Patent
US 9,297,768METHODS AND SYSTEMS FOR LABELING AND DETECTING DEFECTS IN A GRAPHENE LAYER
Thomas A. Yager
US
Copyright © 2026 Matter42. All rights reserved.
Patent
Atlas literature
Patent
US 9,297,768Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method of labeling to label one or more defects in a graphene layer, the method comprising: providing a substrate having a surface at least partially covered by the graphene layer; and contacting the substrate with an indicator that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label the one or more defects.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator that includes -i§ one of a fluorophore, a dye, a radioisotope, or a quantum dot.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore, and the method further comprising: exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 1, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the indicator to remove any non-localized indicator from the graphene layer.
The method of claim 1, wherein providing the substrate comprises providing a substrate that includes i s-an inorganic polar substrate.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.1.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.3.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w-SiV(3-z)[O(CH 2) Y CH 3]z --- (III), 4 wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
9-12.. canceled
canceled
canceled
canceled
16-19.. canceled
canceled
canceled
canceled
. canceled
23-24.. canceled
canceled
A system for labeling to label one or more defects in a graphene layer, the system comprising: 5 a substrate having a surface at least partially covered by the graphene layer; and a first reservoir containing that contains a solution of an indicator that selectively binds with one or more areas of the surface of the substrate exposed by one or more defects to label the one or more defects in the graphene layer, and configured to contact the substrate with the solution of the indicator.
The system of claim 25 wherein the indicator is-includes a fluorophore, the system further comprising: a radiation source configured to irradiate the substrate to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and a detector to monitor the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.4.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is- includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.6.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w- SiV(3-Z)[O(CH 2) Y CH 3] z -- (III), wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
28-31.. canceled
canceled
canceled
canceled
. canceled
. canceled
A method of inspecting to inspect a graphene layer for one or more defects, the method comprising: providing a an inorganic polar substrate having a surface at least partially covered by the graphene layer; contacting the substrate with a fluorophore that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label locations of the one or more defects; exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface of the substrate exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 42, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the fluorophore to remove any nonlocalized fluorophore from the graphene layer.
44-66.. 8 canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
Layer stacks claimed or described, ordered top of device to substrate.
graphene defect labeling system
Materials described outside the worked examples.
graphene layer
indicator
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Thickness | 360–440 nm | — |
Temperature |
Patent
Atlas literature
Patent
US 9,297,768Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method of labeling to label one or more defects in a graphene layer, the method comprising: providing a substrate having a surface at least partially covered by the graphene layer; and contacting the substrate with an indicator that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label the one or more defects.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator that includes -i§ one of a fluorophore, a dye, a radioisotope, or a quantum dot.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore, and the method further comprising: exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 1, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the indicator to remove any non-localized indicator from the graphene layer.
The method of claim 1, wherein providing the substrate comprises providing a substrate that includes i s-an inorganic polar substrate.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.1.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.3.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w-SiV(3-z)[O(CH 2) Y CH 3]z --- (III), 4 wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
9-12.. canceled
canceled
canceled
canceled
16-19.. canceled
canceled
canceled
canceled
. canceled
23-24.. canceled
canceled
A system for labeling to label one or more defects in a graphene layer, the system comprising: 5 a substrate having a surface at least partially covered by the graphene layer; and a first reservoir containing that contains a solution of an indicator that selectively binds with one or more areas of the surface of the substrate exposed by one or more defects to label the one or more defects in the graphene layer, and configured to contact the substrate with the solution of the indicator.
The system of claim 25 wherein the indicator is-includes a fluorophore, the system further comprising: a radiation source configured to irradiate the substrate to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and a detector to monitor the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.4.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is- includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.6.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w- SiV(3-Z)[O(CH 2) Y CH 3] z -- (III), wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
28-31.. canceled
canceled
canceled
canceled
. canceled
. canceled
A method of inspecting to inspect a graphene layer for one or more defects, the method comprising: providing a an inorganic polar substrate having a surface at least partially covered by the graphene layer; contacting the substrate with a fluorophore that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label locations of the one or more defects; exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface of the substrate exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 42, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the fluorophore to remove any nonlocalized fluorophore from the graphene layer.
