Research paperExperimental CharacterizationTorsional Force Microscopy of Van der Waals Moirés and Atomic LatticesMihir Pendharkar, Steven J. Tran, Gregory Zaborski Jr., Joe Finney et al.arXiv·2023·10.1103/PhysRevB.82.121407·arXiv:2308.08814AbstractTorsional Force Microscopy (TFM) is introduced as a scanning probe method sensitive to dynamic friction that can reveal moiré superlattices and atomic crystal lattices in van der Waals stacks at room temperature in air without electrical bias. The work demonstrates TFM on twisted bilayer graphene and graphene/hBN moiré systems and discusses imaging on different stamp/support configurations.Read more
Twisted bilayer graphene moiré sample imaged by TFM on a PC stamp mounted on a PDMS handle on a glass slide.1 characterization2 properties3 figuresExperimentalCStudied MaterialExpand
Research paperExperimental CharacterizationTorsional Force Microscopy of Van der Waals Moirés and Atomic LatticesMihir Pendharkar, Steven J. Tran, Gregory Zaborski Jr., Joe Finney et al.arXiv·2023·10.1103/PhysRevB.82.121407·arXiv:2308.08814AbstractTorsional Force Microscopy (TFM) is introduced as a scanning probe method sensitive to dynamic friction that can reveal moiré superlattices and atomic crystal lattices in van der Waals stacks at room temperature in air without electrical bias. The work demonstrates TFM on twisted bilayer graphene and graphene/hBN moiré systems and discusses imaging on different stamp/support configurations.Read more
Twisted bilayer graphene moiré sample imaged by TFM on a PC stamp mounted on a PDMS handle on a glass slide.1 characterization2 properties3 figuresExperimentalCStudied MaterialExpand
Research paperExperimental CharacterizationTorsional Force Microscopy of Van der Waals Moirés and Atomic LatticesMihir Pendharkar, Steven J. Tran, Gregory Zaborski Jr., Joe Finney et al.arXiv·2023·10.1103/PhysRevB.82.121407·arXiv:2308.08814AbstractTorsional Force Microscopy (TFM) is introduced as a scanning probe method sensitive to dynamic friction that can reveal moiré superlattices and atomic crystal lattices in van der Waals stacks at room temperature in air without electrical bias. The work demonstrates TFM on twisted bilayer graphene and graphene/hBN moiré systems and discusses imaging on different stamp/support configurations.Read more
Twisted bilayer graphene moiré sample imaged by TFM on a PC stamp mounted on a PDMS handle on a glass slide.1 characterization2 properties3 figuresExperimentalCStudied MaterialExpand
Research paperExperimental CharacterizationTorsional Force Microscopy of Van der Waals Moirés and Atomic LatticesMihir Pendharkar, Steven J. Tran, Gregory Zaborski Jr., Joe Finney et al.arXiv·2023·10.1103/PhysRevB.82.121407·arXiv:2308.08814AbstractTorsional Force Microscopy (TFM) is introduced as a scanning probe method sensitive to dynamic friction that can reveal moiré superlattices and atomic crystal lattices in van der Waals stacks at room temperature in air without electrical bias. The work demonstrates TFM on twisted bilayer graphene and graphene/hBN moiré systems and discusses imaging on different stamp/support configurations.Read more
Twisted bilayer graphene moiré sample imaged by TFM on a PC stamp mounted on a PDMS handle on a glass slide.1 characterization2 properties3 figuresExperimentalCStudied MaterialExpand
