Research paper
Experimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | PL peak | 1.86eV | — | |||
| Fet Sheet Resistance | 2Rc,FLG upper bound | 260ohm/sq | — | |||
| Fet Sheet Resistance | device resistance | 200000ohm | — | |||
| Fet Sheet Resistance | device resistance | 2000ohm | — | |||
| Fet Threshold Voltage | pinch-off voltage | 5V | — | |||
| Fet Sheet Resistance | total resistance | 1400ohm | — | |||
| Fet Mobility | mobility | high electron mobility | — | |||
| Energy Level Spacing | quantum dot energy level separation | 5-6meV | — | |||
| G Factor | Landé g-factor | 5 | — | |||
| Spin Splitting | spin filling sequence | observed | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | PL peak | 1.86eV | — | |||
| Fet Sheet Resistance | 2Rc,FLG upper bound | 260ohm/sq | — | |||
| Fet Sheet Resistance | device resistance | 200000ohm | — | |||
| Fet Sheet Resistance | device resistance | 2000ohm | — | |||
| Fet Threshold Voltage | pinch-off voltage | 5V | — | |||
| Fet Sheet Resistance | total resistance | 1400ohm | — | |||
| Fet Mobility | mobility | high electron mobility | — | |||
| Energy Level Spacing | quantum dot energy level separation | 5-6meV | — | |||
| G Factor | Landé g-factor | 5 | — | |||
| Spin Splitting | spin filling sequence | observed | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | PL peak | 1.86eV | — | |||
| Fet Sheet Resistance | 2Rc,FLG upper bound | 260ohm/sq | — | |||
| Fet Sheet Resistance | device resistance | 200000ohm | — | |||
| Fet Sheet Resistance | device resistance | 2000ohm | — | |||
| Fet Threshold Voltage | pinch-off voltage | 5V | — | |||
| Fet Sheet Resistance | total resistance | 1400ohm | — | |||
| Fet Mobility | mobility | high electron mobility | — | |||
| Energy Level Spacing | quantum dot energy level separation | 5-6meV | — | |||
| G Factor | Landé g-factor | 5 | — | |||
| Spin Splitting | spin filling sequence | observed | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | PL peak | 1.86eV | — | |||
| Fet Sheet Resistance | 2Rc,FLG upper bound | 260ohm/sq | — | |||
| Fet Sheet Resistance | device resistance | 200000ohm | — | |||
| Fet Sheet Resistance | device resistance | 2000ohm | — | |||
| Fet Threshold Voltage | pinch-off voltage | 5V | — | |||
| Fet Sheet Resistance | total resistance | 1400ohm | — | |||
| Fet Mobility | mobility | high electron mobility | — | |||
| Energy Level Spacing | quantum dot energy level separation | 5-6meV | — | |||
| G Factor | Landé g-factor | 5 | — | |||
| Spin Splitting | spin filling sequence | observed | — |