44-66.. 8 canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
Layer stacks claimed or described, ordered top of device to substrate.
graphene defect labeling system
Materials described outside the worked examples.
graphene layer
indicator
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Thickness | 360–440 nm | — |
Temperature |
Patent
Atlas literature
Patent
US 9,297,768Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method of labeling to label one or more defects in a graphene layer, the method comprising: providing a substrate having a surface at least partially covered by the graphene layer; and contacting the substrate with an indicator that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label the one or more defects.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator that includes -i§ one of a fluorophore, a dye, a radioisotope, or a quantum dot.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore, and the method further comprising: exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 1, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the indicator to remove any non-localized indicator from the graphene layer.
The method of claim 1, wherein providing the substrate comprises providing a substrate that includes i s-an inorganic polar substrate.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.1.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.3.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w-SiV(3-z)[O(CH 2) Y CH 3]z --- (III), 4 wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
9-12.. canceled
canceled
canceled
canceled
16-19.. canceled
canceled
canceled
canceled
. canceled
23-24.. canceled
canceled
A system for labeling to label one or more defects in a graphene layer, the system comprising: 5 a substrate having a surface at least partially covered by the graphene layer; and a first reservoir containing that contains a solution of an indicator that selectively binds with one or more areas of the surface of the substrate exposed by one or more defects to label the one or more defects in the graphene layer, and configured to contact the substrate with the solution of the indicator.
The system of claim 25 wherein the indicator is-includes a fluorophore, the system further comprising: a radiation source configured to irradiate the substrate to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and a detector to monitor the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.4.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is- includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.6.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w- SiV(3-Z)[O(CH 2) Y CH 3] z -- (III), wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
28-31.. canceled
canceled
canceled
canceled
. canceled
. canceled
A method of inspecting to inspect a graphene layer for one or more defects, the method comprising: providing a an inorganic polar substrate having a surface at least partially covered by the graphene layer; contacting the substrate with a fluorophore that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label locations of the one or more defects; exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface of the substrate exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 42, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the fluorophore to remove any nonlocalized fluorophore from the graphene layer.
44-66.. 8 canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
Layer stacks claimed or described, ordered top of device to substrate.
graphene defect labeling system
Materials described outside the worked examples.
graphene layer
indicator
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Thickness | 360–440 nm | — |
Temperature |
Patent
Atlas literature
Patent
US 9,297,768Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method of labeling to label one or more defects in a graphene layer, the method comprising: providing a substrate having a surface at least partially covered by the graphene layer; and contacting the substrate with an indicator that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label the one or more defects.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator that includes -i§ one of a fluorophore, a dye, a radioisotope, or a quantum dot.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore, and the method further comprising: exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 1, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the indicator to remove any non-localized indicator from the graphene layer.
The method of claim 1, wherein providing the substrate comprises providing a substrate that includes i s-an inorganic polar substrate.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.1.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The method of claim 1, wherein contacting the substrate with the indicator comprises contacting the substrate with an indicator is- that includes a fluorophore and the fluorophore is-includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.3.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w-SiV(3-z)[O(CH 2) Y CH 3]z --- (III), 4 wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
9-12.. canceled
canceled
canceled
canceled
16-19.. canceled
canceled
canceled
canceled
. canceled
23-24.. canceled
canceled
A system for labeling to label one or more defects in a graphene layer, the system comprising: 5 a substrate having a surface at least partially covered by the graphene layer; and a first reservoir containing that contains a solution of an indicator that selectively binds with one or more areas of the surface of the substrate exposed by one or more defects to label the one or more defects in the graphene layer, and configured to contact the substrate with the solution of the indicator.
