Patent
US 10,837,102carbon source
cyano radicals
CN
methane
CH₄
copper substrate
Cu
graphene on BN
boron nitride (BN)
BN
FIG. 2 is a simplified flowchart illustrating a method of producing graphene according to an embodiment of the present invention. The method includes placing a …
FIG. 3, the spectrum includes negative absorption peaks that indicate an increase in a component and positive peaks that indicate a decrease. It should be …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIGS. 8J, 8L, 8N, and 8P were obtained from Raman spectroscopic studies of different areas of multiple samples fabricated under the same condition for the …
FIG. 10 B. In this alternative design, built-in strain in graphene nano-bubbles 1020 is achieved by transferring LT-graphene 1030 to a nano-engineered …
FIG. 11B, the px x-vs.- V g data (V g being the gate voltage, which is directly proportional to the two-dimensional carrier density n2D in the graphene sheet …
FIG. 12, for a graphene sheet 1210 suspended above a triangular hole ~ 200 nm on a side 1212, a gate voltage V g of 80 V could produce a cyclotron radius of ~ …
FIG. 13C is a table listing electron mobility data for nine different back-gated FET devices. DETAILED DESCRIPTION OF SPECIFIC EMBODIMENTS [0037] An approach …
— | 10–40 W | — |
Temperature | 2500–8000 K | — |
Thickness | 10–100 nm | — |
Thickness | 0–200 nm | — |
Thickness | 0–1000 nm | — |
Thickness | 0–10 nm | — |
Thickness | 0–2.2 nm | — |
Thickness | 0–2 nm | — |
Thickness | 0–3 nm | — |
Thickness | 0.01 nm | — |
Pressure | ≤ 50 mTorr | — |
Thickness | ≤ 0.01 nm | — |
Temperature | ≤ 20 K | — |
Thickness | ≥ 1 nm | — |
Duration | ≤ 5 minutes | — |
Thickness | ≥ 60000 cm | — |
carbon source
cyano radicals
CN
methane
CH₄
copper substrate
Cu
graphene on BN
boron nitride (BN)
BN
FIG. 2 is a simplified flowchart illustrating a method of producing graphene according to an embodiment of the present invention. The method includes placing a …
FIG. 3, the spectrum includes negative absorption peaks that indicate an increase in a component and positive peaks that indicate a decrease. It should be …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIGS. 8J, 8L, 8N, and 8P were obtained from Raman spectroscopic studies of different areas of multiple samples fabricated under the same condition for the …
FIG. 10 B. In this alternative design, built-in strain in graphene nano-bubbles 1020 is achieved by transferring LT-graphene 1030 to a nano-engineered …
FIG. 11B, the px x-vs.- V g data (V g being the gate voltage, which is directly proportional to the two-dimensional carrier density n2D in the graphene sheet …
FIG. 12, for a graphene sheet 1210 suspended above a triangular hole ~ 200 nm on a side 1212, a gate voltage V g of 80 V could produce a cyclotron radius of ~ …
FIG. 13C is a table listing electron mobility data for nine different back-gated FET devices. DETAILED DESCRIPTION OF SPECIFIC EMBODIMENTS [0037] An approach …
— | 10–40 W | — |
Temperature | 2500–8000 K | — |
Thickness | 10–100 nm | — |
Thickness | 0–200 nm | — |
Thickness | 0–1000 nm | — |
Thickness | 0–10 nm | — |
Thickness | 0–2.2 nm | — |
Thickness | 0–2 nm | — |
Thickness | 0–3 nm | — |
Thickness | 0.01 nm | — |
Pressure | ≤ 50 mTorr | — |
Thickness | ≤ 0.01 nm | — |
Temperature | ≤ 20 K | — |
Thickness | ≥ 1 nm | — |
Duration | ≤ 5 minutes | — |
Thickness | ≥ 60000 cm | — |
carbon source
cyano radicals
CN
methane
CH₄
copper substrate
Cu
