Research paper
Experimental CharacterizationEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Defect Density | as-exfoliated MoS₂ defect density | 6.4e-11cm⁻² | — | |||
| XRD Peak | STS transport gap | 2.4eV | — | |||
| Energy Gap | transport gap | 2.4eV | — | |||
| Current | saturation current | 5nA | — | |||
| Charge State Lifetime | defect charge-state lifetime | 30ps | — | |||
| Current | saturation current threshold | 100nA | — | |||
| Emission Peak | pristine MoS₂ exciton/STML line | 1.959eV | — | |||
| Emission Peak | side peak | 1.955eV | — | |||
| Emission Peak | side peak | 1.923eV | — | |||
| Emission Peak | side peak | 1.901eV | — | |||
| Emission Peak | MoS₂ exciton emission | 1.95eV | — | |||
| Emission Peak Shift | defect-bound exciton redshift | 200meV | — | |||
| Energy Gap | exciton binding energy | 450meV | — | |||
| Energy Gap | band gap increase due to reduced screening | 30meV | — | |||
| Emission Intensity Ratio | STML brightness enhancement | 7 | — | |||
| Pl Peak Fwhm | PL peak | 3.4meV | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Spectrally resolved far-field emission pattern of single photon emitters in MoS2
Analytical photoresponses of Schottky contact MoS2 phototransistors
Robustness of momentum-indirect interlayer excitons in MoS2/WSe2 heterostructure against charge carrier doping
Experimental demonstration of two distinct pathways of trion generation in monolayer MoS2
Gate-Tunable Mid-Infrared Electroluminescence from Te/MoS2 p–n Heterojunctions
Dielectric and gate metal engineering for threshold voltage modulation in enhancement mode monolayer MoS2 field effect transistors
Machine Learning Assisted Reconstruction of Local Electronic Structure of Non-Uniformly Strained MoS2
Manipulating Interlayer Excitons for Ultra-pure Near-infrared Quantum Light Generation
Enhanced self phase modulation in silicon nitride waveguides with integrated 2D MoS2 films
Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Defect Density | as-exfoliated MoS₂ defect density | 6.4e-11cm⁻² | — | |||
| XRD Peak | STS transport gap | 2.4eV | — | |||
| Energy Gap | transport gap | 2.4eV | — | |||
| Current | saturation current | 5nA | — | |||
| Charge State Lifetime | defect charge-state lifetime | 30ps | — | |||
| Current | saturation current threshold | 100nA | — | |||
| Emission Peak | pristine MoS₂ exciton/STML line | 1.959eV | — | |||
| Emission Peak | side peak | 1.955eV | — | |||
| Emission Peak | side peak | 1.923eV | — | |||
| Emission Peak | side peak | 1.901eV | — | |||
| Emission Peak | MoS₂ exciton emission | 1.95eV | — | |||
| Emission Peak Shift | defect-bound exciton redshift | 200meV | — | |||
| Energy Gap | exciton binding energy | 450meV | — | |||
| Energy Gap | band gap increase due to reduced screening | 30meV | — | |||
| Emission Intensity Ratio | STML brightness enhancement | 7 | — | |||
| Pl Peak Fwhm | PL peak | 3.4meV | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Spectrally resolved far-field emission pattern of single photon emitters in MoS2
Analytical photoresponses of Schottky contact MoS2 phototransistors
Robustness of momentum-indirect interlayer excitons in MoS2/WSe2 heterostructure against charge carrier doping
Experimental demonstration of two distinct pathways of trion generation in monolayer MoS2
Gate-Tunable Mid-Infrared Electroluminescence from Te/MoS2 p–n Heterojunctions
Dielectric and gate metal engineering for threshold voltage modulation in enhancement mode monolayer MoS2 field effect transistors
Machine Learning Assisted Reconstruction of Local Electronic Structure of Non-Uniformly Strained MoS2
Manipulating Interlayer Excitons for Ultra-pure Near-infrared Quantum Light Generation
Enhanced self phase modulation in silicon nitride waveguides with integrated 2D MoS2 films
Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Defect Density | as-exfoliated MoS₂ defect density | 6.4e-11cm⁻² | — | |||
