Research paper
Experimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | localized emitter peak | 1.718eV | — | |||
| PL Peak | localized emitter peak | 1.7eV | — | |||
| Pl Peak Fwhm | localized emitter peak at 1.718 eV | 1.3meV | — | |||
| PL Peak | X₀ | 1.75eV | — | |||
| Pl Peak Fwhm | X₀ | 13meV | — | |||
| PL Peak | strain-induced localized emission region | 1.62-1.68eV | — | |||
| PL Peak | strain-induced localized emission region | 1.70-1.73eV | — | |||
| PL Peak | low-energy SPE region | 1.63-1.66eV | — | |||
| PL Peak | low-energy SPE region | 1.54-1.58eV | — | |||
| Afm Indentation Depth | indentation depth | 33nm | — | |||
| Afm Indentation Depth | indentation depth | 27nm | — | |||
| Afm Indentation Depth | indentation depth | 19nm | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | localized emitter peak | 1.718eV | — | |||
| PL Peak | localized emitter peak | 1.7eV | — | |||
| Pl Peak Fwhm | localized emitter peak at 1.718 eV | 1.3meV | — | |||
| PL Peak | X₀ | 1.75eV | — | |||
| Pl Peak Fwhm | X₀ | 13meV | — | |||
| PL Peak | strain-induced localized emission region | 1.62-1.68eV | — | |||
| PL Peak | strain-induced localized emission region | 1.70-1.73eV | — | |||
| PL Peak | low-energy SPE region | 1.63-1.66eV | — | |||
| PL Peak | low-energy SPE region | 1.54-1.58eV | — | |||
| Afm Indentation Depth | indentation depth | 33nm | — | |||
| Afm Indentation Depth | indentation depth | 27nm | — | |||
| Afm Indentation Depth | indentation depth | 19nm | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | localized emitter peak | 1.718eV | — | |||
| PL Peak | localized emitter peak | 1.7eV | — | |||
| Pl Peak Fwhm | localized emitter peak at 1.718 eV | 1.3meV | — | |||
| PL Peak | X₀ | 1.75eV | — | |||
| Pl Peak Fwhm | X₀ | 13meV | — | |||
| PL Peak | strain-induced localized emission region | 1.62-1.68eV | — | |||
| PL Peak | strain-induced localized emission region | 1.70-1.73eV | — | |||
| PL Peak | low-energy SPE region | 1.63-1.66eV | — | |||
| PL Peak | low-energy SPE region | 1.54-1.58eV | — | |||
| Afm Indentation Depth | indentation depth | 33nm | — | |||
| Afm Indentation Depth | indentation depth | 27nm | — | |||
| Afm Indentation Depth | indentation depth | 19nm | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | localized emitter peak | 1.718eV | — | |||
| PL Peak | localized emitter peak | 1.7eV | — | |||
| Pl Peak Fwhm | localized emitter peak at 1.718 eV | 1.3meV | — | |||
| PL Peak | X₀ | 1.75eV | — | |||
| Pl Peak Fwhm | X₀ | 13meV | — | |||
| PL Peak | strain-induced localized emission region | 1.62-1.68eV | — | |||
| PL Peak | strain-induced localized emission region | 1.70-1.73eV | — | |||
| PL Peak | low-energy SPE region | 1.63-1.66eV | — | |||
| PL Peak | low-energy SPE region | 1.54-1.58eV | — | |||
| Afm Indentation Depth | indentation depth | 33nm | — | |||
| Afm Indentation Depth | indentation depth | 27nm | — | |||
| Afm Indentation Depth | indentation depth | 19nm | — |