Patent
US 10,189,940ethylene glycol
C₂H₆O₂
terephthalic acid
C₈H₆O₄
dimethyl terephthalate
C₁₀H₁₀O₄
diethyl terephthalate
C₁₂H₁₄O₄
cyclohexane dimethanol
C₈H₁₆O₂
poly(ethylene naphthalate)
poly(ethylene furanonate)
Probing Boron Vacancy Defects in hBN via Single Spin Relaxometry
ethylene glycol
C₂H₆O₂
terephthalic acid
C₈H₆O₄
dimethyl terephthalate
C₁₀H₁₀O₄
diethyl terephthalate
C₁₂H₁₄O₄
cyclohexane dimethanol
C₈H₁₆O₂
poly(ethylene naphthalate)
poly(ethylene furanonate)
Probing Boron Vacancy Defects in hBN via Single Spin Relaxometry
ethylene glycol
C₂H₆O₂
terephthalic acid
C₈H₆O₄
dimethyl terephthalate
C₁₀H₁₀O₄
diethyl terephthalate
C₁₂H₁₄O₄
cyclohexane dimethanol
C₈H₁₆O₂
poly(ethylene naphthalate)
poly(ethylene furanonate)
Probing Boron Vacancy Defects in hBN via Single Spin Relaxometry
ethylene glycol
C₂H₆O₂
terephthalic acid
C₈H₆O₄
dimethyl terephthalate
C₁₀H₁₀O₄
diethyl terephthalate
C₁₂H₁₄O₄
cyclohexane dimethanol
C₈H₁₆O₂
poly(ethylene naphthalate)
poly(ethylene furanonate)
Probing Boron Vacancy Defects in hBN via Single Spin Relaxometry