Research paper
TheoreticalComputational Multiscale| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Critical Slit Width | open slit critical width for single-layer cavity | < 3nm | — | |||
| Critical Slit Width | threshold for stationary closed state | 7.6nm | — | |||
| Thermal Stability Temperature | transition temperature for wider two-layer slits | 400K | — | |||
| Critical Slit Width | stable open width limit for two-layer slits under thermal oscillations | 15nm | — | |||
| Thermal Stability | open states of three-layer slits | always stable | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Critical Slit Width | open slit critical width for single-layer cavity | < 3nm | — | |||
| Critical Slit Width | threshold for stationary closed state | 7.6nm | — | |||
| Thermal Stability Temperature | transition temperature for wider two-layer slits | 400K | — | |||
| Critical Slit Width | stable open width limit for two-layer slits under thermal oscillations | 15nm | — | |||
| Thermal Stability | open states of three-layer slits | always stable | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Critical Slit Width | open slit critical width for single-layer cavity | < 3nm | — | |||
| Critical Slit Width | threshold for stationary closed state | 7.6nm | — | |||
| Thermal Stability Temperature | transition temperature for wider two-layer slits | 400K | — | |||
| Critical Slit Width | stable open width limit for two-layer slits under thermal oscillations | 15nm | — | |||
| Thermal Stability | open states of three-layer slits | always stable | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Critical Slit Width | open slit critical width for single-layer cavity | < 3nm | — | |||
| Critical Slit Width | threshold for stationary closed state | 7.6nm | — | |||
| Thermal Stability Temperature | transition temperature for wider two-layer slits | 400K | — | |||
| Critical Slit Width | stable open width limit for two-layer slits under thermal oscillations | 15nm | — | |||
| Thermal Stability | open states of three-layer slits | always stable | — |