Patent
substrate
sapphire
Al₂O₃
reflection layer
FIG. 8 is an SEM image of cross-stacked drawn carbon nanotube films. [0016]
FIG. 9 is an SEM image of an untwisted carbon nanotube wire. [0017]
FIG. 10 is an SEM image of a twisted carbon nanotube wire. [0018]
| 0.34 nm |
C |
tensile strength of single-layer graphene | 125 GPa | C |
Young's modulus of single-layer graphene | 1 TPa | C |
resistivity of single-layer graphene | — | C |
Thickness | 1–100000 nm | — |
Thickness | 10–500000 nm | — |
Thickness | 10–10000 nm | — |
Thickness | 300–1000 µm | — |
Thickness | 100–500 nm | — |
Thickness | 100–800 nm | — |
Duration | 10–20 minutes | — |
Duration | 5–10 minutes | — |
Duration | 1–2 minutes | — |
Thickness | 3–10 nm | — |
Thickness | 200–500 nm | — |
Duration | 30–90 minutes | — |
Thickness | 0.5–50 nm | — |
Thickness | 0.5–100000 nm | — |
Thickness | 1000–5000000 nm | — |
Thickness | 0.5–5000 nm | — |
Thickness | 0.1–3 µm | — |
Thickness | 0.1–0.5 µm | — |
Duration | 200–1000 seconds | — |
Thickness | 10–50 nm | — |
Duration | 30–300 seconds | — |
Pressure | 50–500 Torr | — |
Pressure | 76–200 Torr | — |
Duration | 20–30 minutes | — |
Thickness | 0.01–2 µm | — |
Thickness | 50–250 nm | — |
Thickness | 30–150 nm | — |
Thickness | ≤ 10 mm | — |
METHOD FOR MANUFACTURING GALLIUM NITRIDE SUBSTRATE USING CORE-SHELL NANOPARTICLE
substrate
sapphire
Al₂O₃
reflection layer
FIG. 8 is an SEM image of cross-stacked drawn carbon nanotube films. [0016]
FIG. 9 is an SEM image of an untwisted carbon nanotube wire. [0017]
FIG. 10 is an SEM image of a twisted carbon nanotube wire. [0018]
| 0.34 nm |
C |
tensile strength of single-layer graphene | 125 GPa | C |
Young's modulus of single-layer graphene | 1 TPa | C |
resistivity of single-layer graphene | — | C |
Thickness | 1–100000 nm | — |
Thickness | 10–500000 nm | — |
Thickness | 10–10000 nm | — |
Thickness | 300–1000 µm | — |
Thickness | 100–500 nm | — |
Thickness | 100–800 nm | — |
Duration | 10–20 minutes | — |
Duration | 5–10 minutes | — |
Duration | 1–2 minutes | — |
Thickness | 3–10 nm | — |
Thickness | 200–500 nm | — |
Duration | 30–90 minutes | — |
Thickness | 0.5–50 nm | — |
Thickness | 0.5–100000 nm | — |
Thickness | 1000–5000000 nm | — |
Thickness | 0.5–5000 nm | — |
Thickness | 0.1–3 µm | — |
Thickness | 0.1–0.5 µm | — |
Duration | 200–1000 seconds | — |
Thickness | 10–50 nm | — |
Duration | 30–300 seconds | — |
Pressure | 50–500 Torr | — |
Pressure | 76–200 Torr | — |
Duration | 20–30 minutes | — |
Thickness | 0.01–2 µm | — |
Thickness | 50–250 nm | — |
Thickness | 30–150 nm | — |
Thickness | ≤ 10 mm | — |
METHOD FOR MANUFACTURING GALLIUM NITRIDE SUBSTRATE USING CORE-SHELL NANOPARTICLE
substrate
sapphire
Al₂O₃
reflection layer
FIG. 8 is an SEM image of cross-stacked drawn carbon nanotube films. [0016]
FIG. 9 is an SEM image of an untwisted carbon nanotube wire. [0017]
FIG. 10 is an SEM image of a twisted carbon nanotube wire. [0018]
| 0.34 nm |
C |
tensile strength of single-layer graphene | 125 GPa | C |
Young's modulus of single-layer graphene | 1 TPa | C |
resistivity of single-layer graphene | — | C |
Thickness | 1–100000 nm | — |
Thickness | 10–500000 nm | — |
Thickness | 10–10000 nm | — |
Thickness | 300–1000 µm | — |
Thickness | 100–500 nm | — |
Thickness | 100–800 nm | — |
Duration | 10–20 minutes | — |
Duration | 5–10 minutes | — |
Duration | 1–2 minutes | — |
Thickness | 3–10 nm | — |
Thickness | 200–500 nm | — |
Duration | 30–90 minutes | — |
Thickness | 0.5–50 nm | — |
Thickness | 0.5–100000 nm | — |
Thickness | 1000–5000000 nm | — |
Thickness | 0.5–5000 nm | — |
Thickness | 0.1–3 µm | — |
Thickness | 0.1–0.5 µm | — |
Duration | 200–1000 seconds | — |
Thickness | 10–50 nm | — |
Duration | 30–300 seconds | — |
Pressure | 50–500 Torr | — |
Pressure | 76–200 Torr | — |
Duration | 20–30 minutes | — |
Thickness | 0.01–2 µm | — |
Thickness | 50–250 nm | — |
Thickness | 30–150 nm | — |
Thickness | ≤ 10 mm | — |
METHOD FOR MANUFACTURING GALLIUM NITRIDE SUBSTRATE USING CORE-SHELL NANOPARTICLE
substrate
sapphire
Al₂O₃
reflection layer
FIG. 8 is an SEM image of cross-stacked drawn carbon nanotube films. [0016]
FIG. 9 is an SEM image of an untwisted carbon nanotube wire. [0017]
FIG. 10 is an SEM image of a twisted carbon nanotube wire. [0018]
| 0.34 nm |
C |
tensile strength of single-layer graphene | 125 GPa | C |
Young's modulus of single-layer graphene | 1 TPa | C |
resistivity of single-layer graphene | — | C |
Thickness | 1–100000 nm | — |
Thickness | 10–500000 nm | — |
Thickness | 10–10000 nm | — |
Thickness | 300–1000 µm | — |
Thickness | 100–500 nm | — |
Thickness | 100–800 nm | — |
Duration | 10–20 minutes | — |
Duration | 5–10 minutes | — |
Duration | 1–2 minutes | — |
Thickness | 3–10 nm | — |
Thickness | 200–500 nm | — |
Duration | 30–90 minutes | — |
Thickness | 0.5–50 nm | — |
Thickness | 0.5–100000 nm | — |
Thickness | 1000–5000000 nm | — |
Thickness | 0.5–5000 nm | — |
Thickness | 0.1–3 µm | — |
Thickness | 0.1–0.5 µm | — |
Duration | 200–1000 seconds | — |
Thickness | 10–50 nm | — |
Duration | 30–300 seconds | — |
Pressure | 50–500 Torr | — |
Pressure | 76–200 Torr | — |
Duration | 20–30 minutes | — |
Thickness | 0.01–2 µm | — |
Thickness | 50–250 nm | — |
Thickness | 30–150 nm | — |
Thickness | ≤ 10 mm | — |
METHOD FOR MANUFACTURING GALLIUM NITRIDE SUBSTRATE USING CORE-SHELL NANOPARTICLE