Patent
US 9,011,986media (generic)
resin
carbon nano-tubes
single-walled carbon nano-tubes
double-walled carbon nano-tubes
graphene
carbon nanofibers
SEM images of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for different dispersion time periods: 0.5 h (I), 1 h (II), and 2 h (III). Inset: TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication. Figure 2.
C1s XPS spectra of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for 1 h dispersion. Figure 3.
TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication (inset in Figure 2(b)(III)).
SEM images of pure epoxy resin (Figure 5a), low magnification SEM of MWCNTs well-dispersed in epoxy resin (Figure 5b), and high magnification SEM images of individual MWCNTs well-dispersed in epoxy resin (Figures 5c–e).
Low and high magnification SEM images of an aligned MWCNT sheet. Figure 7.
3D AFM image showing a MWCNT over a trench on a Si wafer; applied bending force as a function of net MWCNT deflection. Figure 8.
| 1–999 nm |
| — |
Duration | 1800–18000 s | — |
Duration | 1–3.5 hours | — |
Duration | 1.5–3 hours | — |
Thickness | ≥ 1 nm | — |
media (generic)
resin
carbon nano-tubes
single-walled carbon nano-tubes
double-walled carbon nano-tubes
graphene
carbon nanofibers
SEM images of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for different dispersion time periods: 0.5 h (I), 1 h (II), and 2 h (III). Inset: TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication. Figure 2.
C1s XPS spectra of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for 1 h dispersion. Figure 3.
TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication (inset in Figure 2(b)(III)).
SEM images of pure epoxy resin (Figure 5a), low magnification SEM of MWCNTs well-dispersed in epoxy resin (Figure 5b), and high magnification SEM images of individual MWCNTs well-dispersed in epoxy resin (Figures 5c–e).
Low and high magnification SEM images of an aligned MWCNT sheet. Figure 7.
3D AFM image showing a MWCNT over a trench on a Si wafer; applied bending force as a function of net MWCNT deflection. Figure 8.
| 1–999 nm |
| — |
Duration | 1800–18000 s | — |
Duration | 1–3.5 hours | — |
Duration | 1.5–3 hours | — |
Thickness | ≥ 1 nm | — |
media (generic)
resin
carbon nano-tubes
single-walled carbon nano-tubes
double-walled carbon nano-tubes
graphene
carbon nanofibers
SEM images of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for different dispersion time periods: 0.5 h (I), 1 h (II), and 2 h (III). Inset: TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication. Figure 2.
C1s XPS spectra of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for 1 h dispersion. Figure 3.
TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication (inset in Figure 2(b)(III)).
SEM images of pure epoxy resin (Figure 5a), low magnification SEM of MWCNTs well-dispersed in epoxy resin (Figure 5b), and high magnification SEM images of individual MWCNTs well-dispersed in epoxy resin (Figures 5c–e).
Low and high magnification SEM images of an aligned MWCNT sheet. Figure 7.
3D AFM image showing a MWCNT over a trench on a Si wafer; applied bending force as a function of net MWCNT deflection. Figure 8.
| 1–999 nm |
| — |
Duration | 1800–18000 s | — |
Duration | 1–3.5 hours | — |
Duration | 1.5–3 hours | — |
Thickness | ≥ 1 nm | — |
media (generic)
resin
carbon nano-tubes
single-walled carbon nano-tubes
double-walled carbon nano-tubes
graphene
carbon nanofibers
SEM images of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for different dispersion time periods: 0.5 h (I), 1 h (II), and 2 h (III). Inset: TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication. Figure 2.
C1s XPS spectra of dispersed MWCNTs with (a) ultrasonication only and (b) coupled HP and ultrasonication for 1 h dispersion. Figure 3.
TEM image of dispersed MWCNTs with coupled HP and 2 h ultrasonication (inset in Figure 2(b)(III)).
SEM images of pure epoxy resin (Figure 5a), low magnification SEM of MWCNTs well-dispersed in epoxy resin (Figure 5b), and high magnification SEM images of individual MWCNTs well-dispersed in epoxy resin (Figures 5c–e).
Low and high magnification SEM images of an aligned MWCNT sheet. Figure 7.
3D AFM image showing a MWCNT over a trench on a Si wafer; applied bending force as a function of net MWCNT deflection. Figure 8.
| 1–999 nm |
| — |
Duration | 1800–18000 s | — |
Duration | 1–3.5 hours | — |
Duration | 1.5–3 hours | — |
Thickness | ≥ 1 nm | — |