Research paperExperimental GrowthExperimental CharacterizationComputed RamanDevelopment and Performance Study of Vertical GaN α-Particle Detector with High Energy ResolutionMinjie Ye, Yuzi Yang, Jiangtao Wei, Weilong Qin et al.arXiv preprint·2026·arXiv:2604.23923AbstractThis work reports a vertical homoepitaxial GaN α-particle detector with a 20-µm epitaxial layer, an ultrathin 20-nm dead layer, and a guard-ring structure. The device shows low reverse leakage current, high charge-collection efficiency, and an intrinsic energy resolution of 2.69% at -260 V. Capacitance-derived depletion analysis and Geant4-based simulations are used to explain the low-energy tail in the α-particle spectrum, which is attributed to depletion-width nonuniformity.Read more
Vertical homoepitaxial GaN α-particle detector device with n−-GaN epitaxial layer, n+-GaN substrate, Schottky contact, ohmic contact, and guard ring.2 preparations3 characterizations11 properties3 figuresExperimentalGaNStudied MaterialExpand
Research paperExperimental GrowthExperimental CharacterizationComputed RamanDevelopment and Performance Study of Vertical GaN α-Particle Detector with High Energy ResolutionMinjie Ye, Yuzi Yang, Jiangtao Wei, Weilong Qin et al.arXiv preprint·2026·arXiv:2604.23923AbstractThis work reports a vertical homoepitaxial GaN α-particle detector with a 20-µm epitaxial layer, an ultrathin 20-nm dead layer, and a guard-ring structure. The device shows low reverse leakage current, high charge-collection efficiency, and an intrinsic energy resolution of 2.69% at -260 V. Capacitance-derived depletion analysis and Geant4-based simulations are used to explain the low-energy tail in the α-particle spectrum, which is attributed to depletion-width nonuniformity.Read more
Vertical homoepitaxial GaN α-particle detector device with n−-GaN epitaxial layer, n+-GaN substrate, Schottky contact, ohmic contact, and guard ring.2 preparations3 characterizations11 properties3 figuresExperimentalGaNStudied MaterialExpand
Research paperExperimental GrowthExperimental CharacterizationComputed RamanDevelopment and Performance Study of Vertical GaN α-Particle Detector with High Energy ResolutionMinjie Ye, Yuzi Yang, Jiangtao Wei, Weilong Qin et al.arXiv preprint·2026·arXiv:2604.23923AbstractThis work reports a vertical homoepitaxial GaN α-particle detector with a 20-µm epitaxial layer, an ultrathin 20-nm dead layer, and a guard-ring structure. The device shows low reverse leakage current, high charge-collection efficiency, and an intrinsic energy resolution of 2.69% at -260 V. Capacitance-derived depletion analysis and Geant4-based simulations are used to explain the low-energy tail in the α-particle spectrum, which is attributed to depletion-width nonuniformity.Read more
Vertical homoepitaxial GaN α-particle detector device with n−-GaN epitaxial layer, n+-GaN substrate, Schottky contact, ohmic contact, and guard ring.2 preparations3 characterizations11 properties3 figuresExperimentalGaNStudied MaterialExpand
Research paperExperimental GrowthExperimental CharacterizationComputed RamanDevelopment and Performance Study of Vertical GaN α-Particle Detector with High Energy ResolutionMinjie Ye, Yuzi Yang, Jiangtao Wei, Weilong Qin et al.arXiv preprint·2026·arXiv:2604.23923AbstractThis work reports a vertical homoepitaxial GaN α-particle detector with a 20-µm epitaxial layer, an ultrathin 20-nm dead layer, and a guard-ring structure. The device shows low reverse leakage current, high charge-collection efficiency, and an intrinsic energy resolution of 2.69% at -260 V. Capacitance-derived depletion analysis and Geant4-based simulations are used to explain the low-energy tail in the α-particle spectrum, which is attributed to depletion-width nonuniformity.Read more
Vertical homoepitaxial GaN α-particle detector device with n−-GaN epitaxial layer, n+-GaN substrate, Schottky contact, ohmic contact, and guard ring.2 preparations3 characterizations11 properties3 figuresExperimentalGaNStudied MaterialExpand