Patent
US 11,802,350 B2layered GaAs (crystalline)
GaAs
K or Na powder, Ga powder, As powder precursor mixture
salt MXa (2≤a≤3); M=Al, Mg, Zn, Ga, or Mn; X=Cl, Br, or I
MXa
FIG. 2C is a graph illustrating XRD analysis results of layered K₂Ga₂As3, layered GaAs having been treated with a mixed solution, layered GaAs having been …
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 5A shows transmission electron microscope (TEM) images, EDS analysis image, EDS mapping, and an ele- ments’ atomic proportion table of a layered GaAs …
FIG. 6A shows images and graphs illustrating atomic force microscope (AFM) results of a GaAs nanosheet obtained from K₂Ga₂As₃ according to one exemplary …
FIG. 7 is X-ray photoelectron spectroscopy analysis results of Na₂Ga₂As₃ and layered GaAs, respectively syn- 45 thesized according to an exemplary embodiment …
FIG. 8 is Raman analysis results of Na₂Ga₂As₃ and layered GaAs obtained from the Na₂Ga₂As3, each of which 50 synthesized according to an exemplary embodiment …
FIGS. 9 and 10 are cross-section STEM images of the layered GaAs obtained from the Na₂Ga₂As3, synthesized according to an exemplary embodiment of the present …
FIG. 11A is an OM (optical microscope) image of layered GaAs obtained from Na₂Ga₂As3.
Absent XRD peaks (bulk GaAs) in layered GaAs product — 2θ positions not produced | no peaks at 26.9±0.2, 44.6±0.2, 52.8±0.2, 64.9±0.2, 71.5±0.2 deg | GaAs |
Temperature | 0.5–3 °C | — |
Temperature | 650–800 °C | — |
Duration | 6–24 hours | — |
Temperature | 20–60 °C | — |
Temperature | ≤ 650 °C | — |
Temperature | ≤ 0.5 °C | — |
Temperature | ≤ 20 °C | — |
Temperature | ≥ 800 °C | — |
Duration | ≥ 24 hours | — |
Temperature | ≥ 60 °C | — |
Cited non-patent literature · 2
layered GaAs (crystalline)
GaAs
K or Na powder, Ga powder, As powder precursor mixture
salt MXa (2≤a≤3); M=Al, Mg, Zn, Ga, or Mn; X=Cl, Br, or I
MXa
FIG. 2C is a graph illustrating XRD analysis results of layered K₂Ga₂As3, layered GaAs having been treated with a mixed solution, layered GaAs having been …
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 5A shows transmission electron microscope (TEM) images, EDS analysis image, EDS mapping, and an ele- ments’ atomic proportion table of a layered GaAs …
FIG. 6A shows images and graphs illustrating atomic force microscope (AFM) results of a GaAs nanosheet obtained from K₂Ga₂As₃ according to one exemplary …
FIG. 7 is X-ray photoelectron spectroscopy analysis results of Na₂Ga₂As₃ and layered GaAs, respectively syn- 45 thesized according to an exemplary embodiment …
FIG. 8 is Raman analysis results of Na₂Ga₂As₃ and layered GaAs obtained from the Na₂Ga₂As3, each of which 50 synthesized according to an exemplary embodiment …
FIGS. 9 and 10 are cross-section STEM images of the layered GaAs obtained from the Na₂Ga₂As3, synthesized according to an exemplary embodiment of the present …
FIG. 11A is an OM (optical microscope) image of layered GaAs obtained from Na₂Ga₂As3.
