Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Alessandro Nicolaou; Kari Ruotsalainen; Laura Susana; Victor Porée; Luiz Galvao Tizei; Jaakko Koskelo; Takashi Taniguchi; Kenji Watanabe; Alberto Zobelli; Matteo Gatti

doi:10.48550/arxiv.2501.04840

Paper details

Research paper

Experimental CharacterizationComputational DFT

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Alessandro Nicolaou, Kari Ruotsalainen, Laura Susana, Victor Porée et al.

arXiv preprint·2025·arXiv:2501.04840

Samples

Each sample groups how it was prepared, characterized, and measured. Click a card to expand.

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

2 preparations2 characterizations7 properties

Experimentalh-BNStudied Material

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

1 preparation2 characterizations1 property

Experimentalh-BNStudied Material

Materials

hexagonal boron nitride

h-BN

Studied Material

Also known as

hexagonal boron nitrideh-BN

studied material

boron

Studied Material

Why these are connected

Related documents with shared materials, methods, properties, or citations.

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering | Matter42 Literature

Properties

Type	Label	Value	Material	Sample	Source
XRD Peak	B K-edge π* exciton peak	192eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	N K-edge π* exciton peak	401eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	6.4eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	8eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	11.5eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	16eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	EELS monochromated beam FWHM	30meV	h-BN	Microscopy sample prepared by chemical exfoliation of macros	—
XRD Peak	identified excitation	lowest longitudinal exciton	h-BN	High-quality colorless and transparent single crystal h-BN u	—

Properties

Type	Label	Value	Material	Sample	Source
XRD Peak	B K-edge π* exciton peak	192eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	N K-edge π* exciton peak	401eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	6.4eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	8eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	11.5eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	16eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	EELS monochromated beam FWHM	30meV	h-BN	Microscopy sample prepared by chemical exfoliation of macros	—
XRD Peak	identified excitation	lowest longitudinal exciton	h-BN	High-quality colorless and transparent single crystal h-BN u	—

Properties

Type	Label	Value	Material	Sample	Source
XRD Peak	B K-edge π* exciton peak	192eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	N K-edge π* exciton peak	401eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	6.4eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	8eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	11.5eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	16eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	EELS monochromated beam FWHM	30meV	h-BN	Microscopy sample prepared by chemical exfoliation of macros	—
XRD Peak	identified excitation	lowest longitudinal exciton	h-BN	High-quality colorless and transparent single crystal h-BN u	—

Properties

Type	Label	Value	Material	Sample	Source
XRD Peak	B K-edge π* exciton peak	192eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	N K-edge π* exciton peak	401eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	6.4eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	8eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	11.5eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	RIXS Raman loss	16eV	h-BN	High-quality colorless and transparent single crystal h-BN u	—
XRD Peak	EELS monochromated beam FWHM	30meV	h-BN	Microscopy sample prepared by chemical exfoliation of macros	—
XRD Peak	identified excitation	lowest longitudinal exciton	h-BN	High-quality colorless and transparent single crystal h-BN u	—

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

Direct measurement of the longitudinal exciton dispersion in h-BN by resonant inelastic x-ray scattering

Samples

High-quality colorless and transparent single crystal h-BN used for RIXS; cleaved in air and mounted with one crystal orientation in the scattering plane.

Microscopy sample prepared by chemical exfoliation of macroscopic h-BN crystals in ethanol and deposited onto a lacey carbon copper TEM grid for EELS.

Materials

Why these are connected

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