Research paper
Experimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP:Fe wafer thickness | 350um | — | |||
| Fet Sheet Resistance | leakage current | 1.5uA | — | |||
| Fet Threshold Voltage | rise time | 250ps | — | |||
| Fet On Off Ratio | energy resolution | 28% | — | |||
| Fet Threshold Voltage | bias sweep lower bound | 100V | — | |||
| Fet Threshold Voltage | bias sweep upper bound | 250V | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP:Fe wafer thickness | 350um | — | |||
| Fet Sheet Resistance | leakage current | 1.5uA | — | |||
| Fet Threshold Voltage | rise time | 250ps | — | |||
| Fet On Off Ratio | energy resolution | 28% | — | |||
| Fet Threshold Voltage | bias sweep lower bound | 100V | — | |||
| Fet Threshold Voltage | bias sweep upper bound | 250V | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP:Fe wafer thickness | 350um | — | |||
| Fet Sheet Resistance | leakage current | 1.5uA | — | |||
| Fet Threshold Voltage | rise time | 250ps | — | |||
| Fet On Off Ratio | energy resolution | 28% | — | |||
| Fet Threshold Voltage | bias sweep lower bound | 100V | — | |||
| Fet Threshold Voltage | bias sweep upper bound | 250V | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InP:Fe wafer thickness | 350um | — | |||
| Fet Sheet Resistance | leakage current | 1.5uA | — | |||
| Fet Threshold Voltage | rise time | 250ps | — | |||
| Fet On Off Ratio | energy resolution | 28% | — | |||
| Fet Threshold Voltage | bias sweep lower bound | 100V | — | |||
| Fet Threshold Voltage | bias sweep upper bound | 250V | — |