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  • Vision
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Matter42 Atlas

  • Atlas Metrology
  • Atlas Physics AI

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  • Security
  • FAQ
  • Documentation
  • Python SDK

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  • Team
  • Careers
  • Blog
Vision
Sign in

Scientific intelligence on your workstation.

Analyze characterization data, trace every result to the process that made it, and plan the next run with AI that runs in our cloud, on your servers, or on a single air-gapped workstation.

See how it works
0075_350_M1_1um512.0_00003.spm · MOCVD WS₂512 × 512 px · 1 µm
Leveled topography, islands from segment-afm-surface
200 nm
Height profile along the scan line11 islands crossed
0.00.51.01.501 µmnm
Height distribution, fitted levels substrate monolayer
0.00.51.01.52.0
Islands
82
Monolayer step
0.57nm
Coverage
22.7%
Median island
1,737nm²

A measured 1 µm AFM scan of MOCVD WS₂, leveled and segmented by Atlas. Hover or tap the map to move the profile.

The problem

Every experiment is expensive. Most of what it teaches gets lost.

Developing a new material or qualifying a process takes many rounds of making, measuring, and adjusting. Each round is costly, yet what it reveals rarely makes it into the next one.

  • Data is scattered

    Every instrument writes its own files. Results end up split across drives, spreadsheets, and notebooks, cut off from the sample and recipe that produced them.

  • Expertise is scarce

    Reading a measurement correctly takes a specialist. When that person is busy or moves on, the interpretation goes with them.

  • Every guess is expensive

    Without a connected picture, the next run is an educated guess, and each one costs days of equipment time and material.

How it works

A world model for your materials

Matter42 combines your measurements, your process history, the published literature, and physics-based simulation into one picture of how your process shapes your material. Every experiment makes that picture sharper.

See the full workflow
  1. 1

    Connect

    Bring in data straight from your instruments, along with how each sample was made. Nothing needs to be reformatted first.

  2. 2

    Understand

    Matter42 analyzes the data, compares it with past runs and published results, and explains what it shows, with the evidence attached.

  3. 3

    Decide

    See which process changes are likely to move quality, uniformity, or yield, and choose the next run with fewer unknowns.

Every run teaches the next one

Atlas Metrology measures what came out of the reactor. Atlas Physics AI explains why and predicts what to change. The next measurement checks that prediction, so the model gets sharper with every experiment, and what your team learns stays with the project.

GaAs/GaAsP nanowire micro-PL · Patel et al. 2023

Atlas Metrology

Know what you made

Atlas parses Raman, PL, AFM, XRD, and XPS files straight from the instrument. Ask questions in plain language and get automated analysis through scientific workflows built by Matter42.

Explore Atlas Metrology

CVD graphene Hall bars, SEM · Supalová et al. 2025

Atlas Physics AI

Decide what to make next

Connect atomistic, meso, and continuum models into one picture of how your process shapes your material, and test the next process window before it costs reactor time.

Explore Atlas Physics AI

Security and deployment

Your process stays yours

Recipes and measurement data are some of the most sensitive IP in the industry. Run Matter42 where your data already lives, anywhere from our cloud to a single machine with no network connection at all.

Security and deployment
  • Matter42 Cloud

    Runs on our cloud or yours. We can host and run everything with your projects private to your organization, or run it in your own cloud or servers, behind your firewall, on hardware you control.

  • Fully air-gapped

    Runs on one laptop or workstation with the network unplugged. Nothing is sent anywhere, and Blocks your team builds in the cloud export to run there too.

Atlas Metrology

  • Raman
  • PL
  • CL
  • XRD
  • AFM
  • XPS
  • FTIR

Atlas Physics AI

  • Atomistic
  • Meso
  • Continuum

Growth

  • MOCVD
  • MBE
  • CVD
  • ALD
  • PVD

Real materials and measurements

From spectroscopy to microscopy, Atlas is trained on data from a wide range of materials: compound semiconductors, oxide films and crystals, quantum wells, colour centres, and low-dimensional materials.

  • MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

    Boise State University, Estrada group (collaborator data)

    WS₂ islands, AFM

    MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

  • GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

    Patel et al., ACS Appl. Mater. Interfaces (2023); Figshare 10.48420/22068005

    GaAs nanowire PL

    GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

  • MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

    Moses & Reinhart, Mater. Charact. (2024); Zenodo 10.5281/zenodo.8432222

    MoS₂ film at 1000 °C, AFM

    MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

  • InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

    Weatherley et al., Nano Lett. 21, 5217 (2021); Zenodo 10.5281/zenodo.7702609

    InGaN quantum well CL

    InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

  • ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

    John et al. (2024); Zenodo 10.5281/zenodo.13868903

    ZnO crystal face, AFM

    ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

  • Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

    Cilibrizzi et al. (2023); Zenodo 10.5281/zenodo.10066455

    SiC colour centres

    Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

  • CVD graphene Hall cross, secondary-electron SEM (100 µm field)

    Supalová et al. (2025); Zenodo 10.5281/zenodo.15601462

    Graphene Hall cross

    CVD graphene Hall cross, secondary-electron SEM (100 µm field)

Every instrument, one engine that shows its work

Atlas Metrology and Atlas Physics AI read your data the same way: each result comes back with the analysis drawn on the measurement, so you can see exactly where the number came from. Hover a tile to see what Atlas found, or open it for the full analysis.

Atlas › segment-afm-surface · 82 islands6 techniques · one engine
  • AFMWS₂ islands, MOCVD→0.57 nmmonolayer step · 82 islands traced
  • RamanWS₂, ion-beam patterned→5.5 µmdamage halo found around every milled line
  • CathodoluminescenceInGaN/GaN quantum well, 10 K→1.4×10⁹ cm⁻²nonradiative defects · 85 located
  • XRDGa₂O₃ on Si, annealing series→As grown550 °C700 °C850 °C1000 °Cβ-Ga₂O₃ (400)19 nmβ-Ga₂O₃ crystallites, film crystallizes by 850 °C
  • PhotoluminescenceMoSe₂–WSe₂ lateral heterostructure (CVD)→82 meVWSe₂ shell around a MoSe₂ core, mapped from emission
  • Atlas Physics AIWS₂ defects, simulated vs. measured→measured E₂g widthdefect concentration →5 defect typessimulated, then checked against 553 measured pixels

Data from five instruments and our physics models. Island outlines, damage halos, dark spots, phase peaks, and emission domains are Atlas outputs.

What changes

From traditional analysis software to Atlas

Instrument software is good at taking the measurement. Atlas carries it the rest of the way, to a result your whole team can trust, compare, and act on.

Area

Traditional analysis software

With Atlas

Context

  • One platform

    Before: Split across vendor tools and desktops

    With Atlas: Measurements, simulations, and literature in one place

  • Process context

    Before: Separated from how the sample was made

    With Atlas: Linked to process history and outcomes

  • Literature

    Before: Lives outside the analysis tool

    With Atlas: Structured literature inside the workflow

Analysis

  • Multimodal

    Before: One modality, one tool at a time

    With Atlas: Raman, PL, XRD, IR, XPS, microscopy, and more, together

  • Simulation

    Before: Separate from characterization

    With Atlas: DFT, KMC, mesoscale, and CFD connected to analysis

  • Automation

    Before: Batch support varies by tool

    With Atlas: Runs across samples, maps, files, and sweeps

Trust & decisions

  • Traceability

    Before: Tool-specific audit trails, manual workflows

    With Atlas: End-to-end provenance, calibration, and saved workflows

  • Decisions

    Before: Interpretation waits on an expert

    With Atlas: Results linked to interpretation and next actions

  • Traditional analysis software
  • With Atlas

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis, so the path from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, behind your instruments, or alongside our scientists as a service.

Built by people who have run the experiments

Decades of combined experience in materials physics, semiconductor process, and multiscale simulation, applied to turning raw characterization data into decisions.

Meet the team
Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member, COO

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

Supported by a community of builders, researchers, and company creators.

South Park Commons

4H-SiC vanadium centre PL · Cilibrizzi et al. 2023

See materials intelligence on your data

Bring a Raman map, a PL scan, or a process question. We’ll show how Atlas analyzes it and how it fits your workflow.

Read the docs
Matter42

A world model for your materials: know what you made and decide what to make next, with the evidence attached.

Platform

  • Atlas Metrology
  • Atlas Physics AI
  • Literature

Software

  • Raman analysis
  • PL analysis
  • XPS analysis
  • XRD analysis
  • AFM analysis

Company

  • Vision
  • Team
  • Careers
  • Blog

Resources

  • Documentation
  • Python SDK
  • Security and deployment
  • FAQ

Legal

  • Privacy Policy
  • Terms and Conditions

Social

  • LinkedIn

Copyright © 2026 Matter42. All rights reserved.

