An Integrated Constrained Gradient Descent (iCGD) Protocol to Correct Scan-Positional Errors for Electron Ptychography with High Accuracy and Precision

Ning Shoucong; Wenhui Xu; Leyi Loh; Zhen Lu; Michel Bosman; Fucai Zhang; Qian He

doi:10.1016/j.ultramic.2023.113716

Paper

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Experimental CharacterizationOther Computational

An Integrated Constrained Gradient Descent (iCGD) Protocol to Correct Scan-Positional Errors for Electron Ptychography with High Accuracy and Precision

Ning Shoucong, Wenhui Xu, Leyi Loh, Zhen Lu et al.

2022·10.1016/j.ultramic.2023.113716·arXiv:2211.03034

Samples

Each sample groups how it was prepared, characterized, and measured. Click a card to expand.

Experimental 4D-STEM dataset of monolayer 1H-MoS₂ used to demonstrate iCGD.

1 characterization1 figure

MoS₂Studied Material

Simulated in-focus 4D-STEM dataset of a 1H-MoS₂ monolayer used to illustrate scan-positional-error correction methods.

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Simulated Supercell DftMoS₂Studied Material

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