Research paper
Experimental CharacterizationEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
4 preparations4 characterizations15 properties1 figure
2 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InGaP layer thickness | 105nm | — | |||
| Substrate Thickness | SiN layer thickness | 200nm | — | |||
| Substrate Thickness | SiO₂ spacer thickness | 50nm | — | |||
| Waveguide Loss | InGaP propagation loss | 0.7dB/cm | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.025dB | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.02dB | — | |||
| Waveguide Loss | SiN propagation loss | 1dB/m | — | |||
| Waveguide Loss | InGaP propagation loss (NIR) | 8dB/cm | — | |||
| Waveguide Loss | InGaP propagation loss | 2dB/cm | — | |||
| Quality Factor | intrinsic quality factor | 1000000 | — | |||
| Second Harmonic Generation Efficiency | SHG efficiency | 35000% W^-1 | — | |||
| Pair Brightness | entangled-photon pair brightness | 108pairs s⁻¹ GHz⁻¹ | — | |||
| Coincidence To Accidental Ratio | CAR | 10000 | — | |||
| Entanglement Fidelity | two-photon entanglement fidelity | 99.9% | — | |||
| Quantum Efficiency | quantum efficiency | 99+1−12% | — | |||
| Bandwidth | detector bandwidth | 3GHz | — |
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Zeptojoule calorimetry
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
4 preparations4 characterizations15 properties1 figure
2 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InGaP layer thickness | 105nm | — | |||
| Substrate Thickness | SiN layer thickness | 200nm | — | |||
| Substrate Thickness | SiO₂ spacer thickness | 50nm | — | |||
| Waveguide Loss | InGaP propagation loss | 0.7dB/cm | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.025dB | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.02dB | — | |||
| Waveguide Loss | SiN propagation loss | 1dB/m | — | |||
| Waveguide Loss | InGaP propagation loss (NIR) | 8dB/cm | — | |||
| Waveguide Loss | InGaP propagation loss | 2dB/cm | — | |||
| Quality Factor | intrinsic quality factor | 1000000 | — | |||
| Second Harmonic Generation Efficiency | SHG efficiency | 35000% W^-1 | — | |||
| Pair Brightness | entangled-photon pair brightness | 108pairs s⁻¹ GHz⁻¹ | — | |||
| Coincidence To Accidental Ratio | CAR | 10000 | — | |||
| Entanglement Fidelity | two-photon entanglement fidelity | 99.9% | — | |||
| Quantum Efficiency | quantum efficiency | 99+1−12% | — | |||
| Bandwidth | detector bandwidth | 3GHz | — |
Related documents with shared materials, methods, properties, or citations.
Single-Chip Silicon Photonic Processor for Analog Optical and Microwave Signals
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Voltage-Programmable Photon Statistics Using a High-Extinction Thin-film Lithium Niobate Modulator
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Design of an integrated hybrid plasmonic-photonic device for all-optical switching and reading of spintronic memory
Zeptojoule calorimetry
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
4 preparations4 characterizations15 properties1 figure
2 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InGaP layer thickness | 105nm | — | |||
| Substrate Thickness | SiN layer thickness | 200nm | — | |||
| Substrate Thickness | SiO₂ spacer thickness | 50nm | — | |||
| Waveguide Loss | InGaP propagation loss | 0.7dB/cm | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.025dB | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.02dB | — | |||
| Waveguide Loss | SiN propagation loss | 1dB/m | — | |||
| Waveguide Loss | InGaP propagation loss (NIR) | 8dB/cm | — | |||
| Waveguide Loss | InGaP propagation loss | 2dB/cm | — | |||
| Quality Factor | intrinsic quality factor | 1000000 | — | |||
| Second Harmonic Generation Efficiency | SHG efficiency | 35000% W^-1 | — | |||
| Pair Brightness | entangled-photon pair brightness | 108pairs s⁻¹ GHz⁻¹ | — | |||
| Coincidence To Accidental Ratio | CAR | 10000 | — | |||
| Entanglement Fidelity | two-photon entanglement fidelity | 99.9% | — | |||
| Quantum Efficiency | quantum efficiency | 99+1−12% | — | |||
| Bandwidth | detector bandwidth | 3GHz | — |
Related documents with shared materials, methods, properties, or citations.
