Research paper
Experimental CharacterizationTheoretical| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Fet Mobility | two-port field-effect hole mobility | 0.17cm²/Vs | — | |||
| PL Peak | A exciton (X₀) | 1.745eV | — | |||
| PL Peak | A exciton (X₀) | 1.681eV | — | |||
| Substrate Thickness | WSe₂ monolayer thickness | 0.649nm | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 4.1ns | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 0.26ns | — | |||
| Spin Valley Edge Density | excess spin and valley per unit length along the edge | 109um⁻¹ | — | |||
| Spin Valley Polarization | spin/valley polarization on the edge | 6% | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Fet Mobility | two-port field-effect hole mobility | 0.17cm²/Vs | — | |||
| PL Peak | A exciton (X₀) | 1.745eV | — | |||
| PL Peak | A exciton (X₀) | 1.681eV | — | |||
| Substrate Thickness | WSe₂ monolayer thickness | 0.649nm | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 4.1ns | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 0.26ns | — | |||
| Spin Valley Edge Density | excess spin and valley per unit length along the edge | 109um⁻¹ | — | |||
| Spin Valley Polarization | spin/valley polarization on the edge | 6% | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Fet Mobility | two-port field-effect hole mobility | 0.17cm²/Vs | — | |||
| PL Peak | A exciton (X₀) | 1.745eV | — | |||
| PL Peak | A exciton (X₀) | 1.681eV | — | |||
| Substrate Thickness | WSe₂ monolayer thickness | 0.649nm | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 4.1ns | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 0.26ns | — | |||
| Spin Valley Edge Density | excess spin and valley per unit length along the edge | 109um⁻¹ | — | |||
| Spin Valley Polarization | spin/valley polarization on the edge | 6% | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Fet Mobility | two-port field-effect hole mobility | 0.17cm²/Vs | — | |||
| PL Peak | A exciton (X₀) | 1.745eV | — | |||
| PL Peak | A exciton (X₀) | 1.681eV | — | |||
| Substrate Thickness | WSe₂ monolayer thickness | 0.649nm | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 4.1ns | — | |||
| Spin Valley Lifetime | lower-bound spin/valley lifetime | 0.26ns | — | |||
| Spin Valley Edge Density | excess spin and valley per unit length along the edge | 109um⁻¹ | — | |||
| Spin Valley Polarization | spin/valley polarization on the edge | 6% | — |