Matter42
  • Vision
Sign in

Matter42 Atlas

  • Atlas Metrology
  • Atlas Physics AI

Resources

  • Security
  • FAQ
  • Documentation
  • Python SDK

Company

  • Team
  • Careers
  • Blog
Vision
Sign in

Scientific intelligence on your workstation.

Analyze characterization data, trace every result to the process that made it, and plan the next run with AI that runs in our cloud, on your servers, or on a single air-gapped workstation.

See how it works
0075_350_M1_1um512.0_00003.spm · MOCVD WS₂512 × 512 px · 1 µm
Leveled topography, islands from segment-afm-surface
200 nm
Height profile along the scan line11 islands crossed
0.00.51.01.501 µmnm
Height distribution, fitted levels substrate monolayer
0.00.51.01.52.0
Islands
82
Monolayer step
0.57nm
Coverage
22.7%
Median island
1,737nm²

A measured 1 µm AFM scan of MOCVD WS₂, leveled and segmented by Atlas. Hover or tap the map to move the profile.

The problem

Every experiment is expensive. Most of what it teaches gets lost.

Developing a new material or qualifying a process takes many rounds of making, measuring, and adjusting. Each round is costly, yet what it reveals rarely makes it into the next one.

  • Data is scattered

    Every instrument writes its own files. Results end up split across drives, spreadsheets, and notebooks, cut off from the sample and recipe that produced them.

  • Expertise is scarce

    Reading a measurement correctly takes a specialist. When that person is busy or moves on, the interpretation goes with them.

  • Every guess is expensive

    Without a connected picture, the next run is an educated guess, and each one costs days of equipment time and material.

How it works

A world model for your materials

Matter42 combines your measurements, your process history, the published literature, and physics-based simulation into one picture of how your process shapes your material. Every experiment makes that picture sharper.

See the full workflow
  1. 1

    Connect

    Bring in data straight from your instruments, along with how each sample was made. Nothing needs to be reformatted first.

  2. 2

    Understand

    Matter42 analyzes the data, compares it with past runs and published results, and explains what it shows, with the evidence attached.

  3. 3

    Decide

    See which process changes are likely to move quality, uniformity, or yield, and choose the next run with fewer unknowns.

Every run teaches the next one

Atlas Metrology measures what came out of the reactor. Atlas Physics AI explains why and predicts what to change. The next measurement checks that prediction, so the model gets sharper with every experiment, and what your team learns stays with the project.

GaAs/GaAsP nanowire micro-PL · Patel et al. 2023

Atlas Metrology

Know what you made

Atlas parses Raman, PL, AFM, XRD, and XPS files straight from the instrument. Ask questions in plain language and get automated analysis through scientific workflows built by Matter42.

Explore Atlas Metrology

CVD graphene Hall bars, SEM · Supalová et al. 2025

Atlas Physics AI

Decide what to make next

Connect atomistic, meso, and continuum models into one picture of how your process shapes your material, and test the next process window before it costs reactor time.

Explore Atlas Physics AI

Security and deployment

Your process stays yours

Recipes and measurement data are some of the most sensitive IP in the industry. Run Matter42 where your data already lives, anywhere from our cloud to a single machine with no network connection at all.

Security and deployment
  • Matter42 Cloud

    Runs on our cloud or yours. We can host and run everything with your projects private to your organization, or run it in your own cloud or servers, behind your firewall, on hardware you control.

  • Fully air-gapped

    Runs on one laptop or workstation with the network unplugged. Nothing is sent anywhere, and Blocks your team builds in the cloud export to run there too.

Atlas Metrology

  • Raman
  • PL
  • CL
  • XRD
  • AFM
  • XPS
  • FTIR

Atlas Physics AI

  • Atomistic
  • Meso
  • Continuum

Growth

  • MOCVD
  • MBE
  • CVD
  • ALD
  • PVD

Real materials and measurements

From spectroscopy to microscopy, Atlas is trained on data from a wide range of materials: compound semiconductors, oxide films and crystals, quantum wells, colour centres, and low-dimensional materials.

  • MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

    Boise State University, Estrada group (collaborator data)

    WS₂ islands, AFM

    MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

  • GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

    Patel et al., ACS Appl. Mater. Interfaces (2023); Figshare 10.48420/22068005

    GaAs nanowire PL

    GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

  • MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

    Moses & Reinhart, Mater. Charact. (2024); Zenodo 10.5281/zenodo.8432222

    MoS₂ film at 1000 °C, AFM

    MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

  • InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

    Weatherley et al., Nano Lett. 21, 5217 (2021); Zenodo 10.5281/zenodo.7702609

    InGaN quantum well CL

    InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

  • ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

    John et al. (2024); Zenodo 10.5281/zenodo.13868903

    ZnO crystal face, AFM

    ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

  • Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

    Cilibrizzi et al. (2023); Zenodo 10.5281/zenodo.10066455

    SiC colour centres

    Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

  • CVD graphene Hall cross, secondary-electron SEM (100 µm field)

    Supalová et al. (2025); Zenodo 10.5281/zenodo.15601462

    Graphene Hall cross

    CVD graphene Hall cross, secondary-electron SEM (100 µm field)

Every instrument, one engine that shows its work

Atlas Metrology and Atlas Physics AI read your data the same way: each result comes back with the analysis drawn on the measurement, so you can see exactly where the number came from. Hover a tile to see what Atlas found, or open it for the full analysis.

Atlas › segment-afm-surface · 82 islands6 techniques · one engine
  • AFMWS₂ islands, MOCVD→0.57 nmmonolayer step · 82 islands traced
  • RamanWS₂, ion-beam patterned→5.5 µmdamage halo found around every milled line
  • CathodoluminescenceInGaN/GaN quantum well, 10 K→1.4×10⁹ cm⁻²nonradiative defects · 85 located
  • XRDGa₂O₃ on Si, annealing series→As grown550 °C700 °C850 °C1000 °Cβ-Ga₂O₃ (400)19 nmβ-Ga₂O₃ crystallites, film crystallizes by 850 °C
  • PhotoluminescenceMoSe₂–WSe₂ lateral heterostructure (CVD)→82 meVWSe₂ shell around a MoSe₂ core, mapped from emission
  • Atlas Physics AIWS₂ defects, simulated vs. measured→measured E₂g widthdefect concentration →5 defect typessimulated, then checked against 553 measured pixels

Data from five instruments and our physics models. Island outlines, damage halos, dark spots, phase peaks, and emission domains are Atlas outputs.

What changes

From traditional analysis software to Atlas

Instrument software is good at taking the measurement. Atlas carries it the rest of the way, to a result your whole team can trust, compare, and act on.

Area

Traditional analysis software

With Atlas

Context

  • One platform

    Before: Split across vendor tools and desktops

    With Atlas: Measurements, simulations, and literature in one place

  • Process context

    Before: Separated from how the sample was made

    With Atlas: Linked to process history and outcomes

  • Literature

    Before: Lives outside the analysis tool

    With Atlas: Structured literature inside the workflow

Analysis

  • Multimodal

    Before: One modality, one tool at a time

    With Atlas: Raman, PL, XRD, IR, XPS, microscopy, and more, together

  • Simulation

    Before: Separate from characterization

    With Atlas: DFT, KMC, mesoscale, and CFD connected to analysis

  • Automation

    Before: Batch support varies by tool

    With Atlas: Runs across samples, maps, files, and sweeps

Trust & decisions

  • Traceability

    Before: Tool-specific audit trails, manual workflows

    With Atlas: End-to-end provenance, calibration, and saved workflows

  • Decisions

    Before: Interpretation waits on an expert

    With Atlas: Results linked to interpretation and next actions

  • Traditional analysis software
  • With Atlas

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis, so the path from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, behind your instruments, or alongside our scientists as a service.

Built by people who have run the experiments

Decades of combined experience in materials physics, semiconductor process, and multiscale simulation, applied to turning raw characterization data into decisions.

Meet the team
Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member, COO

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

Supported by a community of builders, researchers, and company creators.

South Park Commons

4H-SiC vanadium centre PL · Cilibrizzi et al. 2023

See materials intelligence on your data

Bring a Raman map, a PL scan, or a process question. We’ll show how Atlas analyzes it and how it fits your workflow.

Read the docs
Matter42

A world model for your materials: know what you made and decide what to make next, with the evidence attached.

Platform

  • Atlas Metrology
  • Atlas Physics AI
  • Literature

Software

  • Raman analysis
  • PL analysis
  • XPS analysis
  • XRD analysis
  • AFM analysis

Company

  • Vision
  • Team
  • Careers
  • Blog

Resources

  • Documentation
  • Python SDK
  • Security and deployment
  • FAQ

Legal

  • Privacy Policy
  • Terms and Conditions

Social

  • LinkedIn

Copyright © 2026 Matter42. All rights reserved.

Matter42
  • Vision
Sign in

Matter42 Atlas

  • Atlas Metrology
  • Atlas Physics AI

Resources

  • Security
  • FAQ
  • Documentation
  • Python SDK

Company

  • Team
  • Careers
  • Blog
Vision
Sign in

Scientific intelligence on your workstation.

