Patent
US 9,852,9271,2-dichloroethane (DCE)
1,2-dichlorobenzene (DCB)
WS₂
MoSe₂
WSe₂
MoTe₂
WTe₂
N-Phenyl-bis(trifluoromethanesulfonimide) (Ph-TFSI)
| 1 % |
MoS₂ |
PL peak intensity enhancement factor after TFSI treatment (190x, no spectral shape change) | — | MoS₂ |
Luminescence lifetime of TFSI-treated MoS2 at lowest measurable pump fluence | 10.8 ns | MoS₂ |
Luminescence lifetime of as-exfoliated MoS2 | 0.3 ns | MoS₂ |
Urbach energy of as-exfoliated MoS2 monolayer | 17.4 meV | MoS₂ |
Urbach energy of TFSI-treated MoS2 monolayer | 13.3 meV | MoS₂ |
QY of TFSI-treated MoS2 after 1 week in ambient (remained above 80%) | ≥ 80 % | MoS₂ |
Threshold voltage shift toward zero after TFSI treatment of back-gated MoS2 FET | — | MoS₂ |
Temperature | 0–22 °C | — |
— | 0.0001 eV | — |
— | ≤ 1 W | — |
— | ≤ 0.0001 eV | — |
Thickness | ≥ 1 cm | — |
— | ≥ 10 W | — |
1,2-dichloroethane (DCE)
1,2-dichlorobenzene (DCB)
WS₂
MoSe₂
WSe₂
MoTe₂
WTe₂
N-Phenyl-bis(trifluoromethanesulfonimide) (Ph-TFSI)
| 1 % |
MoS₂ |
PL peak intensity enhancement factor after TFSI treatment (190x, no spectral shape change) | — | MoS₂ |
Luminescence lifetime of TFSI-treated MoS2 at lowest measurable pump fluence | 10.8 ns | MoS₂ |
Luminescence lifetime of as-exfoliated MoS2 | 0.3 ns | MoS₂ |
Urbach energy of as-exfoliated MoS2 monolayer | 17.4 meV | MoS₂ |
Urbach energy of TFSI-treated MoS2 monolayer | 13.3 meV | MoS₂ |
QY of TFSI-treated MoS2 after 1 week in ambient (remained above 80%) | ≥ 80 % | MoS₂ |
Threshold voltage shift toward zero after TFSI treatment of back-gated MoS2 FET | — | MoS₂ |
Temperature | 0–22 °C | — |
— | 0.0001 eV | — |
— | ≤ 1 W | — |
— | ≤ 0.0001 eV | — |
Thickness | ≥ 1 cm | — |
— | ≥ 10 W | — |
1,2-dichloroethane (DCE)
1,2-dichlorobenzene (DCB)
WS₂
MoSe₂
WSe₂
MoTe₂
WTe₂
N-Phenyl-bis(trifluoromethanesulfonimide) (Ph-TFSI)
| 1 % |
MoS₂ |
PL peak intensity enhancement factor after TFSI treatment (190x, no spectral shape change) | — | MoS₂ |
Luminescence lifetime of TFSI-treated MoS2 at lowest measurable pump fluence | 10.8 ns | MoS₂ |
Luminescence lifetime of as-exfoliated MoS2 | 0.3 ns | MoS₂ |
Urbach energy of as-exfoliated MoS2 monolayer | 17.4 meV | MoS₂ |
Urbach energy of TFSI-treated MoS2 monolayer | 13.3 meV | MoS₂ |
QY of TFSI-treated MoS2 after 1 week in ambient (remained above 80%) | ≥ 80 % | MoS₂ |
Threshold voltage shift toward zero after TFSI treatment of back-gated MoS2 FET | — | MoS₂ |
Temperature | 0–22 °C | — |
— | 0.0001 eV | — |
— | ≤ 1 W | — |
— | ≤ 0.0001 eV | — |
Thickness | ≥ 1 cm | — |
— | ≥ 10 W | — |
1,2-dichloroethane (DCE)
1,2-dichlorobenzene (DCB)
WS₂
MoSe₂
WSe₂
MoTe₂
WTe₂
N-Phenyl-bis(trifluoromethanesulfonimide) (Ph-TFSI)
| 1 % |
MoS₂ |
PL peak intensity enhancement factor after TFSI treatment (190x, no spectral shape change) | — | MoS₂ |
Luminescence lifetime of TFSI-treated MoS2 at lowest measurable pump fluence | 10.8 ns | MoS₂ |
Luminescence lifetime of as-exfoliated MoS2 | 0.3 ns | MoS₂ |
Urbach energy of as-exfoliated MoS2 monolayer | 17.4 meV | MoS₂ |
Urbach energy of TFSI-treated MoS2 monolayer | 13.3 meV | MoS₂ |
QY of TFSI-treated MoS2 after 1 week in ambient (remained above 80%) | ≥ 80 % | MoS₂ |
Threshold voltage shift toward zero after TFSI treatment of back-gated MoS2 FET | — | MoS₂ |
Temperature | 0–22 °C | — |
— | 0.0001 eV | — |
— | ≤ 1 W | — |
— | ≤ 0.0001 eV | — |
Thickness | ≥ 1 cm | — |
— | ≥ 10 W | — |