Patent
US 10,739,288OF THE INVENTION: APPARATUS AND METHOD FOR TESTING
Hak-Sung KIM
US
Copyright © 2026 Matter42. All rights reserved.
Patent
Atlas literature
Patent
US 10,739,288Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
The apparatus according to claim 1, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
The apparatus according to claim 2, wherein the pulsed or continuous light source is provided in plurality. Previously presented
The apparatus according to claim 2, wherein the terahertz waves have wavelengths of 30 [m to 3 mm. Original
The apparatus according to claim 1, wherein the light processing unit comprises: a graphene holder adapted to fix the graphene, a light emitter placed above the graphene holder and comprising a light source adapted to irradiate the terahertz waves, and a photosensor adapted to receive the terahertz waves reflected from or transmitted through the graphene. Previously presented
The apparatus according to claim 1, further comprising: a restoration unit for irradiating electromagnetic waves onto the oxidized regions of the graphene detected in the determination unit to reduce the oxidized regions. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed or continuous and have wavelengths of 160 nm to 2.5 [im. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed and have a pulse width of 0.1 to 10 m s, a pulse gap of 0.1 to 100 m s, and a pulse number of 1 to 1,000. Original
A method for testing [[the]] conductivity of graphene, the method comprising: (a) fixing the graphene to a specimen stage; (b) irradiating terahertz waves onto the graphene; (c) detecting terahertz waves reflected from or transmitted through the graphene; (d) analyzing the detected terahertz waves to distinguish the oxidized region and reduced region of the graphene based on the reflectance or transmittance of the terahertz waves from the graphene to obtain an image; and (e) identifying oxidized regions of the graphene on the image. Currently amended
The method according to claim 9, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
1: The method according to claim 9, wherein the terahertz waves are irradiated from one or more light sources. Original
The method according to claim 9, wherein the terahertz waves have wavelengths of 30 p m to 3 mm. Original
The method according to claim 9, further comprising: irradiating electromagnetic waves onto the oxidized regions of the graphene detected in (e) to reduce the oxidized regions. Previously presented
The method according to claim 9, wherein the graphene is an electrode device or a transparent electrode. Original
The apparatus according to claim 1, wherein the display unit graphically displays distributions of the oxidized and reduced regions of the graphene. Previously presented
Layer stacks claimed or described, ordered top of device to substrate.
apparatus for testing conductivity of graphene
No layer stack recorded.
Materials described outside the worked examples.
graphene
graphene oxide (oxidized graphene region)
Patent
Atlas literature
Patent
US 10,739,288Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
The apparatus according to claim 1, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
The apparatus according to claim 2, wherein the pulsed or continuous light source is provided in plurality. Previously presented
The apparatus according to claim 2, wherein the terahertz waves have wavelengths of 30 [m to 3 mm. Original
The apparatus according to claim 1, wherein the light processing unit comprises: a graphene holder adapted to fix the graphene, a light emitter placed above the graphene holder and comprising a light source adapted to irradiate the terahertz waves, and a photosensor adapted to receive the terahertz waves reflected from or transmitted through the graphene. Previously presented
The apparatus according to claim 1, further comprising: a restoration unit for irradiating electromagnetic waves onto the oxidized regions of the graphene detected in the determination unit to reduce the oxidized regions. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed or continuous and have wavelengths of 160 nm to 2.5 [im. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed and have a pulse width of 0.1 to 10 m s, a pulse gap of 0.1 to 100 m s, and a pulse number of 1 to 1,000. Original
A method for testing [[the]] conductivity of graphene, the method comprising: (a) fixing the graphene to a specimen stage; (b) irradiating terahertz waves onto the graphene; (c) detecting terahertz waves reflected from or transmitted through the graphene; (d) analyzing the detected terahertz waves to distinguish the oxidized region and reduced region of the graphene based on the reflectance or transmittance of the terahertz waves from the graphene to obtain an image; and (e) identifying oxidized regions of the graphene on the image. Currently amended
The method according to claim 9, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
1: The method according to claim 9, wherein the terahertz waves are irradiated from one or more light sources. Original
The method according to claim 9, wherein the terahertz waves have wavelengths of 30 p m to 3 mm. Original
The method according to claim 9, further comprising: irradiating electromagnetic waves onto the oxidized regions of the graphene detected in (e) to reduce the oxidized regions. Previously presented
The method according to claim 9, wherein the graphene is an electrode device or a transparent electrode. Original
The apparatus according to claim 1, wherein the display unit graphically displays distributions of the oxidized and reduced regions of the graphene. Previously presented
Layer stacks claimed or described, ordered top of device to substrate.
apparatus for testing conductivity of graphene
No layer stack recorded.