Analyze characterization data, trace every result to the process that made it, and plan the next run with AI that runs in our cloud, on your servers, or on a single air-gapped workstation.

See how it works
0075_350_M1_1um512.0_00003.spm · MOCVD WS₂512 × 512 px · 1 µm
Leveled topography, islands from segment-afm-surface
200 nm
Height profile along the scan line11 islands crossed
0.00.51.01.501 µmnm
Height distribution, fitted levels substrate monolayer
0.00.51.01.52.0
Islands
82
Monolayer step
0.57nm
Coverage
22.7%
Median island
1,737nm²

A measured 1 µm AFM scan of MOCVD WS₂, leveled and segmented by Atlas. Hover or tap the map to move the profile.

The problem

Every experiment is expensive. Most of what it teaches gets lost.

Developing a new material or qualifying a process takes many rounds of making, measuring, and adjusting. Each round is costly, yet what it reveals rarely makes it into the next one.

  • Data is scattered

    Every instrument writes its own files. Results end up split across drives, spreadsheets, and notebooks, cut off from the sample and recipe that produced them.

  • Expertise is scarce

    Reading a measurement correctly takes a specialist. When that person is busy or moves on, the interpretation goes with them.

  • Every guess is expensive

    Without a connected picture, the next run is an educated guess, and each one costs days of equipment time and material.

How it works

A world model for your materials

Matter42 combines your measurements, your process history, the published literature, and physics-based simulation into one picture of how your process shapes your material. Every experiment makes that picture sharper.

See the full workflow
  1. 1

    Connect

    Bring in data straight from your instruments, along with how each sample was made. Nothing needs to be reformatted first.

  2. 2

    Understand

    Matter42 analyzes the data, compares it with past runs and published results, and explains what it shows, with the evidence attached.

  3. 3

    Decide

    See which process changes are likely to move quality, uniformity, or yield, and choose the next run with fewer unknowns.

Every run teaches the next one

Atlas Metrology measures what came out of the reactor. Atlas Physics AI explains why and predicts what to change. The next measurement checks that prediction, so the model gets sharper with every experiment, and what your team learns stays with the project.

GaAs/GaAsP nanowire micro-PL · Patel et al. 2023

Atlas Metrology

Know what you made

Atlas parses Raman, PL, AFM, XRD, and XPS files straight from the instrument. Ask questions in plain language and get automated analysis through scientific workflows built by Matter42.

Explore Atlas Metrology

CVD graphene Hall bars, SEM · Supalová et al. 2025

Atlas Physics AI

Decide what to make next

Connect atomistic, meso, and continuum models into one picture of how your process shapes your material, and test the next process window before it costs reactor time.

Explore Atlas Physics AI

Security and deployment

Your process stays yours

Recipes and measurement data are some of the most sensitive IP in the industry. Run Matter42 where your data already lives, anywhere from our cloud to a single machine with no network connection at all.

Security and deployment
  • Matter42 Cloud

    Runs on our cloud or yours. We can host and run everything with your projects private to your organization, or run it in your own cloud or servers, behind your firewall, on hardware you control.

  • Fully air-gapped

    Runs on one laptop or workstation with the network unplugged. Nothing is sent anywhere, and Blocks your team builds in the cloud export to run there too.

Atlas Metrology

  • Raman
  • PL
  • CL
  • XRD
  • AFM
  • XPS
  • FTIR

Atlas Physics AI

  • Atomistic
  • Meso
  • Continuum

Growth

  • MOCVD
  • MBE
  • CVD
  • ALD
  • PVD

Real materials and measurements

From spectroscopy to microscopy, Atlas is trained on data from a wide range of materials: compound semiconductors, oxide films and crystals, quantum wells, colour centres, and low-dimensional materials.

  • MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

    Boise State University, Estrada group (collaborator data)

    WS₂ islands, AFM

    MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

  • GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

    Patel et al., ACS Appl. Mater. Interfaces (2023); Figshare 10.48420/22068005

    GaAs nanowire PL

    GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

  • MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

    Moses & Reinhart, Mater. Charact. (2024); Zenodo 10.5281/zenodo.8432222

    MoS₂ film at 1000 °C, AFM

    MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

  • InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

    Weatherley et al., Nano Lett. 21, 5217 (2021); Zenodo 10.5281/zenodo.7702609

    InGaN quantum well CL

    InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

  • ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

    John et al. (2024); Zenodo 10.5281/zenodo.13868903

    ZnO crystal face, AFM

    ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

  • Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

    Cilibrizzi et al. (2023); Zenodo 10.5281/zenodo.10066455

    SiC colour centres

    Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

  • CVD graphene Hall cross, secondary-electron SEM (100 µm field)

    Supalová et al. (2025); Zenodo 10.5281/zenodo.15601462

    Graphene Hall cross

    CVD graphene Hall cross, secondary-electron SEM (100 µm field)

Every instrument, one engine that shows its work

Atlas Metrology and Atlas Physics AI read your data the same way: each result comes back with the analysis drawn on the measurement, so you can see exactly where the number came from. Hover a tile to see what Atlas found, or open it for the full analysis.

