Patent
US 8,962,365GaN crystal
GaN
zirconia
ZrO₂
silica
SiO₂
ZrO₂-SiO₂ composite oxide
yttria stabilized zirconia
Al₂O₃-SiO₂ composite oxide
GaN-based film
GaN-based buffer layer
GaN-based single crystal layer
support substrate dissoluble in hydrofluoric acid |
CTE of support substrate main surface relative to GaN crystal (further preferred range) | — | support substrate dissoluble in hydrofluoric acid |
area of main surface of single crystal film | — | single crystal film |
content of yttria stabilized zirconia to total of Al2O3-SiO2 composite oxide and yttria stabilized zirconia | — | yttria stabilized zirconia |
content of yttria to yttria stabilized zirconia | — | yttria stabilized zirconia |
GaN crystal
GaN
zirconia
ZrO₂
silica
SiO₂
ZrO₂-SiO₂ composite oxide
yttria stabilized zirconia
Al₂O₃-SiO₂ composite oxide
GaN-based film
GaN-based buffer layer
GaN-based single crystal layer
support substrate dissoluble in hydrofluoric acid |
CTE of support substrate main surface relative to GaN crystal (further preferred range) | — | support substrate dissoluble in hydrofluoric acid |
area of main surface of single crystal film | — | single crystal film |
content of yttria stabilized zirconia to total of Al2O3-SiO2 composite oxide and yttria stabilized zirconia | — | yttria stabilized zirconia |
content of yttria to yttria stabilized zirconia | — | yttria stabilized zirconia |
GaN crystal
GaN
zirconia
ZrO₂
silica
SiO₂
ZrO₂-SiO₂ composite oxide
yttria stabilized zirconia
Al₂O₃-SiO₂ composite oxide
GaN-based film
GaN-based buffer layer
GaN-based single crystal layer
support substrate dissoluble in hydrofluoric acid |
CTE of support substrate main surface relative to GaN crystal (further preferred range) | — | support substrate dissoluble in hydrofluoric acid |
area of main surface of single crystal film | — | single crystal film |
content of yttria stabilized zirconia to total of Al2O3-SiO2 composite oxide and yttria stabilized zirconia | — | yttria stabilized zirconia |
content of yttria to yttria stabilized zirconia | — | yttria stabilized zirconia |
GaN crystal
GaN
zirconia
ZrO₂
silica
SiO₂
ZrO₂-SiO₂ composite oxide
yttria stabilized zirconia
Al₂O₃-SiO₂ composite oxide
GaN-based film
GaN-based buffer layer
GaN-based single crystal layer
support substrate dissoluble in hydrofluoric acid |
CTE of support substrate main surface relative to GaN crystal (further preferred range) | — | support substrate dissoluble in hydrofluoric acid |
area of main surface of single crystal film | — | single crystal film |
content of yttria stabilized zirconia to total of Al2O3-SiO2 composite oxide and yttria stabilized zirconia | — | yttria stabilized zirconia |
content of yttria to yttria stabilized zirconia | — | yttria stabilized zirconia |