The system of claim 25 wherein the indicator is-includes a fluorophore, the system further comprising: a radiation source configured to irradiate the substrate to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface exposed by the one or more defects; and a detector to monitor the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is-includes a silane fluorophore having a Formula I: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.4.svg 0.16 4.58 Black and white wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
The system of claim 25, wherein the indicator is- includes a fluorophore and the fluorophore is- includes an aminopyrene derived fluorophore having a formula II: SVG 14118006.09-16-2015.IEPOU₇₇CPXXIFW1.CLM.6.svg 0.15 2.46 Black and white and at least the one or more areas of the surface exposed by the one or more defects comprise an amino silane having a formula III: NH 2 -(CH 2) w- SiV(3-Z)[O(CH 2) Y CH 3] z -- (III), wherein V is -H or -(CH 2) U CH 3, U is an integer of from 0 to 2, W is an integer of from 0 to 3, X is an integer of from 0 to 3, Y is an integer of from 0 to 2, and Z is an integer of from 1 to 3.
. canceled
28-31.. canceled
canceled
canceled
canceled
. canceled
. canceled
A method of inspecting to inspect a graphene layer for one or more defects, the method comprising: providing a an inorganic polar substrate having a surface at least partially covered by the graphene layer; contacting the substrate with a fluorophore that selectively binds with one or more areas of the surface of the substrate exposed by the one or more defects in the graphene layer to label locations of the one or more defects; exposing the substrate to radiation effective to generate a detectable fluorescence response from the fluorophore at the one or more areas of the surface of the substrate exposed by the one or more defects; and monitoring the fluorescence response of the fluorophore, wherein a detected fluorescence response identifies the one or more defects and an absence of the fluorescence response indicates an absence of the one or more defects.
The method of claim 42, further comprising contacting the substrate with a rinsing rinse liquid one or more times after contacting the substrate with the fluorophore to remove any nonlocalized fluorophore from the graphene layer.
44-66.. 8 canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
canceled
Layer stacks claimed or described, ordered top of device to substrate.
graphene defect labeling system
Materials described outside the worked examples.
graphene layer
indicator
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Thickness | 360–440 nm | — |
Temperature |
fluorophore
dye
radioisotope
quantum dot
inorganic polar substrate
silane fluorophore (Formula I)
aminopyrene derived fluorophore (Formula II)
amino silane (Formula III)
NH₂-(CH₂)w-SiV(3-z)[O(CH₂)YCH3]z
aminopyrene derived fluorophore C₁₆H₉-N=CH-(CH₂)3-CHO
C₁₆H₉-N=CH-(CH₂)3-CHO
aminopropyltriethoxysilane
NH₂-(CH₂)3-Si[O(CH₂)CH3]3
| — |
fluorophore
dye
radioisotope
quantum dot
inorganic polar substrate
silane fluorophore (Formula I)
aminopyrene derived fluorophore (Formula II)
amino silane (Formula III)
NH₂-(CH₂)w-SiV(3-z)[O(CH₂)YCH3]z
aminopyrene derived fluorophore C₁₆H₉-N=CH-(CH₂)3-CHO
C₁₆H₉-N=CH-(CH₂)3-CHO
aminopropyltriethoxysilane
NH₂-(CH₂)3-Si[O(CH₂)CH3]3
| — |
fluorophore
dye
radioisotope
quantum dot
inorganic polar substrate
silane fluorophore (Formula I)
aminopyrene derived fluorophore (Formula II)
amino silane (Formula III)
NH₂-(CH₂)w-SiV(3-z)[O(CH₂)YCH3]z
aminopyrene derived fluorophore C₁₆H₉-N=CH-(CH₂)3-CHO
C₁₆H₉-N=CH-(CH₂)3-CHO
aminopropyltriethoxysilane
NH₂-(CH₂)3-Si[O(CH₂)CH3]3
| — |
fluorophore
dye
radioisotope
quantum dot
inorganic polar substrate
silane fluorophore (Formula I)
aminopyrene derived fluorophore (Formula II)
amino silane (Formula III)
NH₂-(CH₂)w-SiV(3-z)[O(CH₂)YCH3]z
aminopyrene derived fluorophore C₁₆H₉-N=CH-(CH₂)3-CHO
C₁₆H₉-N=CH-(CH₂)3-CHO
aminopropyltriethoxysilane
NH₂-(CH₂)3-Si[O(CH₂)CH3]3
| — |