Single-Chip Silicon Photonic Processor for Analog Optical and Microwave Signals
17 GHz Lossless InP-Membrane Active Metasurface
Voltage-Programmable Photon Statistics Using a High-Extinction Thin-film Lithium Niobate Modulator
Low Excess Noise, High Quantum Efficiency Avalanche Photodiodes for Beyond 2 µm Wavelength Detection
Combined Light Excitation and Scanning Gate Microscopy on Heterostructure Nanowire Photovoltaic Devices
Tunable quantum emitters on large-scale foundry silicon photonics
Compact and fully functional high-frequency sine wave gating InGaAs/InP single-photon detector module
Characterizing Novel Indium Phosphide Pad Detectors with Focused X-ray Beams and Laboratory Tests
Time-Bin BB84 QKD System Using Indium Phosphide and Silicon Nitride Photonic Integrated Circuits
Measurements, simulations, and models of the point-spread function of electron-beam lithography
Design of an integrated hybrid plasmonic-photonic device for all-optical switching and reading of spintronic memory
Zeptojoule calorimetry
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
4 preparations4 characterizations15 properties1 figure
2 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | InGaP layer thickness | 105nm | — | |||
| Substrate Thickness | SiN layer thickness | 200nm | — | |||
| Substrate Thickness | SiO₂ spacer thickness | 50nm | — | |||
| Waveguide Loss | InGaP propagation loss | 0.7dB/cm | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.025dB | — | |||
| Interlayer Coupling Loss | III-V to SiN adiabatic transition loss | 0.02dB | — | |||
| Waveguide Loss | SiN propagation loss | 1dB/m | — | |||
| Waveguide Loss | InGaP propagation loss (NIR) | 8dB/cm | — | |||
| Waveguide Loss | InGaP propagation loss | 2dB/cm | — | |||
| Quality Factor | intrinsic quality factor | 1000000 | — | |||
| Second Harmonic Generation Efficiency | SHG efficiency | 35000% W^-1 | — | |||
| Pair Brightness | entangled-photon pair brightness | 108pairs s⁻¹ GHz⁻¹ | — | |||
| Coincidence To Accidental Ratio | CAR | 10000 | — | |||
| Entanglement Fidelity | two-photon entanglement fidelity | 99.9% | — | |||
| Quantum Efficiency | quantum efficiency | 99+1−12% | — | |||
| Bandwidth | detector bandwidth | 3GHz | — |
Related documents with shared materials, methods, properties, or citations.
Single-Chip Silicon Photonic Processor for Analog Optical and Microwave Signals
17 GHz Lossless InP-Membrane Active Metasurface
Voltage-Programmable Photon Statistics Using a High-Extinction Thin-film Lithium Niobate Modulator
Low Excess Noise, High Quantum Efficiency Avalanche Photodiodes for Beyond 2 µm Wavelength Detection
Combined Light Excitation and Scanning Gate Microscopy on Heterostructure Nanowire Photovoltaic Devices
Tunable quantum emitters on large-scale foundry silicon photonics
Compact and fully functional high-frequency sine wave gating InGaAs/InP single-photon detector module
Characterizing Novel Indium Phosphide Pad Detectors with Focused X-ray Beams and Laboratory Tests
Time-Bin BB84 QKD System Using Indium Phosphide and Silicon Nitride Photonic Integrated Circuits
Measurements, simulations, and models of the point-spread function of electron-beam lithography
Design of an integrated hybrid plasmonic-photonic device for all-optical switching and reading of spintronic memory
Zeptojoule calorimetry