Patent
US 11,840,458 B2hydrogen-containing layered M₁-xHaGayNz compound
M₁-xHaGayNz
Ca₃(GaN₂)2N
CaGaN
FIG. 2 is a graph illustrating results of XRD diffraction patterns of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 5 is a scanning electron microscopy (SEM) image of samples according to an embodiment of the invention;
FIG. 6 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and energy dispersive spectroscopy (EDS) analysis according to an …
FIG. 7 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and focused ion beam (FIB) analysis according to an embodiment of …
FIG. 8 is an image illustrating results of transmission electron microscope (TEM) analysis of samples according to an embodiment of the invention;
FIG. 9 is a graph illustrating results of scanning tunneling spectroscopy (STS) analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 11 is an image illustrating results of photolumines- cence mapping analysis of samples according to an embodi- ment of the invention;
FIG. 13 is a graph illustrating results of measuring hys- teresis curves of samples according to an embodiment of the invention;
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 15 is a graph of voltage-current properties of samples according to an embodiment of the invention.
FT-IR N-H bonding peak range for M1-xHaGayNz compound | — | M₁-xHaGayNz |
XPS Ga(2P) binding energy peaks for M1-xHaGayNz compound | — | M₁-xHaGayNz |
Energy band gap of layered M1-xGayNz compound | — | M₁-xGayNz |
Thickness of GaN nanosheet | — | M₁-xGayNz |
Space group of Ca3(GaN2)2N | C₂/c | Ca₃(GaN₂)2N |
Space group of CaGaN | P₄/nmm | CaGaN |
— | 1140–1155 eV | — |
— | 1115–1125 eV | — |
— | 0.1–2.5 eV | — |
— | 1.3–2.2 eV | — |
Thickness | 1–1500 cm | — |
hydrogen-containing layered M₁-xHaGayNz compound
M₁-xHaGayNz
Ca₃(GaN₂)2N
CaGaN
FIG. 2 is a graph illustrating results of XRD diffraction patterns of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 5 is a scanning electron microscopy (SEM) image of samples according to an embodiment of the invention;
FIG. 6 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and energy dispersive spectroscopy (EDS) analysis according to an …
FIG. 7 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and focused ion beam (FIB) analysis according to an embodiment of …
FIG. 8 is an image illustrating results of transmission electron microscope (TEM) analysis of samples according to an embodiment of the invention;
FIG. 9 is a graph illustrating results of scanning tunneling spectroscopy (STS) analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 11 is an image illustrating results of photolumines- cence mapping analysis of samples according to an embodi- ment of the invention;
FIG. 13 is a graph illustrating results of measuring hys- teresis curves of samples according to an embodiment of the invention;
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 15 is a graph of voltage-current properties of samples according to an embodiment of the invention.
FT-IR N-H bonding peak range for M1-xHaGayNz compound | — | M₁-xHaGayNz |
XPS Ga(2P) binding energy peaks for M1-xHaGayNz compound | — | M₁-xHaGayNz |
Energy band gap of layered M1-xGayNz compound | — | M₁-xGayNz |
Thickness of GaN nanosheet | — | M₁-xGayNz |
Space group of Ca3(GaN2)2N | C₂/c | Ca₃(GaN₂)2N |
Space group of CaGaN | P₄/nmm | CaGaN |
— | 1140–1155 eV | — |
— | 1115–1125 eV | — |
— | 0.1–2.5 eV | — |
— | 1.3–2.2 eV | — |
Thickness | 1–1500 cm | — |
hydrogen-containing layered M₁-xHaGayNz compound
M₁-xHaGayNz
Ca₃(GaN₂)2N
CaGaN
FIG. 2 is a graph illustrating results of XRD diffraction patterns of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 5 is a scanning electron microscopy (SEM) image of samples according to an embodiment of the invention;
FIG. 6 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and energy dispersive spectroscopy (EDS) analysis according to an …
FIG. 7 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and focused ion beam (FIB) analysis according to an embodiment of …
FIG. 8 is an image illustrating results of transmission electron microscope (TEM) analysis of samples according to an embodiment of the invention;
FIG. 9 is a graph illustrating results of scanning tunneling spectroscopy (STS) analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 11 is an image illustrating results of photolumines- cence mapping analysis of samples according to an embodi- ment of the invention;
FIG. 13 is a graph illustrating results of measuring hys- teresis curves of samples according to an embodiment of the invention;
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 15 is a graph of voltage-current properties of samples according to an embodiment of the invention.
FT-IR N-H bonding peak range for M1-xHaGayNz compound | — | M₁-xHaGayNz |
XPS Ga(2P) binding energy peaks for M1-xHaGayNz compound | — | M₁-xHaGayNz |
Energy band gap of layered M1-xGayNz compound | — | M₁-xGayNz |
Thickness of GaN nanosheet | — | M₁-xGayNz |
Space group of Ca3(GaN2)2N | C₂/c | Ca₃(GaN₂)2N |
Space group of CaGaN | P₄/nmm | CaGaN |
— | 1140–1155 eV | — |
— | 1115–1125 eV | — |
— | 0.1–2.5 eV | — |
— | 1.3–2.2 eV | — |
Thickness | 1–1500 cm | — |
hydrogen-containing layered M₁-xHaGayNz compound
M₁-xHaGayNz
Ca₃(GaN₂)2N
CaGaN
FIG. 2 is a graph illustrating results of XRD diffraction patterns of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 3 is a graph illustrating results of Fourier-transform infrared spectroscopy (FT-IR) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 4 is a graph illustrating results of X-ray photoelec- tron spectroscopy (XPS) analysis of samples according to an embodiment of the invention;
FIG. 5 is a scanning electron microscopy (SEM) image of samples according to an embodiment of the invention;
FIG. 6 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and energy dispersive spectroscopy (EDS) analysis according to an …
FIG. 7 is an image illustrating results of scanning trans- mission electron microscopy (STEM) and focused ion beam (FIB) analysis according to an embodiment of …
FIG. 8 is an image illustrating results of transmission electron microscope (TEM) analysis of samples according to an embodiment of the invention;
FIG. 9 is a graph illustrating results of scanning tunneling spectroscopy (STS) analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 10 is a graph illustrating photoluminescence prop- erties in photoluminescence analysis of samples according to an embodiment of the invention;
FIG. 11 is an image illustrating results of photolumines- cence mapping analysis of samples according to an embodi- ment of the invention;
FIG. 13 is a graph illustrating results of measuring hys- teresis curves of samples according to an embodiment of the invention;
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 14 is a graph illustrating results of measuring hys- teresis curves and a coercive electric field according to a thickness of samples according to an …
FIG. 15 is a graph of voltage-current properties of samples according to an embodiment of the invention.
FT-IR N-H bonding peak range for M1-xHaGayNz compound | — | M₁-xHaGayNz |
XPS Ga(2P) binding energy peaks for M1-xHaGayNz compound | — | M₁-xHaGayNz |
Energy band gap of layered M1-xGayNz compound | — | M₁-xGayNz |
Thickness of GaN nanosheet | — | M₁-xGayNz |
Space group of Ca3(GaN2)2N | C₂/c | Ca₃(GaN₂)2N |
Space group of CaGaN | P₄/nmm | CaGaN |
— | 1140–1155 eV | — |
— | 1115–1125 eV | — |
— | 0.1–2.5 eV | — |
— | 1.3–2.2 eV | — |
Thickness | 1–1500 cm | — |