Research paper
Experimental GrowthExperimental CharacterizationComputational Kinetic ModelTheoretical| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Overlayer Lattice Constant | surface lattice constant | 5.8angstrom | — | |||
| Stm Height | apparent height | 3angstrom | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 98% | — | |||
| Xrd Peak Pattern Lattice Constant | surface unit cell lattice constants | a=b=3.60angstrom | — | |||
| Stm Coverage | coverage | 50% | — | |||
| Stm Height | average thickness | 3angstrom | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₂+ L₂ edge | 584eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 6% | — | |||
| Phase Fraction | CrCl₃ fraction | 20-25% | — | |||
| Phase Fraction | CrCl₃ fraction | ~10% | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | coexisting Cr₂+/Cr₃+ magnetic response | double dichroism | — | |||
| Xas Peak | octahedral crystal field interaction | 1.75eV | — | |||
| Xas Peak | trigonal crystal field interaction | 0.2eV | — | |||
| Xas Peak | 10Dq | 1.5eV | — | |||
| Magnetic Moment | <Sz> | 2.98muB | — | |||
| Magnetic Moment | <Lz> | -0.04muB | — | |||
| Magnetic Moment | <Sz> | -0.275muB | — | |||
| Magnetic Moment | <Lz> | 0.004muB | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Overlayer Lattice Constant | surface lattice constant | 5.8angstrom | — | |||
| Stm Height | apparent height | 3angstrom | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 98% | — | |||
| Xrd Peak Pattern Lattice Constant | surface unit cell lattice constants | a=b=3.60angstrom | — | |||
| Stm Coverage | coverage | 50% | — | |||
| Stm Height | average thickness | 3angstrom | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₂+ L₂ edge | 584eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 6% | — | |||
| Phase Fraction | CrCl₃ fraction | 20-25% | — | |||
| Phase Fraction | CrCl₃ fraction | ~10% | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | coexisting Cr₂+/Cr₃+ magnetic response | double dichroism | — | |||
| Xas Peak | octahedral crystal field interaction | 1.75eV | — | |||
| Xas Peak | trigonal crystal field interaction | 0.2eV | — | |||
| Xas Peak | 10Dq | 1.5eV | — | |||
| Magnetic Moment | <Sz> | 2.98muB | — | |||
| Magnetic Moment | <Lz> | -0.04muB | — | |||
| Magnetic Moment | <Sz> | -0.275muB | — | |||
| Magnetic Moment | <Lz> | 0.004muB | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Overlayer Lattice Constant | surface lattice constant | 5.8angstrom | — | |||
| Stm Height | apparent height | 3angstrom | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 98% | — | |||
| Xrd Peak Pattern Lattice Constant | surface unit cell lattice constants | a=b=3.60angstrom | — | |||
| Stm Coverage | coverage | 50% | — | |||
| Stm Height | average thickness | 3angstrom | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₂+ L₂ edge | 584eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 6% | — | |||
| Phase Fraction | CrCl₃ fraction | 20-25% | — | |||
| Phase Fraction | CrCl₃ fraction | ~10% | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | coexisting Cr₂+/Cr₃+ magnetic response | double dichroism | — | |||
| Xas Peak | octahedral crystal field interaction | 1.75eV | — | |||
| Xas Peak | trigonal crystal field interaction | 0.2eV | — | |||
| Xas Peak | 10Dq | 1.5eV | — | |||
| Magnetic Moment | <Sz> | 2.98muB | — | |||
| Magnetic Moment | <Lz> | -0.04muB | — | |||
| Magnetic Moment | <Sz> | -0.275muB | — | |||
| Magnetic Moment | <Lz> | 0.004muB | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Overlayer Lattice Constant | surface lattice constant | 5.8angstrom | — | |||
| Stm Height | apparent height | 3angstrom | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 98% | — | |||
| Xrd Peak Pattern Lattice Constant | surface unit cell lattice constants | a=b=3.60angstrom | — | |||
| Stm Coverage | coverage | 50% | — | |||
| Stm Height | average thickness | 3angstrom | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₂+ L₂ edge | 584eV | — | |||
| Xmcd Intensity Ratio | XMCD intensity / average XAS intensity | 6% | — | |||
| Phase Fraction | CrCl₃ fraction | 20-25% | — | |||
| Phase Fraction | CrCl₃ fraction | ~10% | — | |||
| Xas Peak | Cr₂+ L₃ edge | 575.5eV | — | |||
| Xas Peak | Cr₃+ L₃ edge | 577eV | — | |||
| Xmcd Intensity Ratio | coexisting Cr₂+/Cr₃+ magnetic response | double dichroism | — | |||
| Xas Peak | octahedral crystal field interaction | 1.75eV | — | |||
| Xas Peak | trigonal crystal field interaction | 0.2eV | — | |||
| Xas Peak | 10Dq | 1.5eV | — | |||
| Magnetic Moment | <Sz> | 2.98muB | — | |||
| Magnetic Moment | <Lz> | -0.04muB | — | |||
| Magnetic Moment | <Sz> | -0.275muB | — | |||
| Magnetic Moment | <Lz> | 0.004muB | — |