Research paper
Experimental CharacterizationReproducible generation of green-emitting color centers in hBN using oxygen annealing
Helmi Fartas, Saïd Hassani, Jean-Pierre Hermier, Ngoc Diep Lai et al.
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| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 156nm | — | — | ||
| PL Peak | ZPL | 540nm | — | |||
| Pl Peak Fwhm | ZPL | 9nm | — | |||
| Emitter Density | color center density | 1um⁻² | — | |||
| PL Peak | ZPL center wavelength | 539.35nm | — | |||
| Pl Peak Fwhm | ZPL linewidth limit by spectrometer resolution | 0.12meV | — | |||
| Emitter Lifetime | fluorescence lifetime | 4.22ns | — | |||
| PL Peak | ensemble emission center | 539.4nm | — | |||
| Saturation Power | Psat | 1-1.5mW | — | |||
| Count Rate | C∞ | 2000000counts/s | — | |||
| G2 Zero Delay | g(2)(0) | 0.09 | — | |||
| Fluorescence Lifetime | single-exponential decay time | 4.2ns | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 156nm | — | — | ||
| PL Peak | ZPL | 540nm | — | |||
| Pl Peak Fwhm | ZPL | 9nm | — | |||
| Emitter Density | color center density | 1um⁻² | — | |||
| PL Peak | ZPL center wavelength | 539.35nm | — | |||
| Pl Peak Fwhm | ZPL linewidth limit by spectrometer resolution | 0.12meV | — | |||
| Emitter Lifetime | fluorescence lifetime | 4.22ns | — | |||
| PL Peak | ensemble emission center | 539.4nm | — | |||
| Saturation Power | Psat | 1-1.5mW | — | |||
| Count Rate | C∞ | 2000000counts/s | — | |||
| G2 Zero Delay | g(2)(0) | 0.09 | — | |||
| Fluorescence Lifetime | single-exponential decay time | 4.2ns | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 156nm | — | — | ||
| PL Peak | ZPL | 540nm | — | |||
| Pl Peak Fwhm | ZPL | 9nm | — | |||
| Emitter Density | color center density | 1um⁻² | — | |||
| PL Peak | ZPL center wavelength | 539.35nm | — | |||
| Pl Peak Fwhm | ZPL linewidth limit by spectrometer resolution | 0.12meV | — | |||
| Emitter Lifetime | fluorescence lifetime | 4.22ns | — | |||
| PL Peak | ensemble emission center | 539.4nm | — | |||
| Saturation Power | Psat | 1-1.5mW | — | |||
| Count Rate | C∞ | 2000000counts/s | — | |||
| G2 Zero Delay | g(2)(0) | 0.09 | — | |||
| Fluorescence Lifetime | single-exponential decay time | 4.2ns | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 156nm | — | — | ||
| PL Peak | ZPL | 540nm | — | |||
| Pl Peak Fwhm | ZPL | 9nm | — | |||
| Emitter Density | color center density | 1um⁻² | — | |||
| PL Peak | ZPL center wavelength | 539.35nm | — | |||
| Pl Peak Fwhm | ZPL linewidth limit by spectrometer resolution | 0.12meV | — | |||
| Emitter Lifetime | fluorescence lifetime | 4.22ns | — | |||
| PL Peak | ensemble emission center | 539.4nm | — | |||
| Saturation Power | Psat | 1-1.5mW | — | |||
| Count Rate | C∞ | 2000000counts/s | — | |||
| G2 Zero Delay | g(2)(0) | 0.09 | — | |||
| Fluorescence Lifetime | single-exponential decay time | 4.2ns | — |