Research paper
Experimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Spad Detection Efficiency | single photon detection efficiency | 15% | — | |||
| Dark Count Rate | dark count rate per pixel | 8kHz | — | |||
| Afterpulsing Probability | afterpulsing probability | 4% | — | |||
| Dark Count Rate | mean pixel dark count rate | 1.96kHz | — | |||
| Dark Count Rate Per Gate | mean pixel dark count rate per gate | 0.00000193Hz/gate | — | |||
| Crosstalk Probability | inter-pixel crosstalk | negligible | — | |||
| Secure Key Rate | secure key rate | 2000000bps | — | |||
| Secure Key Rate | secure key rate | 15000bps | — |
Voltage-Programmable Photon Statistics Using a High-Extinction Thin-film Lithium Niobate Modulator
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Spad Detection Efficiency | single photon detection efficiency | 15% | — | |||
| Dark Count Rate | dark count rate per pixel | 8kHz | — | |||
| Afterpulsing Probability | afterpulsing probability | 4% | — | |||
| Dark Count Rate | mean pixel dark count rate | 1.96kHz | — | |||
| Dark Count Rate Per Gate | mean pixel dark count rate per gate | 0.00000193Hz/gate | — | |||
| Crosstalk Probability | inter-pixel crosstalk | negligible | — | |||
| Secure Key Rate | secure key rate | 2000000bps | — | |||
| Secure Key Rate | secure key rate | 15000bps | — |
Voltage-Programmable Photon Statistics Using a High-Extinction Thin-film Lithium Niobate Modulator
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Spad Detection Efficiency | single photon detection efficiency | 15% | — | |||
| Dark Count Rate | dark count rate per pixel | 8kHz | — | |||
| Afterpulsing Probability | afterpulsing probability | 4% | — | |||
| Dark Count Rate | mean pixel dark count rate | 1.96kHz | — | |||
| Dark Count Rate Per Gate | mean pixel dark count rate per gate | 0.00000193Hz/gate | — | |||
| Crosstalk Probability | inter-pixel crosstalk | negligible | — | |||
| Secure Key Rate | secure key rate | 2000000bps | — | |||
| Secure Key Rate | secure key rate | 15000bps | — |
Voltage-Programmable Photon Statistics Using a High-Extinction Thin-film Lithium Niobate Modulator
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Spad Detection Efficiency | single photon detection efficiency | 15% | — | |||
| Dark Count Rate | dark count rate per pixel | 8kHz | — | |||
| Afterpulsing Probability | afterpulsing probability | 4% | — | |||
| Dark Count Rate | mean pixel dark count rate | 1.96kHz | — | |||
| Dark Count Rate Per Gate | mean pixel dark count rate per gate | 0.00000193Hz/gate | — | |||
| Crosstalk Probability | inter-pixel crosstalk | negligible | — | |||
| Secure Key Rate | secure key rate | 2000000bps | — | |||
| Secure Key Rate | secure key rate | 15000bps | — |
Voltage-Programmable Photon Statistics Using a High-Extinction Thin-film Lithium Niobate Modulator