Absent XRD peaks (bulk GaAs) in layered GaAs product — 2θ positions not produced | no peaks at 26.9±0.2, 44.6±0.2, 52.8±0.2, 64.9±0.2, 71.5±0.2 deg | GaAs |
Temperature | 0.5–3 °C | — |
Temperature | 650–800 °C | — |
Duration | 6–24 hours | — |
Temperature | 20–60 °C | — |
Temperature | ≤ 650 °C | — |
Temperature | ≤ 0.5 °C | — |
Temperature | ≤ 20 °C | — |
Temperature | ≥ 800 °C | — |
Duration | ≥ 24 hours | — |
Temperature | ≥ 60 °C | — |
Cited non-patent literature · 2
layered GaAs (crystalline)
GaAs
K or Na powder, Ga powder, As powder precursor mixture
salt MXa (2≤a≤3); M=Al, Mg, Zn, Ga, or Mn; X=Cl, Br, or I
MXa
FIG. 2C is a graph illustrating XRD analysis results of layered K₂Ga₂As3, layered GaAs having been treated with a mixed solution, layered GaAs having been …
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 5A shows transmission electron microscope (TEM) images, EDS analysis image, EDS mapping, and an ele- ments’ atomic proportion table of a layered GaAs …
FIG. 6A shows images and graphs illustrating atomic force microscope (AFM) results of a GaAs nanosheet obtained from K₂Ga₂As₃ according to one exemplary …
FIG. 7 is X-ray photoelectron spectroscopy analysis results of Na₂Ga₂As₃ and layered GaAs, respectively syn- 45 thesized according to an exemplary embodiment …
FIG. 8 is Raman analysis results of Na₂Ga₂As₃ and layered GaAs obtained from the Na₂Ga₂As3, each of which 50 synthesized according to an exemplary embodiment …
FIGS. 9 and 10 are cross-section STEM images of the layered GaAs obtained from the Na₂Ga₂As3, synthesized according to an exemplary embodiment of the present …
FIG. 11A is an OM (optical microscope) image of layered GaAs obtained from Na₂Ga₂As3.
Absent XRD peaks (bulk GaAs) in layered GaAs product — 2θ positions not produced | no peaks at 26.9±0.2, 44.6±0.2, 52.8±0.2, 64.9±0.2, 71.5±0.2 deg | GaAs |
Temperature | 0.5–3 °C | — |
Temperature | 650–800 °C | — |
Duration | 6–24 hours | — |
Temperature | 20–60 °C | — |
Temperature | ≤ 650 °C | — |
Temperature | ≤ 0.5 °C | — |
Temperature | ≤ 20 °C | — |
Temperature | ≥ 800 °C | — |
Duration | ≥ 24 hours | — |
Temperature | ≥ 60 °C | — |
Cited non-patent literature · 2
layered GaAs (crystalline)
GaAs
K or Na powder, Ga powder, As powder precursor mixture
salt MXa (2≤a≤3); M=Al, Mg, Zn, Ga, or Mn; X=Cl, Br, or I
MXa
FIG. 2C is a graph illustrating XRD analysis results of layered K₂Ga₂As3, layered GaAs having been treated with a mixed solution, layered GaAs having been …
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 3A shows scanning electron microscope (SEM) 15 images of the layered K₂Ga₂As₃ and the layered GaAs obtained therefrom.
FIG. 5A shows transmission electron microscope (TEM) images, EDS analysis image, EDS mapping, and an ele- ments’ atomic proportion table of a layered GaAs …
FIG. 6A shows images and graphs illustrating atomic force microscope (AFM) results of a GaAs nanosheet obtained from K₂Ga₂As₃ according to one exemplary …
FIG. 7 is X-ray photoelectron spectroscopy analysis results of Na₂Ga₂As₃ and layered GaAs, respectively syn- 45 thesized according to an exemplary embodiment …
FIG. 8 is Raman analysis results of Na₂Ga₂As₃ and layered GaAs obtained from the Na₂Ga₂As3, each of which 50 synthesized according to an exemplary embodiment …
FIGS. 9 and 10 are cross-section STEM images of the layered GaAs obtained from the Na₂Ga₂As3, synthesized according to an exemplary embodiment of the present …
FIG. 11A is an OM (optical microscope) image of layered GaAs obtained from Na₂Ga₂As3.
Absent XRD peaks (bulk GaAs) in layered GaAs product — 2θ positions not produced | no peaks at 26.9±0.2, 44.6±0.2, 52.8±0.2, 64.9±0.2, 71.5±0.2 deg | GaAs |
Temperature | 0.5–3 °C | — |
Temperature | 650–800 °C | — |
Duration | 6–24 hours | — |
Temperature | 20–60 °C | — |
Temperature | ≤ 650 °C | — |
Temperature | ≤ 0.5 °C | — |
Temperature | ≤ 20 °C | — |
Temperature | ≥ 800 °C | — |
Duration | ≥ 24 hours | — |
Temperature | ≥ 60 °C | — |
Cited non-patent literature · 2