Patent
US 9,287,359rms edge roughness = 0 nm (atomically smooth) over ≥10 nm edge length (claim 4) | 0 nm | C |
average aspect ratio ≥20 (claim 1) | — | C |
width ≤5 nm (claim 8/11) | — | C |
width ≤~10 nm, average length ≥200 nm (claim 9/12) | — | C |
Duration | 1–13.75 hours | — |
Temperature | 895–930 °C | — |
Temperature | 860–930 °C | — |
Pressure | 0.000001 Torr | — |
Temperature | 860–935 °C | — |
Thickness | ≤ 1 nm | — |
Thickness | ≤ 0.5 nm | — |
Thickness | ≤ 10 nm | — |
Thickness | ≥ 40 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 200 nm | — |
Thickness | ≥ 500 nm | — |
Thickness | ≥ 300 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 35 nm | — |
Thickness | ≥ 60 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 1 mm | — |
Thickness | ≥ 10 mm | — |
Thickness | ≤ 5 nm | — |
rms edge roughness = 0 nm (atomically smooth) over ≥10 nm edge length (claim 4) | 0 nm | C |
average aspect ratio ≥20 (claim 1) | — | C |
width ≤5 nm (claim 8/11) | — | C |
width ≤~10 nm, average length ≥200 nm (claim 9/12) | — | C |
Duration | 1–13.75 hours | — |
Temperature | 895–930 °C | — |
Temperature | 860–930 °C | — |
Pressure | 0.000001 Torr | — |
Temperature | 860–935 °C | — |
Thickness | ≤ 1 nm | — |
Thickness | ≤ 0.5 nm | — |
Thickness | ≤ 10 nm | — |
Thickness | ≥ 40 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 200 nm | — |
Thickness | ≥ 500 nm | — |
Thickness | ≥ 300 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 35 nm | — |
Thickness | ≥ 60 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 1 mm | — |
Thickness | ≥ 10 mm | — |
Thickness | ≤ 5 nm | — |
rms edge roughness = 0 nm (atomically smooth) over ≥10 nm edge length (claim 4) | 0 nm | C |
average aspect ratio ≥20 (claim 1) | — | C |
width ≤5 nm (claim 8/11) | — | C |
width ≤~10 nm, average length ≥200 nm (claim 9/12) | — | C |
Duration | 1–13.75 hours | — |
Temperature | 895–930 °C | — |
Temperature | 860–930 °C | — |
Pressure | 0.000001 Torr | — |
Temperature | 860–935 °C | — |
Thickness | ≤ 1 nm | — |
Thickness | ≤ 0.5 nm | — |
Thickness | ≤ 10 nm | — |
Thickness | ≥ 40 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 200 nm | — |
Thickness | ≥ 500 nm | — |
Thickness | ≥ 300 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 35 nm | — |
Thickness | ≥ 60 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 1 mm | — |
Thickness | ≥ 10 mm | — |
Thickness | ≤ 5 nm | — |
rms edge roughness = 0 nm (atomically smooth) over ≥10 nm edge length (claim 4) | 0 nm | C |
average aspect ratio ≥20 (claim 1) | — | C |
width ≤5 nm (claim 8/11) | — | C |
width ≤~10 nm, average length ≥200 nm (claim 9/12) | — | C |
Duration | 1–13.75 hours | — |
Temperature | 895–930 °C | — |
Temperature | 860–930 °C | — |
Pressure | 0.000001 Torr | — |
Temperature | 860–935 °C | — |
Thickness | ≤ 1 nm | — |
Thickness | ≤ 0.5 nm | — |
Thickness | ≤ 10 nm | — |
Thickness | ≥ 40 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 200 nm | — |
Thickness | ≥ 500 nm | — |
Thickness | ≥ 300 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 35 nm | — |
Thickness | ≥ 60 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 1 mm | — |
Thickness | ≥ 10 mm | — |
Thickness | ≤ 5 nm | — |