graphene on BN
boron nitride (BN)
BN
FIG. 2 is a simplified flowchart illustrating a method of producing graphene according to an embodiment of the present invention. The method includes placing a …
FIG. 3, the spectrum includes negative absorption peaks that indicate an increase in a component and positive peaks that indicate a decrease. It should be …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIGS. 8J, 8L, 8N, and 8P were obtained from Raman spectroscopic studies of different areas of multiple samples fabricated under the same condition for the …
FIG. 10 B. In this alternative design, built-in strain in graphene nano-bubbles 1020 is achieved by transferring LT-graphene 1030 to a nano-engineered …
FIG. 11B, the px x-vs.- V g data (V g being the gate voltage, which is directly proportional to the two-dimensional carrier density n2D in the graphene sheet …
FIG. 12, for a graphene sheet 1210 suspended above a triangular hole ~ 200 nm on a side 1212, a gate voltage V g of 80 V could produce a cyclotron radius of ~ …
FIG. 13C is a table listing electron mobility data for nine different back-gated FET devices. DETAILED DESCRIPTION OF SPECIFIC EMBODIMENTS [0037] An approach …
— | 10–40 W | — |
Temperature | 2500–8000 K | — |
Thickness | 10–100 nm | — |
Thickness | 0–200 nm | — |
Thickness | 0–1000 nm | — |
Thickness | 0–10 nm | — |
Thickness | 0–2.2 nm | — |
Thickness | 0–2 nm | — |
Thickness | 0–3 nm | — |
Thickness | 0.01 nm | — |
Pressure | ≤ 50 mTorr | — |
Thickness | ≤ 0.01 nm | — |
Temperature | ≤ 20 K | — |
Thickness | ≥ 1 nm | — |
Duration | ≤ 5 minutes | — |
Thickness | ≥ 60000 cm | — |
carbon source
cyano radicals
CN
methane
CH₄
copper substrate
Cu
graphene on BN
boron nitride (BN)
BN
FIG. 2 is a simplified flowchart illustrating a method of producing graphene according to an embodiment of the present invention. The method includes placing a …
FIG. 3, the spectrum includes negative absorption peaks that indicate an increase in a component and positive peaks that indicate a decrease. It should be …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIG. 4D. Moreover, unlike the fragile monolayer films produced by thermal CVD at 1000 ° C, each ~ 1 cm 2 LT-grown graphene sheet remained fully intact upon …
FIGS. 8J, 8L, 8N, and 8P were obtained from Raman spectroscopic studies of different areas of multiple samples fabricated under the same condition for the …
FIG. 10 B. In this alternative design, built-in strain in graphene nano-bubbles 1020 is achieved by transferring LT-graphene 1030 to a nano-engineered …
FIG. 11B, the px x-vs.- V g data (V g being the gate voltage, which is directly proportional to the two-dimensional carrier density n2D in the graphene sheet …
FIG. 12, for a graphene sheet 1210 suspended above a triangular hole ~ 200 nm on a side 1212, a gate voltage V g of 80 V could produce a cyclotron radius of ~ …
FIG. 13C is a table listing electron mobility data for nine different back-gated FET devices. DETAILED DESCRIPTION OF SPECIFIC EMBODIMENTS [0037] An approach …
— | 10–40 W | — |
Temperature | 2500–8000 K | — |
Thickness | 10–100 nm | — |
Thickness | 0–200 nm | — |
Thickness | 0–1000 nm | — |
Thickness | 0–10 nm | — |
Thickness | 0–2.2 nm | — |
Thickness | 0–2 nm | — |
Thickness | 0–3 nm | — |
Thickness | 0.01 nm | — |
Pressure | ≤ 50 mTorr | — |
Thickness | ≤ 0.01 nm | — |
Temperature | ≤ 20 K | — |
Thickness | ≥ 1 nm | — |
Duration | ≤ 5 minutes | — |
Thickness | ≥ 60000 cm | — |