Abstract

Intercalation of two-dimensional materials, particularly transition metal dichalcogenides, is a non-invasive way to modify electronic, optical and structural properties of these materials. Here we utilize Atomic Force Microscopy (AFM) based techniques to visualize local structural and electronic changes of the MoS₂/graphene/Ir(111), caused by sulfur intercalation. AFM topography reveals structural changes, while phase imaging and mechanical measurements show reduced Young’s modulus and adhesion. Kelvin Probe Force Microscopy highlights variations in surface potential and work function, aligning with intercalation signatures, while Photo-induced Force Microscopy detects enhanced optical response in intercalated regions.

Abstract

Intercalation of two-dimensional materials, particularly transition metal dichalcogenides, is a non-invasive way to modify electronic, optical and structural properties of these materials. Here we utilize Atomic Force Microscopy (AFM) based techniques to visualize local structural and electronic changes of the MoS₂/graphene/Ir(111), caused by sulfur intercalation. AFM topography reveals structural changes, while phase imaging and mechanical measurements show reduced Young’s modulus and adhesion. Kelvin Probe Force Microscopy highlights variations in surface potential and work function, aligning with intercalation signatures, while Photo-induced Force Microscopy detects enhanced optical response in intercalated regions.

Abstract

Intercalation of two-dimensional materials, particularly transition metal dichalcogenides, is a non-invasive way to modify electronic, optical and structural properties of these materials. Here we utilize Atomic Force Microscopy (AFM) based techniques to visualize local structural and electronic changes of the MoS₂/graphene/Ir(111), caused by sulfur intercalation. AFM topography reveals structural changes, while phase imaging and mechanical measurements show reduced Young’s modulus and adhesion. Kelvin Probe Force Microscopy highlights variations in surface potential and work function, aligning with intercalation signatures, while Photo-induced Force Microscopy detects enhanced optical response in intercalated regions.

Abstract

Intercalation of two-dimensional materials, particularly transition metal dichalcogenides, is a non-invasive way to modify electronic, optical and structural properties of these materials. Here we utilize Atomic Force Microscopy (AFM) based techniques to visualize local structural and electronic changes of the MoS₂/graphene/Ir(111), caused by sulfur intercalation. AFM topography reveals structural changes, while phase imaging and mechanical measurements show reduced Young’s modulus and adhesion. Kelvin Probe Force Microscopy highlights variations in surface potential and work function, aligning with intercalation signatures, while Photo-induced Force Microscopy detects enhanced optical response in intercalated regions.