Atlas › segment-afm-surface · 82 islands6 techniques · one engine
  • AFMWS₂ islands, MOCVD→0.57 nmmonolayer step · 82 islands traced
  • RamanWS₂, ion-beam patterned→5.5 µmdamage halo found around every milled line
  • CathodoluminescenceInGaN/GaN quantum well, 10 K→1.4×10⁹ cm⁻²nonradiative defects · 85 located
  • XRDGa₂O₃ on Si, annealing series→As grown550 °C700 °C850 °C1000 °Cβ-Ga₂O₃ (400)19 nmβ-Ga₂O₃ crystallites, film crystallizes by 850 °C
  • PhotoluminescenceMoSe₂–WSe₂ lateral heterostructure (CVD)→82 meVWSe₂ shell around a MoSe₂ core, mapped from emission
  • Atlas Physics AIWS₂ defects, simulated vs. measured→measured E₂g widthdefect concentration →5 defect typessimulated, then checked against 553 measured pixels

Data from five instruments and our physics models. Island outlines, damage halos, dark spots, phase peaks, and emission domains are Atlas outputs.

What changes

From traditional analysis software to Atlas

Instrument software is good at taking the measurement. Atlas carries it the rest of the way, to a result your whole team can trust, compare, and act on.

Area

Traditional analysis software

With Atlas

Context

  • One platform

    Before: Split across vendor tools and desktops

    With Atlas: Measurements, simulations, and literature in one place

  • Process context

    Before: Separated from how the sample was made

    With Atlas: Linked to process history and outcomes

  • Literature

    Before: Lives outside the analysis tool

    With Atlas: Structured literature inside the workflow

Analysis

  • Multimodal

    Before: One modality, one tool at a time

    With Atlas: Raman, PL, XRD, IR, XPS, microscopy, and more, together

  • Simulation

    Before: Separate from characterization

    With Atlas: DFT, KMC, mesoscale, and CFD connected to analysis

  • Automation

    Before: Batch support varies by tool

    With Atlas: Runs across samples, maps, files, and sweeps

Trust & decisions

  • Traceability

    Before: Tool-specific audit trails, manual workflows

    With Atlas: End-to-end provenance, calibration, and saved workflows

  • Decisions

    Before: Interpretation waits on an expert

    With Atlas: Results linked to interpretation and next actions

  • Traditional analysis software
  • With Atlas

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis, so the path from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, behind your instruments, or alongside our scientists as a service.

Built by people who have run the experiments

Decades of combined experience in materials physics, semiconductor process, and multiscale simulation, applied to turning raw characterization data into decisions.

Meet the team
Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member, COO

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

Supported by a community of builders, researchers, and company creators.

South Park Commons

4H-SiC vanadium centre PL · Cilibrizzi et al. 2023

See materials intelligence on your data

Bring a Raman map, a PL scan, or a process question. We’ll show how Atlas analyzes it and how it fits your workflow.

Read the docs
Matter42

A world model for your materials: know what you made and decide what to make next, with the evidence attached.

Platform

  • Atlas Metrology
  • Atlas Physics AI
  • Literature

Software

  • Raman analysis
  • PL analysis
  • XPS analysis
  • XRD analysis
  • AFM analysis

Company

  • Vision
  • Team
  • Careers
  • Blog

Resources

  • Documentation
  • Python SDK
  • Security and deployment
  • FAQ

Legal

  • Privacy Policy
  • Terms and Conditions

Social

  • LinkedIn

Copyright © 2026 Matter42. All rights reserved.

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Matter42 Atlas

  • Atlas Metrology
  • Atlas Physics AI

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  • Security
  • FAQ
  • Documentation
  • Python SDK

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  • Careers
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Vision
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Scientific intelligence on your workstation.

Analyze characterization data, trace every result to the process that made it, and plan the next run with AI that runs in our cloud, on your servers, or on a single air-gapped workstation.

