Research paper
Theoretical| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | SiO₂ refractive index | 1.45 | — | |||
| Refractive Index | radial refractive index | 2.447 | — | |||
| Refractive Index | azimuthal refractive index | 3.756 | — | |||
| Dimensionless Fraction | WS₂ filling factor | 0.077 | — | |||
| Layer Thickness | WS₂ layer thickness | 3.042nm | — | |||
| Layer Thickness | SiO₂ layer thickness | 36.462nm | — | |||
| Layer Count | number of alternations | 15 | — | |||
| Anisotropy Parameter | eta = nth/nrh | 1.169 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | SiO₂ refractive index | 1.45 | — | |||
| Refractive Index | radial refractive index | 2.447 | — | |||
| Refractive Index | azimuthal refractive index | 3.756 | — | |||
| Dimensionless Fraction | WS₂ filling factor | 0.077 | — | |||
| Layer Thickness | WS₂ layer thickness | 3.042nm | — | |||
| Layer Thickness | SiO₂ layer thickness | 36.462nm | — | |||
| Layer Count | number of alternations | 15 | — | |||
| Anisotropy Parameter | eta = nth/nrh | 1.169 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | SiO₂ refractive index | 1.45 | — | |||
| Refractive Index | radial refractive index | 2.447 | — | |||
| Refractive Index | azimuthal refractive index | 3.756 | — | |||
| Dimensionless Fraction | WS₂ filling factor | 0.077 | — | |||
| Layer Thickness | WS₂ layer thickness | 3.042nm | — | |||
| Layer Thickness | SiO₂ layer thickness | 36.462nm | — | |||
| Layer Count | number of alternations | 15 | — | |||
| Anisotropy Parameter | eta = nth/nrh | 1.169 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | SiO₂ refractive index | 1.45 | — | |||
| Refractive Index | radial refractive index | 2.447 | — | |||
| Refractive Index | azimuthal refractive index | 3.756 | — | |||
| Dimensionless Fraction | WS₂ filling factor | 0.077 | — | |||
| Layer Thickness | WS₂ layer thickness | 3.042nm | — | |||
| Layer Thickness | SiO₂ layer thickness | 36.462nm | — | |||
| Layer Count | number of alternations | 15 | — | |||
| Anisotropy Parameter | eta = nth/nrh | 1.169 | — |