| XRD Peak | STS transport gap | 2.4eV | — | |||
| Energy Gap | transport gap | 2.4eV | — | |||
| Current | saturation current | 5nA | — | |||
| Charge State Lifetime | defect charge-state lifetime | 30ps | — | |||
| Current | saturation current threshold | 100nA | — | |||
| Emission Peak | pristine MoS₂ exciton/STML line | 1.959eV | — | |||
| Emission Peak | side peak | 1.955eV | — | |||
| Emission Peak | side peak | 1.923eV | — | |||
| Emission Peak | side peak | 1.901eV | — | |||
| Emission Peak | MoS₂ exciton emission | 1.95eV | — | |||
| Emission Peak Shift | defect-bound exciton redshift | 200meV | — | |||
| Energy Gap | exciton binding energy | 450meV | — | |||
| Energy Gap | band gap increase due to reduced screening | 30meV | — | |||
| Emission Intensity Ratio | STML brightness enhancement | 7 | — | |||
| Pl Peak Fwhm | PL peak | 3.4meV | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Spectrally resolved far-field emission pattern of single photon emitters in MoS2
Analytical photoresponses of Schottky contact MoS2 phototransistors
Robustness of momentum-indirect interlayer excitons in MoS2/WSe2 heterostructure against charge carrier doping
Experimental demonstration of two distinct pathways of trion generation in monolayer MoS2
Gate-Tunable Mid-Infrared Electroluminescence from Te/MoS2 p–n Heterojunctions
Dielectric and gate metal engineering for threshold voltage modulation in enhancement mode monolayer MoS2 field effect transistors
Machine Learning Assisted Reconstruction of Local Electronic Structure of Non-Uniformly Strained MoS2
Manipulating Interlayer Excitons for Ultra-pure Near-infrared Quantum Light Generation
Enhanced self phase modulation in silicon nitride waveguides with integrated 2D MoS2 films
Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
3 preparations7 characterizations15 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Defect Density | as-exfoliated MoS₂ defect density | 6.4e-11cm⁻² | — | |||
| XRD Peak | STS transport gap | 2.4eV | — | |||
| Energy Gap | transport gap | 2.4eV | — | |||
| Current | saturation current | 5nA | — | |||
| Charge State Lifetime | defect charge-state lifetime | 30ps | — | |||
| Current | saturation current threshold | 100nA | — | |||
| Emission Peak | pristine MoS₂ exciton/STML line | 1.959eV | — | |||
| Emission Peak | side peak | 1.955eV | — | |||
| Emission Peak | side peak | 1.923eV | — | |||
| Emission Peak | side peak | 1.901eV | — | |||
| Emission Peak | MoS₂ exciton emission | 1.95eV | — | |||
| Emission Peak Shift | defect-bound exciton redshift | 200meV | — | |||
| Energy Gap | exciton binding energy | 450meV | — | |||
| Energy Gap | band gap increase due to reduced screening | 30meV | — | |||
| Emission Intensity Ratio | STML brightness enhancement | 7 | — | |||
| Pl Peak Fwhm | PL peak | 3.4meV | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Spectrally resolved far-field emission pattern of single photon emitters in MoS2
Analytical photoresponses of Schottky contact MoS2 phototransistors
Robustness of momentum-indirect interlayer excitons in MoS2/WSe2 heterostructure against charge carrier doping
Experimental demonstration of two distinct pathways of trion generation in monolayer MoS2
Gate-Tunable Mid-Infrared Electroluminescence from Te/MoS2 p–n Heterojunctions
Dielectric and gate metal engineering for threshold voltage modulation in enhancement mode monolayer MoS2 field effect transistors
Machine Learning Assisted Reconstruction of Local Electronic Structure of Non-Uniformly Strained MoS2
Manipulating Interlayer Excitons for Ultra-pure Near-infrared Quantum Light Generation
Enhanced self phase modulation in silicon nitride waveguides with integrated 2D MoS2 films
Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error
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