See how it works
0075_350_M1_1um512.0_00003.spm · MOCVD WS₂512 × 512 px · 1 µm
Leveled topography, islands from segment-afm-surface
200 nm
Height profile along the scan line11 islands crossed
0.00.51.01.501 µmnm
Height distribution, fitted levels substrate monolayer
0.00.51.01.52.0
Islands
82
Monolayer step
0.57nm
Coverage
22.7%
Median island
1,737nm²

A measured 1 µm AFM scan of MOCVD WS₂, leveled and segmented by Atlas. Hover or tap the map to move the profile.

The problem

Every experiment is expensive. Most of what it teaches gets lost.

Developing a new material or qualifying a process takes many rounds of making, measuring, and adjusting. Each round is costly, yet what it reveals rarely makes it into the next one.

  • Data is scattered

    Every instrument writes its own files. Results end up split across drives, spreadsheets, and notebooks, cut off from the sample and recipe that produced them.

  • Expertise is scarce

    Reading a measurement correctly takes a specialist. When that person is busy or moves on, the interpretation goes with them.

  • Every guess is expensive

    Without a connected picture, the next run is an educated guess, and each one costs days of equipment time and material.

How it works

A world model for your materials

Matter42 combines your measurements, your process history, the published literature, and physics-based simulation into one picture of how your process shapes your material. Every experiment makes that picture sharper.

See the full workflow
  1. 1

    Connect

    Bring in data straight from your instruments, along with how each sample was made. Nothing needs to be reformatted first.

  2. 2

    Understand

    Matter42 analyzes the data, compares it with past runs and published results, and explains what it shows, with the evidence attached.

  3. 3

    Decide

    See which process changes are likely to move quality, uniformity, or yield, and choose the next run with fewer unknowns.

Every run teaches the next one

Atlas Metrology measures what came out of the reactor. Atlas Physics AI explains why and predicts what to change. The next measurement checks that prediction, so the model gets sharper with every experiment, and what your team learns stays with the project.

GaAs/GaAsP nanowire micro-PL · Patel et al. 2023

Atlas Metrology

Know what you made

Atlas parses Raman, PL, AFM, XRD, and XPS files straight from the instrument. Ask questions in plain language and get automated analysis through scientific workflows built by Matter42.

Explore Atlas Metrology

CVD graphene Hall bars, SEM · Supalová et al. 2025

Atlas Physics AI

Decide what to make next

Connect atomistic, meso, and continuum models into one picture of how your process shapes your material, and test the next process window before it costs reactor time.

Explore Atlas Physics AI

Security and deployment

Your process stays yours

Recipes and measurement data are some of the most sensitive IP in the industry. Run Matter42 where your data already lives, anywhere from our cloud to a single machine with no network connection at all.

Security and deployment
  • Matter42 Cloud

    Runs on our cloud or yours. We can host and run everything with your projects private to your organization, or run it in your own cloud or servers, behind your firewall, on hardware you control.

  • Fully air-gapped

    Runs on one laptop or workstation with the network unplugged. Nothing is sent anywhere, and Blocks your team builds in the cloud export to run there too.

Atlas Metrology

  • Raman
  • PL
  • CL
  • XRD
  • AFM
  • XPS
  • FTIR

Atlas Physics AI

  • Atomistic
  • Meso
  • Continuum

Growth

  • MOCVD
  • MBE
  • CVD
  • ALD
  • PVD

Real materials and measurements

From spectroscopy to microscopy, Atlas is trained on data from a wide range of materials: compound semiconductors, oxide films and crystals, quantum wells, colour centres, and low-dimensional materials.

  • MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

    Boise State University, Estrada group (collaborator data)

    WS₂ islands, AFM

    MOCVD WS₂ triangular islands on substrate step terraces, AFM topography (1 µm field)

  • GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

    Patel et al., ACS Appl. Mater. Interfaces (2023); Figshare 10.48420/22068005

    GaAs nanowire PL

    GaAs/GaAsP nanowire emitters, confocal micro-PL band-edge intensity (100 µm field)

  • MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

    Moses & Reinhart, Mater. Charact. (2024); Zenodo 10.5281/zenodo.8432222

    MoS₂ film at 1000 °C, AFM

    MOCVD MoS₂ grown at 1000 °C on c-plane sapphire, AFM topography (5 µm field)

  • InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

    Weatherley et al., Nano Lett. 21, 5217 (2021); Zenodo 10.5281/zenodo.7702609

    InGaN quantum well CL

    InGaN/GaN quantum well, 10 K cathodoluminescence intensity; dark spots are threading dislocations

  • ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

    John et al. (2024); Zenodo 10.5281/zenodo.13868903

    ZnO crystal face, AFM

    ZnO single-crystal face after oxidative annealing at 700 °C, AFM topography (10 µm field)

  • Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

    Cilibrizzi et al. (2023); Zenodo 10.5281/zenodo.10066455

    SiC colour centres

    Isotopically enriched 4H-SiC, confocal PL of single vanadium colour centres (8 µm field)

  • CVD graphene Hall cross, secondary-electron SEM (100 µm field)

    Supalová et al. (2025); Zenodo 10.5281/zenodo.15601462

    Graphene Hall cross

    CVD graphene Hall cross, secondary-electron SEM (100 µm field)

Every instrument, one engine that shows its work

Atlas Metrology and Atlas Physics AI read your data the same way: each result comes back with the analysis drawn on the measurement, so you can see exactly where the number came from. Hover a tile to see what Atlas found, or open it for the full analysis.

Atlas › segment-afm-surface · 82 islands6 techniques · one engine
  • AFMWS₂ islands, MOCVD→0.57 nmmonolayer step · 82 islands traced
  • RamanWS₂, ion-beam patterned→5.5 µmdamage halo found around every milled line
  • CathodoluminescenceInGaN/GaN quantum well, 10 K→1.4×10⁹ cm⁻²nonradiative defects · 85 located
  • XRDGa₂O₃ on Si, annealing series→As grown550 °C700 °C850 °C1000 °Cβ-Ga₂O₃ (400)19 nmβ-Ga₂O₃ crystallites, film crystallizes by 850 °C
  • PhotoluminescenceMoSe₂–WSe₂ lateral heterostructure (CVD)→82 meVWSe₂ shell around a MoSe₂ core, mapped from emission
  • Atlas Physics AIWS₂ defects, simulated vs. measured→measured E₂g widthdefect concentration →5 defect typessimulated, then checked against 553 measured pixels

Data from five instruments and our physics models. Island outlines, damage halos, dark spots, phase peaks, and emission domains are Atlas outputs.

What changes

From traditional analysis software to Atlas

Instrument software is good at taking the measurement. Atlas carries it the rest of the way, to a result your whole team can trust, compare, and act on.

Area

Traditional analysis software

With Atlas

Context

  • One platform

    Before: Split across vendor tools and desktops

    With Atlas: Measurements, simulations, and literature in one place

  • Process context

    Before: Separated from how the sample was made

    With Atlas: Linked to process history and outcomes

  • Literature

    Before: Lives outside the analysis tool

    With Atlas: Structured literature inside the workflow

Analysis

  • Multimodal

    Before: One modality, one tool at a time

    With Atlas: Raman, PL, XRD, IR, XPS, microscopy, and more, together

  • Simulation

    Before: Separate from characterization

    With Atlas: DFT, KMC, mesoscale, and CFD connected to analysis

  • Automation

    Before: Batch support varies by tool

    With Atlas: Runs across samples, maps, files, and sweeps

Trust & decisions

  • Traceability

    Before: Tool-specific audit trails, manual workflows

    With Atlas: End-to-end provenance, calibration, and saved workflows

  • Decisions

    Before: Interpretation waits on an expert

    With Atlas: Results linked to interpretation and next actions

  • Traditional analysis software
  • With Atlas

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis, so the path from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, behind your instruments, or alongside our scientists as a service.

Built by people who have run the experiments

Decades of combined experience in materials physics, semiconductor process, and multiscale simulation, applied to turning raw characterization data into decisions.

Meet the team
Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member, COO

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

Supported by a community of builders, researchers, and company creators.

South Park Commons

4H-SiC vanadium centre PL · Cilibrizzi et al. 2023

See materials intelligence on your data

Bring a Raman map, a PL scan, or a process question. We’ll show how Atlas analyzes it and how it fits your workflow.

Read the docs
Matter42

A world model for your materials: know what you made and decide what to make next, with the evidence attached.

Platform

  • Atlas Metrology
  • Atlas Physics AI
  • Literature

Software

  • Raman analysis
  • PL analysis
  • XPS analysis
  • XRD analysis
  • AFM analysis

Company

  • Vision
  • Team
  • Careers
  • Blog

Resources

  • Documentation
  • Python SDK
  • Security and deployment
  • FAQ

Legal

  • Privacy Policy
  • Terms and Conditions

Social

  • LinkedIn

Copyright © 2026 Matter42. All rights reserved.