Materials described outside the worked examples.
graphene
graphene oxide (oxidized graphene region)
Patent
Atlas literature
Patent
US 10,739,288Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
The apparatus according to claim 1, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
The apparatus according to claim 2, wherein the pulsed or continuous light source is provided in plurality. Previously presented
The apparatus according to claim 2, wherein the terahertz waves have wavelengths of 30 [m to 3 mm. Original
The apparatus according to claim 1, wherein the light processing unit comprises: a graphene holder adapted to fix the graphene, a light emitter placed above the graphene holder and comprising a light source adapted to irradiate the terahertz waves, and a photosensor adapted to receive the terahertz waves reflected from or transmitted through the graphene. Previously presented
The apparatus according to claim 1, further comprising: a restoration unit for irradiating electromagnetic waves onto the oxidized regions of the graphene detected in the determination unit to reduce the oxidized regions. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed or continuous and have wavelengths of 160 nm to 2.5 [im. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed and have a pulse width of 0.1 to 10 m s, a pulse gap of 0.1 to 100 m s, and a pulse number of 1 to 1,000. Original
A method for testing [[the]] conductivity of graphene, the method comprising: (a) fixing the graphene to a specimen stage; (b) irradiating terahertz waves onto the graphene; (c) detecting terahertz waves reflected from or transmitted through the graphene; (d) analyzing the detected terahertz waves to distinguish the oxidized region and reduced region of the graphene based on the reflectance or transmittance of the terahertz waves from the graphene to obtain an image; and (e) identifying oxidized regions of the graphene on the image. Currently amended
The method according to claim 9, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
1: The method according to claim 9, wherein the terahertz waves are irradiated from one or more light sources. Original
The method according to claim 9, wherein the terahertz waves have wavelengths of 30 p m to 3 mm. Original
The method according to claim 9, further comprising: irradiating electromagnetic waves onto the oxidized regions of the graphene detected in (e) to reduce the oxidized regions. Previously presented
The method according to claim 9, wherein the graphene is an electrode device or a transparent electrode. Original
The apparatus according to claim 1, wherein the display unit graphically displays distributions of the oxidized and reduced regions of the graphene. Previously presented
Layer stacks claimed or described, ordered top of device to substrate.
apparatus for testing conductivity of graphene
No layer stack recorded.
Materials described outside the worked examples.
graphene
graphene oxide (oxidized graphene region)
Patent
Atlas literature
Patent
US 10,739,288Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
The apparatus according to claim 1, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
The apparatus according to claim 2, wherein the pulsed or continuous light source is provided in plurality. Previously presented
The apparatus according to claim 2, wherein the terahertz waves have wavelengths of 30 [m to 3 mm. Original
The apparatus according to claim 1, wherein the light processing unit comprises: a graphene holder adapted to fix the graphene, a light emitter placed above the graphene holder and comprising a light source adapted to irradiate the terahertz waves, and a photosensor adapted to receive the terahertz waves reflected from or transmitted through the graphene. Previously presented
The apparatus according to claim 1, further comprising: a restoration unit for irradiating electromagnetic waves onto the oxidized regions of the graphene detected in the determination unit to reduce the oxidized regions. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed or continuous and have wavelengths of 160 nm to 2.5 [im. Original
The apparatus according to claim 6, wherein the electromagnetic waves are pulsed and have a pulse width of 0.1 to 10 m s, a pulse gap of 0.1 to 100 m s, and a pulse number of 1 to 1,000. Original
A method for testing [[the]] conductivity of graphene, the method comprising: (a) fixing the graphene to a specimen stage; (b) irradiating terahertz waves onto the graphene; (c) detecting terahertz waves reflected from or transmitted through the graphene; (d) analyzing the detected terahertz waves to distinguish the oxidized region and reduced region of the graphene based on the reflectance or transmittance of the terahertz waves from the graphene to obtain an image; and (e) identifying oxidized regions of the graphene on the image. Currently amended
The method according to claim 9, wherein the terahertz waves are irradiated from a pulsed or continuous light source. Original
1: The method according to claim 9, wherein the terahertz waves are irradiated from one or more light sources. Original
The method according to claim 9, wherein the terahertz waves have wavelengths of 30 p m to 3 mm. Original
The method according to claim 9, further comprising: irradiating electromagnetic waves onto the oxidized regions of the graphene detected in (e) to reduce the oxidized regions. Previously presented
The method according to claim 9, wherein the graphene is an electrode device or a transparent electrode. Original
The apparatus according to claim 1, wherein the display unit graphically displays distributions of the oxidized and reduced regions of the graphene. Previously presented
Layer stacks claimed or described, ordered top of device to substrate.
apparatus for testing conductivity of graphene
No layer stack recorded.
Materials described outside the worked examples.
graphene
graphene oxide (oxidized graphene region)