Research paperExperimental CharacterizationNonlinear Elasticity at the Damage Threshold of Semiconductor NanocrystalsDaniel Hensel, Adriana Rodrigues, Anagha Kamath, Daniel Schmidt et al.Journal·2023·arXiv:2605.28235AbstractThe nonlinear photoacoustic response of indium phosphide nanocrystals on silicon nanotip arrays is investigated using time-resolved optical pump-probe spectroscopy and synchrotron-based X-ray diffraction. Femtosecond laser excitation triggers low-frequency and high-frequency radial breathing modes of the nanocrystals at 8 GHz and 10.3 GHz, respectively. At excitation fluences above 3 mJ/cm2, nonlinear frequency mixing occurs, including sum- and difference-frequency generation, indicative of strain-induced nonlinear elasticity. A higher-order extension of Hooke’s law models the fluence-dependent spectral response and yields a physically valid elastic energy potential. Ex-situ energy-dispersive X-ray spectroscopy reveals a correlation between nanocrystal oxidation and the emergence of nonlinear acoustic modes. Time-resolved X-ray diffraction confirms the nanocrystals as the origin of the low-frequency modes and supports the hypothesis of acoustic decoupling from the substrate.Read more
InP nanocrystals on silicon nanotip substrate, sample 1, with exposed nanotips through an amorphous SiO₂ layer.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 2.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 3.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
Research paperExperimental CharacterizationNonlinear Elasticity at the Damage Threshold of Semiconductor NanocrystalsDaniel Hensel, Adriana Rodrigues, Anagha Kamath, Daniel Schmidt et al.Journal·2023·arXiv:2605.28235AbstractThe nonlinear photoacoustic response of indium phosphide nanocrystals on silicon nanotip arrays is investigated using time-resolved optical pump-probe spectroscopy and synchrotron-based X-ray diffraction. Femtosecond laser excitation triggers low-frequency and high-frequency radial breathing modes of the nanocrystals at 8 GHz and 10.3 GHz, respectively. At excitation fluences above 3 mJ/cm2, nonlinear frequency mixing occurs, including sum- and difference-frequency generation, indicative of strain-induced nonlinear elasticity. A higher-order extension of Hooke’s law models the fluence-dependent spectral response and yields a physically valid elastic energy potential. Ex-situ energy-dispersive X-ray spectroscopy reveals a correlation between nanocrystal oxidation and the emergence of nonlinear acoustic modes. Time-resolved X-ray diffraction confirms the nanocrystals as the origin of the low-frequency modes and supports the hypothesis of acoustic decoupling from the substrate.Read more
InP nanocrystals on silicon nanotip substrate, sample 1, with exposed nanotips through an amorphous SiO₂ layer.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 2.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 3.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
Research paperExperimental CharacterizationNonlinear Elasticity at the Damage Threshold of Semiconductor NanocrystalsDaniel Hensel, Adriana Rodrigues, Anagha Kamath, Daniel Schmidt et al.Journal·2023·arXiv:2605.28235AbstractThe nonlinear photoacoustic response of indium phosphide nanocrystals on silicon nanotip arrays is investigated using time-resolved optical pump-probe spectroscopy and synchrotron-based X-ray diffraction. Femtosecond laser excitation triggers low-frequency and high-frequency radial breathing modes of the nanocrystals at 8 GHz and 10.3 GHz, respectively. At excitation fluences above 3 mJ/cm2, nonlinear frequency mixing occurs, including sum- and difference-frequency generation, indicative of strain-induced nonlinear elasticity. A higher-order extension of Hooke’s law models the fluence-dependent spectral response and yields a physically valid elastic energy potential. Ex-situ energy-dispersive X-ray spectroscopy reveals a correlation between nanocrystal oxidation and the emergence of nonlinear acoustic modes. Time-resolved X-ray diffraction confirms the nanocrystals as the origin of the low-frequency modes and supports the hypothesis of acoustic decoupling from the substrate.Read more
InP nanocrystals on silicon nanotip substrate, sample 1, with exposed nanotips through an amorphous SiO₂ layer.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 2.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 3.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
Research paperExperimental CharacterizationNonlinear Elasticity at the Damage Threshold of Semiconductor NanocrystalsDaniel Hensel, Adriana Rodrigues, Anagha Kamath, Daniel Schmidt et al.Journal·2023·arXiv:2605.28235AbstractThe nonlinear photoacoustic response of indium phosphide nanocrystals on silicon nanotip arrays is investigated using time-resolved optical pump-probe spectroscopy and synchrotron-based X-ray diffraction. Femtosecond laser excitation triggers low-frequency and high-frequency radial breathing modes of the nanocrystals at 8 GHz and 10.3 GHz, respectively. At excitation fluences above 3 mJ/cm2, nonlinear frequency mixing occurs, including sum- and difference-frequency generation, indicative of strain-induced nonlinear elasticity. A higher-order extension of Hooke’s law models the fluence-dependent spectral response and yields a physically valid elastic energy potential. Ex-situ energy-dispersive X-ray spectroscopy reveals a correlation between nanocrystal oxidation and the emergence of nonlinear acoustic modes. Time-resolved X-ray diffraction confirms the nanocrystals as the origin of the low-frequency modes and supports the hypothesis of acoustic decoupling from the substrate.Read more
InP nanocrystals on silicon nanotip substrate, sample 1, with exposed nanotips through an amorphous SiO₂ layer.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 2.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand
InP nanocrystals on silicon nanotip substrate, sample 3.4 characterizations8 properties3 figuresExperimentalInPStudied MaterialSiSubstrate / DielectricSiO₂Substrate / DielectricExpand