Research paperExperimental CharacterizationTheoreticalAll Electrical Control and Temperature Dependence of the Spin and Valley Hall Effect in Monolayer WSe₂ TransistorsXintong Li, Zhida Liu, Yihan Liu, Suyogya Karki et al.2022·10.48550/arxiv.2202.11774·arXiv:2202.11774AbstractHeavy metal-based two-dimensional van der Waals materials have a large, coupled spin and valley Hall effect (SVHE) that has potential use in spintronics and valleytronics. Optical measurements of the SVHE have largely been performed below 30 K and understanding of the SVHE-induced spin/valley polarizations that can be electrically generated is limited. Here, we study the SVHE in monolayer p-type tungsten diselenide (WSe₂). Kerr rotation (KR) measurements show the spatial distribution of the SVHE at different temperatures, its persistence up to 160 K, and that it can be electrically modulated via gate and drain bias. A spin/valley drift and diffusion model together with reflection spectra data is used to interpret the KR data and predict a lower-bound spin/valley lifetime of 4.1 ns below 90 K and 0.26 ns at 160 K. The excess spin and valley per unit length along the edge is calculated to be 109 μm⁻¹ at 45 K, which corresponds to a spin/valley polarization on the edge of 6%. These results are important steps towards practical use of the SVHE.Read more
Monolayer p-type WSe₂ transistor used for Kerr rotation and electrical transport measurements.3 characterizations8 properties3 figuresExperimentalWSe₂Studied MaterialExpand
Si/SiO₂ background used as reflection reference in differential reflection measurements.1 characterization1 figureReferenceSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationTheoreticalAll Electrical Control and Temperature Dependence of the Spin and Valley Hall Effect in Monolayer WSe₂ TransistorsXintong Li, Zhida Liu, Yihan Liu, Suyogya Karki et al.2022·10.48550/arxiv.2202.11774·arXiv:2202.11774AbstractHeavy metal-based two-dimensional van der Waals materials have a large, coupled spin and valley Hall effect (SVHE) that has potential use in spintronics and valleytronics. Optical measurements of the SVHE have largely been performed below 30 K and understanding of the SVHE-induced spin/valley polarizations that can be electrically generated is limited. Here, we study the SVHE in monolayer p-type tungsten diselenide (WSe₂). Kerr rotation (KR) measurements show the spatial distribution of the SVHE at different temperatures, its persistence up to 160 K, and that it can be electrically modulated via gate and drain bias. A spin/valley drift and diffusion model together with reflection spectra data is used to interpret the KR data and predict a lower-bound spin/valley lifetime of 4.1 ns below 90 K and 0.26 ns at 160 K. The excess spin and valley per unit length along the edge is calculated to be 109 μm⁻¹ at 45 K, which corresponds to a spin/valley polarization on the edge of 6%. These results are important steps towards practical use of the SVHE.Read more
Monolayer p-type WSe₂ transistor used for Kerr rotation and electrical transport measurements.3 characterizations8 properties3 figuresExperimentalWSe₂Studied MaterialExpand
Si/SiO₂ background used as reflection reference in differential reflection measurements.1 characterization1 figureReferenceSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationTheoreticalAll Electrical Control and Temperature Dependence of the Spin and Valley Hall Effect in Monolayer WSe₂ TransistorsXintong Li, Zhida Liu, Yihan Liu, Suyogya Karki et al.2022·10.48550/arxiv.2202.11774·arXiv:2202.11774AbstractHeavy metal-based two-dimensional van der Waals materials have a large, coupled spin and valley Hall effect (SVHE) that has potential use in spintronics and valleytronics. Optical measurements of the SVHE have largely been performed below 30 K and understanding of the SVHE-induced spin/valley polarizations that can be electrically generated is limited. Here, we study the SVHE in monolayer p-type tungsten diselenide (WSe₂). Kerr rotation (KR) measurements show the spatial distribution of the SVHE at different temperatures, its persistence up to 160 K, and that it can be electrically modulated via gate and drain bias. A spin/valley drift and diffusion model together with reflection spectra data is used to interpret the KR data and predict a lower-bound spin/valley lifetime of 4.1 ns below 90 K and 0.26 ns at 160 K. The excess spin and valley per unit length along the edge is calculated to be 109 μm⁻¹ at 45 K, which corresponds to a spin/valley polarization on the edge of 6%. These results are important steps towards practical use of the SVHE.Read more
Monolayer p-type WSe₂ transistor used for Kerr rotation and electrical transport measurements.3 characterizations8 properties3 figuresExperimentalWSe₂Studied MaterialExpand
Si/SiO₂ background used as reflection reference in differential reflection measurements.1 characterization1 figureReferenceSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationTheoreticalAll Electrical Control and Temperature Dependence of the Spin and Valley Hall Effect in Monolayer WSe₂ TransistorsXintong Li, Zhida Liu, Yihan Liu, Suyogya Karki et al.2022·10.48550/arxiv.2202.11774·arXiv:2202.11774AbstractHeavy metal-based two-dimensional van der Waals materials have a large, coupled spin and valley Hall effect (SVHE) that has potential use in spintronics and valleytronics. Optical measurements of the SVHE have largely been performed below 30 K and understanding of the SVHE-induced spin/valley polarizations that can be electrically generated is limited. Here, we study the SVHE in monolayer p-type tungsten diselenide (WSe₂). Kerr rotation (KR) measurements show the spatial distribution of the SVHE at different temperatures, its persistence up to 160 K, and that it can be electrically modulated via gate and drain bias. A spin/valley drift and diffusion model together with reflection spectra data is used to interpret the KR data and predict a lower-bound spin/valley lifetime of 4.1 ns below 90 K and 0.26 ns at 160 K. The excess spin and valley per unit length along the edge is calculated to be 109 μm⁻¹ at 45 K, which corresponds to a spin/valley polarization on the edge of 6%. These results are important steps towards practical use of the SVHE.Read more
Monolayer p-type WSe₂ transistor used for Kerr rotation and electrical transport measurements.3 characterizations8 properties3 figuresExperimentalWSe₂Studied MaterialExpand
Si/SiO₂ background used as reflection reference in differential reflection measurements.1 characterization1 figureReferenceSiO₂Substrate / DielectricSiSubstrate / DielectricExpand