Abstract

Correcting scan-positional errors is critical for high-resolution and high-precision electron ptychography. The paper introduces an integrated constrained gradient descent (iCGD) protocol that uses constrained gradient-descent subroutines to isolate and correct different classes of scan positional errors. The approach is validated with simulated 4D-STEM datasets and demonstrated on an experimental 4D-STEM dataset of monolayer 1H-MoS2.

Abstract

Correcting scan-positional errors is critical for high-resolution and high-precision electron ptychography. The paper introduces an integrated constrained gradient descent (iCGD) protocol that uses constrained gradient-descent subroutines to isolate and correct different classes of scan positional errors. The approach is validated with simulated 4D-STEM datasets and demonstrated on an experimental 4D-STEM dataset of monolayer 1H-MoS2.

Abstract

Correcting scan-positional errors is critical for high-resolution and high-precision electron ptychography. The paper introduces an integrated constrained gradient descent (iCGD) protocol that uses constrained gradient-descent subroutines to isolate and correct different classes of scan positional errors. The approach is validated with simulated 4D-STEM datasets and demonstrated on an experimental 4D-STEM dataset of monolayer 1H-MoS2.

Abstract

Correcting scan-positional errors is critical for high-resolution and high-precision electron ptychography. The paper introduces an integrated constrained gradient descent (iCGD) protocol that uses constrained gradient-descent subroutines to isolate and correct different classes of scan positional errors. The approach is validated with simulated 4D-STEM datasets and demonstrated on an experimental 4D-STEM dataset of monolayer 1H-MoS2.