Research paper
Experimental GrowthExperimental CharacterizationComputational MDEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
2 preparations2 characterizations4 properties3 figures
1 preparation2 characterizations3 properties4 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | nominal Hf film thickness | 0.86nm | — | |||
| Island Lateral Size | average island lateral size | 190nm | — | |||
| Area Coverage | island area coverage | 38% | — | |||
| Island Height | average island height | 2.3nm | — | |||
| Oxide Thickness | oxide island height | 3-6nm | — | |||
| Electron Diffraction D Spacing | h-HfOx diffuse ring spacing | 0.31nm | — | |||
| Electron Diffraction D Spacing | m-HfO₂ reflection spacing | 0.37nm | — |
Related documents with shared materials, methods, properties, or citations.
Corrugation-dominated mechanical softening of defect-engineered graphene
GRAPHENE BASE AND METHOD OF PREPARING THE SAME
METHOD OF FORMING GRAPHENE/METAL-OXIDE HYBRID REINFORCED COMPOSITES AND PRODUCT THEREOF
Vertical Nb Josephson junctions fabricated by direct metal deposition on both surfaces of freestanding graphene layers
METHOD FOR PREPARING MULTI-LAYER HEXAGONAL BORON NITRIDE FILM
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
2 preparations2 characterizations4 properties3 figures
1 preparation2 characterizations3 properties4 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | nominal Hf film thickness | 0.86nm | — | |||
| Island Lateral Size | average island lateral size | 190nm | — | |||
| Area Coverage | island area coverage | 38% | — | |||
| Island Height | average island height | 2.3nm | — | |||
| Oxide Thickness | oxide island height | 3-6nm | — | |||
| Electron Diffraction D Spacing | h-HfOx diffuse ring spacing | 0.31nm | — | |||
| Electron Diffraction D Spacing | m-HfO₂ reflection spacing | 0.37nm | — |
Related documents with shared materials, methods, properties, or citations.
Corrugation-dominated mechanical softening of defect-engineered graphene
GRAPHENE BASE AND METHOD OF PREPARING THE SAME
METHOD OF FORMING GRAPHENE/METAL-OXIDE HYBRID REINFORCED COMPOSITES AND PRODUCT THEREOF
Vertical Nb Josephson junctions fabricated by direct metal deposition on both surfaces of freestanding graphene layers
METHOD FOR PREPARING MULTI-LAYER HEXAGONAL BORON NITRIDE FILM
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
2 preparations2 characterizations4 properties3 figures
1 preparation2 characterizations3 properties4 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | nominal Hf film thickness | 0.86nm | — | |||
| Island Lateral Size | average island lateral size | 190nm | — | |||
| Area Coverage | island area coverage | 38% | — | |||
| Island Height | average island height | 2.3nm | — | |||
| Oxide Thickness | oxide island height | 3-6nm | — | |||
| Electron Diffraction D Spacing | h-HfOx diffuse ring spacing | 0.31nm | — | |||
| Electron Diffraction D Spacing | m-HfO₂ reflection spacing | 0.37nm | — |
Related documents with shared materials, methods, properties, or citations.
Corrugation-dominated mechanical softening of defect-engineered graphene
GRAPHENE BASE AND METHOD OF PREPARING THE SAME
METHOD OF FORMING GRAPHENE/METAL-OXIDE HYBRID REINFORCED COMPOSITES AND PRODUCT THEREOF
Vertical Nb Josephson junctions fabricated by direct metal deposition on both surfaces of freestanding graphene layers
METHOD FOR PREPARING MULTI-LAYER HEXAGONAL BORON NITRIDE FILM
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
2 preparations2 characterizations4 properties3 figures
1 preparation2 characterizations3 properties4 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | nominal Hf film thickness | 0.86nm | — | |||
| Island Lateral Size | average island lateral size | 190nm | — | |||
| Area Coverage | island area coverage | 38% | — | |||
| Island Height | average island height | 2.3nm | — | |||
| Oxide Thickness | oxide island height | 3-6nm | — | |||
| Electron Diffraction D Spacing | h-HfOx diffuse ring spacing | 0.31nm | — | |||
| Electron Diffraction D Spacing | m-HfO₂ reflection spacing | 0.37nm | — |
Related documents with shared materials, methods, properties, or citations.
Corrugation-dominated mechanical softening of defect-engineered graphene
GRAPHENE BASE AND METHOD OF PREPARING THE SAME
METHOD OF FORMING GRAPHENE/METAL-OXIDE HYBRID REINFORCED COMPOSITES AND PRODUCT THEREOF
Vertical Nb Josephson junctions fabricated by direct metal deposition on both surfaces of freestanding graphene layers
METHOD FOR PREPARING MULTI-LAYER HEXAGONAL BORON NITRIDE FILM