Research paperExperimental CharacterizationSpectroscopic imaging ellipsometry of two-dimensional TMDC heterostructuresFlorian Sigger, Hendrik Lambers, Nisi Katharina, Julian Klein et al.arXiv·2022·10.1103/PhysRevB.90.205422·arXiv:2207.04633AbstractWe determine the dielectric function for the prototypical MoSe₂/WSe₂ heterobilayer and their individual layers using spectroscopic imaging ellipsometry. We find a redshift of the lowest interband transitions in the heterobilayer and that the higher-energy dielectric response cannot be described as a stack of independent monolayers, indicating strong interlayer hybridization. The determined dielectric functions are used to calculate Michelson contrast on Si/SiO₂ substrates and to assess the impact on optical measurements such as PL, absorbance, and Raman spectroscopy.Read more
MoSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization4 properties3 figuresExperimentalMoSe₂Studied MaterialExpand
WSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization2 properties3 figuresExperimentalWSe₂Studied MaterialExpand
MoSe₂/WSe₂ van der Waals heterobilayer assembled by viscoelastic stamping on Borofloat glass.1 preparation1 characterization3 properties3 figuresExperimentalMoSe₂/WSe₂ heterobilayerStudied MaterialMoSe₂Studied MaterialWSe₂Studied MaterialExpand
Research paperExperimental CharacterizationSpectroscopic imaging ellipsometry of two-dimensional TMDC heterostructuresFlorian Sigger, Hendrik Lambers, Nisi Katharina, Julian Klein et al.arXiv·2022·10.1103/PhysRevB.90.205422·arXiv:2207.04633AbstractWe determine the dielectric function for the prototypical MoSe₂/WSe₂ heterobilayer and their individual layers using spectroscopic imaging ellipsometry. We find a redshift of the lowest interband transitions in the heterobilayer and that the higher-energy dielectric response cannot be described as a stack of independent monolayers, indicating strong interlayer hybridization. The determined dielectric functions are used to calculate Michelson contrast on Si/SiO₂ substrates and to assess the impact on optical measurements such as PL, absorbance, and Raman spectroscopy.Read more
MoSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization4 properties3 figuresExperimentalMoSe₂Studied MaterialExpand
WSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization2 properties3 figuresExperimentalWSe₂Studied MaterialExpand
MoSe₂/WSe₂ van der Waals heterobilayer assembled by viscoelastic stamping on Borofloat glass.1 preparation1 characterization3 properties3 figuresExperimentalMoSe₂/WSe₂ heterobilayerStudied MaterialMoSe₂Studied MaterialWSe₂Studied MaterialExpand
Research paperExperimental CharacterizationSpectroscopic imaging ellipsometry of two-dimensional TMDC heterostructuresFlorian Sigger, Hendrik Lambers, Nisi Katharina, Julian Klein et al.arXiv·2022·10.1103/PhysRevB.90.205422·arXiv:2207.04633AbstractWe determine the dielectric function for the prototypical MoSe₂/WSe₂ heterobilayer and their individual layers using spectroscopic imaging ellipsometry. We find a redshift of the lowest interband transitions in the heterobilayer and that the higher-energy dielectric response cannot be described as a stack of independent monolayers, indicating strong interlayer hybridization. The determined dielectric functions are used to calculate Michelson contrast on Si/SiO₂ substrates and to assess the impact on optical measurements such as PL, absorbance, and Raman spectroscopy.Read more
MoSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization4 properties3 figuresExperimentalMoSe₂Studied MaterialExpand
WSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization2 properties3 figuresExperimentalWSe₂Studied MaterialExpand
MoSe₂/WSe₂ van der Waals heterobilayer assembled by viscoelastic stamping on Borofloat glass.1 preparation1 characterization3 properties3 figuresExperimentalMoSe₂/WSe₂ heterobilayerStudied MaterialMoSe₂Studied MaterialWSe₂Studied MaterialExpand
Research paperExperimental CharacterizationSpectroscopic imaging ellipsometry of two-dimensional TMDC heterostructuresFlorian Sigger, Hendrik Lambers, Nisi Katharina, Julian Klein et al.arXiv·2022·10.1103/PhysRevB.90.205422·arXiv:2207.04633AbstractWe determine the dielectric function for the prototypical MoSe₂/WSe₂ heterobilayer and their individual layers using spectroscopic imaging ellipsometry. We find a redshift of the lowest interband transitions in the heterobilayer and that the higher-energy dielectric response cannot be described as a stack of independent monolayers, indicating strong interlayer hybridization. The determined dielectric functions are used to calculate Michelson contrast on Si/SiO₂ substrates and to assess the impact on optical measurements such as PL, absorbance, and Raman spectroscopy.Read more
MoSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization4 properties3 figuresExperimentalMoSe₂Studied MaterialExpand
WSe₂ monolayer exfoliated from bulk crystal and placed on Borofloat glass for spectroscopic imaging ellipsometry.2 preparations1 characterization2 properties3 figuresExperimentalWSe₂Studied MaterialExpand
MoSe₂/WSe₂ van der Waals heterobilayer assembled by viscoelastic stamping on Borofloat glass.1 preparation1 characterization3 properties3 figuresExperimentalMoSe₂/WSe₂ heterobilayerStudied MaterialMoSe₂Studied MaterialWSe₂Studied MaterialExpand
