Patent
strain-inducing gas
acetylene
C₂H₂
helium
He
glass substrate
silicon wafer
Si
nickel
Ni
indium tin oxide
ITO
fluorine-doped tin oxide
SnO2:F
| 100–1000 nm |
| — |
Pressure | 1–10 mTorr | — |
— | 5–6 eV | — |
Temperature | 0–6 K | — |
Temperature | 0.000001 K | — |
Duration | 1–3 hours | — |
— | 5000–20000 eV | — |
Duration | ≤ 30 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | 3–7 minutes | — |
Duration | ≤ 1 minute | — |
Duration | ≤ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≤ 3 minutes | — |
Duration | ≥ 1 minute | — |
Duration | ≥ 10 minutes | — |
Duration | ≥ 5 minutes | — |
Duration | ≥ 3 minutes | — |
METHOD FOR FORMING GRAPHENE PATTERN
strain-inducing gas
acetylene
C₂H₂
helium
He
glass substrate
silicon wafer
Si
nickel
Ni
indium tin oxide
ITO
fluorine-doped tin oxide
SnO2:F
| 100–1000 nm |
| — |
Pressure | 1–10 mTorr | — |
— | 5–6 eV | — |
Temperature | 0–6 K | — |
Temperature | 0.000001 K | — |
Duration | 1–3 hours | — |
— | 5000–20000 eV | — |
Duration | ≤ 30 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | 3–7 minutes | — |
Duration | ≤ 1 minute | — |
Duration | ≤ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≤ 3 minutes | — |
Duration | ≥ 1 minute | — |
Duration | ≥ 10 minutes | — |
Duration | ≥ 5 minutes | — |
Duration | ≥ 3 minutes | — |
METHOD FOR FORMING GRAPHENE PATTERN
strain-inducing gas
acetylene
C₂H₂
helium
He
glass substrate
silicon wafer
Si
nickel
Ni
indium tin oxide
ITO
fluorine-doped tin oxide
SnO2:F
| 100–1000 nm |
| — |
Pressure | 1–10 mTorr | — |
— | 5–6 eV | — |
Temperature | 0–6 K | — |
Temperature | 0.000001 K | — |
Duration | 1–3 hours | — |
— | 5000–20000 eV | — |
Duration | ≤ 30 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | 3–7 minutes | — |
Duration | ≤ 1 minute | — |
Duration | ≤ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≤ 3 minutes | — |
Duration | ≥ 1 minute | — |
Duration | ≥ 10 minutes | — |
Duration | ≥ 5 minutes | — |
Duration | ≥ 3 minutes | — |
METHOD FOR FORMING GRAPHENE PATTERN
strain-inducing gas
acetylene
C₂H₂
helium
He
glass substrate
silicon wafer
Si
nickel
Ni
indium tin oxide
ITO
fluorine-doped tin oxide
SnO2:F
| 100–1000 nm |
| — |
Pressure | 1–10 mTorr | — |
— | 5–6 eV | — |
Temperature | 0–6 K | — |
Temperature | 0.000001 K | — |
Duration | 1–3 hours | — |
— | 5000–20000 eV | — |
Duration | ≤ 30 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | 3–7 minutes | — |
Duration | ≤ 1 minute | — |
Duration | ≤ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≤ 3 minutes | — |
Duration | ≥ 1 minute | — |
Duration | ≥ 10 minutes | — |
Duration | ≥ 5 minutes | — |
Duration | ≥ 3 minutes | — |
METHOD FOR FORMING GRAPHENE PATTERN