Patent
US 10,787,365graphene
expandable graphite
graphite salt
intumescent graphite bisulfate
solvent vehicle
Figures 4(a)-(d): SEM images of (a) single EG flake after microwave shock, (b-d) 3-D network of ME graphene. Scale bars are provided for each micrograph.
Figure 5(a)-(d): SEM images of (a) single EG flake after thermal shock, (b-d) 3-D network of TE graphene. Scale bars are provided for each micrograph.
Figure 6(a)-(f): (a) Low magnification TEM micrograph of a thin EG flake. Selected area magnification TEM micrographs of (b) folding, (c) edge, and (d) the top surface. (e) Normal incident SAD pattern acquired over the micrographs in (d). (f) Filtered image processed from the region marked in (c), …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 9 shows XRD pattern of graphite, IGBS, TE graphene, ME graphene, and commercial graphene; inset shows magnified peaks in the 24-29 degree range.
Figure 11 shows Raman spectra of graphite, IGBS, TE graphene, ME graphene, and commercial graphene.
Figure 13 (a-d): Current rate performance of (a) graphite, and (b) TE- graphene at various current densities. (c) Cyclic performance and (d) columbic efficiency of graphene at a current density of 300 pA.
| 0.06 |
graphene |
Duration | 30–120 minutes | — |
Thickness | ≤ 10 µm | — |
Thickness | ≤ 2 nm | — |
Duration | ≥ 1 min | — |
— | 750–1500 W | — |
Duration | 12–60 hours | — |
Duration | 15–45 hours | — |
Duration | 2–3 hours | — |
Duration | ≤ 80 seconds | — |
Thickness | ≥ 5 µm | — |
Thickness | ≥ 10 µm | — |
Thickness | ≥ 50 µm | — |
Thickness | ≥ 1 µm | — |
Thickness | ≥ 300 µm | — |
Thickness | ≥ 500 µm | — |
Duration | ≥ 15 seconds | — |
Duration | ≥ 20 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | ≥ 40 seconds | — |
Thickness | ≥ 25 µm | — |
graphene
expandable graphite
graphite salt
intumescent graphite bisulfate
solvent vehicle
Figures 4(a)-(d): SEM images of (a) single EG flake after microwave shock, (b-d) 3-D network of ME graphene. Scale bars are provided for each micrograph.
Figure 5(a)-(d): SEM images of (a) single EG flake after thermal shock, (b-d) 3-D network of TE graphene. Scale bars are provided for each micrograph.
Figure 6(a)-(f): (a) Low magnification TEM micrograph of a thin EG flake. Selected area magnification TEM micrographs of (b) folding, (c) edge, and (d) the top surface. (e) Normal incident SAD pattern acquired over the micrographs in (d). (f) Filtered image processed from the region marked in (c), …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 9 shows XRD pattern of graphite, IGBS, TE graphene, ME graphene, and commercial graphene; inset shows magnified peaks in the 24-29 degree range.
Figure 11 shows Raman spectra of graphite, IGBS, TE graphene, ME graphene, and commercial graphene.
Figure 13 (a-d): Current rate performance of (a) graphite, and (b) TE- graphene at various current densities. (c) Cyclic performance and (d) columbic efficiency of graphene at a current density of 300 pA.
| 0.06 |
graphene |
Duration | 30–120 minutes | — |
Thickness | ≤ 10 µm | — |
Thickness | ≤ 2 nm | — |
Duration | ≥ 1 min | — |
— | 750–1500 W | — |
Duration | 12–60 hours | — |
Duration | 15–45 hours | — |
Duration | 2–3 hours | — |
Duration | ≤ 80 seconds | — |
Thickness | ≥ 5 µm | — |
Thickness | ≥ 10 µm | — |
Thickness | ≥ 50 µm | — |
Thickness | ≥ 1 µm | — |
Thickness | ≥ 300 µm | — |
Thickness | ≥ 500 µm | — |
Duration | ≥ 15 seconds | — |
Duration | ≥ 20 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | ≥ 40 seconds | — |
Thickness | ≥ 25 µm | — |
graphene
expandable graphite
graphite salt
intumescent graphite bisulfate
solvent vehicle
Figures 4(a)-(d): SEM images of (a) single EG flake after microwave shock, (b-d) 3-D network of ME graphene. Scale bars are provided for each micrograph.
