level strain from dark field intensities in transmission electron microscopyIsaac M. Craig, Madeline Van Winkle, Colin Ophus, D. Kwabena BediakoarXiv·2024·10.1063/5.0222102·arXiv:2406.04515AbstractBragg interferometry (BI) is an imaging technique based on four-dimensional scanning transmission electron microscopy (4D-STEM) wherein the intensities of select overlapping Bragg disks are fit or more qualitatively analyzed to determine local stacking order. This work analyzes limitations of BI for extracting moiré-scale strain, compares numerical approaches for strain extraction, and illustrates current capabilities using simulated multi-slice data and re-processing of published data.Read more
Simulated twisted bilayer graphene / moiré system used to test Bragg interferometry intensity fitting and strain extraction.No measurements recordedCStudied MaterialExpand