Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Elysé Laurent; Sarah Miller; Sévérine Le Moal; Elizabeth Boer-Duchemin; Eric Le Moal; Ricardo Javier Peña Román; Luiz Fernando Zagonel; Aditi Raman Moghe; Stéphane Berciaud; Etienne Lorchat

doi:10.57745/W0SEAA

Paper details

Research paper

Experimental CharacterizationComputational Other

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Elysé Laurent, Sarah Miller, Sévérine Le Moal, Elizabeth Boer-Duchemin et al.

arXiv·2025·10.57745/W0SEAA·arXiv:2512.08401

Samples

Each sample groups how it was prepared, characterized, and measured. Click a card to expand.

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

1 preparation1 characterization2 properties1 figure

ExperimentalWSe₂Studied Material

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

1 preparation1 characterization2 properties1 figure

ExperimentalWS₂Studied Material

Materials

WSe₂

Studied Material

Also known as

monolayer tungsten diselenide

studied material

WS₂

Studied Material

Also known as

Why these are connected

Related documents with shared materials, methods, properties, or citations.

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution | Matter42 Literature

Properties

Type	Label	Value	Material	Sample	Source
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WS₂ microflake deposited o	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot	WSe₂	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot with hot spots microns away from excitation source	WS₂	Mechanically exfoliated monolayer WS₂ microflake deposited o	—

Properties

Type	Label	Value	Material	Sample	Source
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WS₂ microflake deposited o	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot	WSe₂	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot with hot spots microns away from excitation source	WS₂	Mechanically exfoliated monolayer WS₂ microflake deposited o	—

Properties

Type	Label	Value	Material	Sample	Source
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WS₂ microflake deposited o	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot	WSe₂	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot with hot spots microns away from excitation source	WS₂	Mechanically exfoliated monolayer WS₂ microflake deposited o	—

Properties

Type	Label	Value	Material	Sample	Source
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Substrate Thickness	ITO layer thickness	85nm	ITO	Mechanically exfoliated monolayer WS₂ microflake deposited o	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot	WSe₂	Mechanically exfoliated monolayer WSe₂ microflake deposited	—
Emitter Spot Position	STML emitter distribution	sub-diffraction-limited emission spot with hot spots microns away from excitation source	WS₂	Mechanically exfoliated monolayer WS₂ microflake deposited o	—

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Sub-diffraction-resolved spatial distribution of emitting excitons in STM-induced luminescence of 2D semiconductors via Richardson-Lucy deconvolution

Samples

Mechanically exfoliated monolayer WSe₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Mechanically exfoliated monolayer WS₂ microflake deposited onto an 85 nm ITO-coated glass coverslip by dry transfer; studied under STM-induced luminescence.

Materials

Why these are connected

Processing

Characterization

Properties

Simulations

Processing

Characterization

Properties

Simulations

Processing

Characterization

Properties

Simulations

Processing

Characterization

Properties

Simulations