Figure 5(a)-(d): SEM images of (a) single EG flake after thermal shock, (b-d) 3-D network of TE graphene. Scale bars are provided for each micrograph.
Figure 6(a)-(f): (a) Low magnification TEM micrograph of a thin EG flake. Selected area magnification TEM micrographs of (b) folding, (c) edge, and (d) the top surface. (e) Normal incident SAD pattern acquired over the micrographs in (d). (f) Filtered image processed from the region marked in (c), …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 9 shows XRD pattern of graphite, IGBS, TE graphene, ME graphene, and commercial graphene; inset shows magnified peaks in the 24-29 degree range.
Figure 11 shows Raman spectra of graphite, IGBS, TE graphene, ME graphene, and commercial graphene.
Figure 13 (a-d): Current rate performance of (a) graphite, and (b) TE- graphene at various current densities. (c) Cyclic performance and (d) columbic efficiency of graphene at a current density of 300 pA.
| 0.06 |
graphene |
Duration | 30–120 minutes | — |
Thickness | ≤ 10 µm | — |
Thickness | ≤ 2 nm | — |
Duration | ≥ 1 min | — |
— | 750–1500 W | — |
Duration | 12–60 hours | — |
Duration | 15–45 hours | — |
Duration | 2–3 hours | — |
Duration | ≤ 80 seconds | — |
Thickness | ≥ 5 µm | — |
Thickness | ≥ 10 µm | — |
Thickness | ≥ 50 µm | — |
Thickness | ≥ 1 µm | — |
Thickness | ≥ 300 µm | — |
Thickness | ≥ 500 µm | — |
Duration | ≥ 15 seconds | — |
Duration | ≥ 20 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | ≥ 40 seconds | — |
Thickness | ≥ 25 µm | — |
graphene
expandable graphite
graphite salt
intumescent graphite bisulfate
solvent vehicle
Figures 4(a)-(d): SEM images of (a) single EG flake after microwave shock, (b-d) 3-D network of ME graphene. Scale bars are provided for each micrograph.
Figure 5(a)-(d): SEM images of (a) single EG flake after thermal shock, (b-d) 3-D network of TE graphene. Scale bars are provided for each micrograph.
Figure 6(a)-(f): (a) Low magnification TEM micrograph of a thin EG flake. Selected area magnification TEM micrographs of (b) folding, (c) edge, and (d) the top surface. (e) Normal incident SAD pattern acquired over the micrographs in (d). (f) Filtered image processed from the region marked in (c), …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 7(a)-(g): (A) Low magnification TEM micrograph of a ME graphene. (b-d) Selected area magnification TEM images showing number of layers and surface in ME graphene. Inset in (c) shows the filtered micrograph processed from the marked region, intensity profile along the marked line is shown in (f). …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 8(a)-(f): (a) Low magnification TEM micrograph of a TE graphene. (b, c) Selected area magnification TEM micrographs showing graphene edge morphology in TE graphene. (d) SAD pattern acquired near the area marked in (c). (e, f) HAADF micrograph in STEM mode, inset in (f) shows the thickness …
Figure 9 shows XRD pattern of graphite, IGBS, TE graphene, ME graphene, and commercial graphene; inset shows magnified peaks in the 24-29 degree range.
Figure 11 shows Raman spectra of graphite, IGBS, TE graphene, ME graphene, and commercial graphene.
Figure 13 (a-d): Current rate performance of (a) graphite, and (b) TE- graphene at various current densities. (c) Cyclic performance and (d) columbic efficiency of graphene at a current density of 300 pA.
| 0.06 |
graphene |
Duration | 30–120 minutes | — |
Thickness | ≤ 10 µm | — |
Thickness | ≤ 2 nm | — |
Duration | ≥ 1 min | — |
— | 750–1500 W | — |
Duration | 12–60 hours | — |
Duration | 15–45 hours | — |
Duration | 2–3 hours | — |
Duration | ≤ 80 seconds | — |
Thickness | ≥ 5 µm | — |
Thickness | ≥ 10 µm | — |
Thickness | ≥ 50 µm | — |
Thickness | ≥ 1 µm | — |
Thickness | ≥ 300 µm | — |
Thickness | ≥ 500 µm | — |
Duration | ≥ 15 seconds | — |
Duration | ≥ 20 seconds | — |
Duration | ≥ 30 seconds | — |
Duration | ≥ 40 seconds | — |
Thickness | ≥ 25 µm | — |