Research paper
Experimental CharacterizationComputational Monte Carlo| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | amorphous layer thickness | 510nm | — | |||
| Ion Fluence | Ne++ fluence | 2e16ions/cm2 | — | |||
| Temperature Threshold | onset of nanotwin-dominated recrystallization | 250°C | — | |||
| Temperature Threshold | advance of crystalline-amorphous interface | 200°C | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | amorphous layer thickness | 510nm | — | |||
| Ion Fluence | Ne++ fluence | 2e16ions/cm2 | — | |||
| Temperature Threshold | onset of nanotwin-dominated recrystallization | 250°C | — | |||
| Temperature Threshold | advance of crystalline-amorphous interface | 200°C | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | amorphous layer thickness | 510nm | — | |||
| Ion Fluence | Ne++ fluence | 2e16ions/cm2 | — | |||
| Temperature Threshold | onset of nanotwin-dominated recrystallization | 250°C | — | |||
| Temperature Threshold | advance of crystalline-amorphous interface | 200°C | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | amorphous layer thickness | 510nm | — | |||
| Ion Fluence | Ne++ fluence | 2e16ions/cm2 | — | |||
| Temperature Threshold | onset of nanotwin-dominated recrystallization | 250°C | — | |||
| Temperature Threshold | advance of crystalline-amorphous interface | 200°C | — |