Research paper
Experimental GrowthExperimental CharacterizationTheoreticalEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations5 characterizations9 properties3 figures
2 preparations2 characterizations2 properties3 figures
2 preparations2 characterizations2 properties6 figures
2 preparations2 characterizations2 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Step Height | average step height | 3.9angstrom | — | |||
| Surface Roughness Rms | RMS roughness | 0.11nm | — | |||
| Surface Roughness Rms | RMS roughness | 0.27nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.05nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.25nm | — | |||
| Xrd Lattice Constant A | in-plane lattice constant | 4.59angstrom | — | |||
| Xrd Domain Size | single-crystal domain size | 10um | — | |||
| Sample Thickness | minimum terrace thickness | 5nm | — | |||
| Sample Thickness | maximum molded thickness | 30nm | — | |||
| Sample Thickness | device thickness | 8nm | — | |||
| Sample Thickness | device thickness | 13nm | — | |||
| Sample Thickness | typical thickness lower bound | 10nm | — | |||
| Sample Thickness | typical thickness upper bound | 20nm | — | |||
| Magnetoresistance Enhancement | magnetoresistance relative to MBE films | 100x | — | |||
| Raman Peak | regex-detected Raman peak | 185.9cm⁻¹ | — | — | — | |
| Xrd Lattice Constant C | lattice constant c | 11.75Å | — | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Unconventional Spin-orbit Torques by Two-dimensional Multilayered MXenes for Future Nonvolatile Magnetic Memories
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Direct Nanoscale Pyroelectric Characterization of a CuInP2S6 van der Waals Nanogenerator
Growth of few-layer molecular crystals of PTCDI on hexagonal boron nitride by microspacing air-gap sublimation
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Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations5 characterizations9 properties3 figures
2 preparations2 characterizations2 properties3 figures
2 preparations2 characterizations2 properties6 figures
2 preparations2 characterizations2 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Step Height | average step height | 3.9angstrom | — | |||
| Surface Roughness Rms | RMS roughness | 0.11nm | — | |||
| Surface Roughness Rms | RMS roughness | 0.27nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.05nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.25nm | — | |||
| Xrd Lattice Constant A | in-plane lattice constant | 4.59angstrom | — | |||
| Xrd Domain Size | single-crystal domain size | 10um | — | |||
| Sample Thickness | minimum terrace thickness | 5nm | — | |||
| Sample Thickness | maximum molded thickness | 30nm | — | |||
| Sample Thickness | device thickness | 8nm | — | |||
| Sample Thickness | device thickness | 13nm | — | |||
| Sample Thickness | typical thickness lower bound | 10nm | — | |||
| Sample Thickness | typical thickness upper bound | 20nm | — | |||
| Magnetoresistance Enhancement | magnetoresistance relative to MBE films | 100x | — | |||
| Raman Peak | regex-detected Raman peak | 185.9cm⁻¹ | — | — | — | |
| Xrd Lattice Constant C | lattice constant c | 11.75Å | — | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Unconventional Spin-orbit Torques by Two-dimensional Multilayered MXenes for Future Nonvolatile Magnetic Memories
Synthesis and guided assembly of niobium trisulfide nanowires and nanowire chains by chemical vapor deposition
Synthesis and Structural Analysis of Multilayered Graphene via Microwave Atmospheric Pressure Plasma
Laser-Induced Gas-Phase Transfer and Direct Stamping of Nanomaterials: Comparison of Nanosecond and Femtosecond Pulses
Gate-tunable Exchange Bias and Voltage-controlled Magnetization Switching in a van der Waals Ferromagnet
METHOD FOR TRANSFERRING GRAPHENE USING A HOT PRESS
Free Standing Epitaxial Oxides Through Remote Epitaxy: The Role of the Evolving Graphene Microstructure
INDIUM SURFACTANT ASSISTED HVPE OF HIGH QUALITY GALLIUM NITRIDE AND GALLIUM NITRIDE ALLOY FILMS
Direct Nanoscale Pyroelectric Characterization of a CuInP2S6 van der Waals Nanogenerator
Growth of few-layer molecular crystals of PTCDI on hexagonal boron nitride by microspacing air-gap sublimation
Unveiling the Adsorption and Electronic Interactions of Drugs on 2D Graphsene: Insights from DFT and Machine Learning Approach
Exploring methods for creation of Boron-vacancies in hexagonal Boron Nitride exfoliated from bulk crystal
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations5 characterizations9 properties3 figures
2 preparations2 characterizations2 properties3 figures
2 preparations2 characterizations2 properties6 figures
2 preparations2 characterizations2 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Step Height | average step height | 3.9angstrom | — | |||
| Surface Roughness Rms | RMS roughness | 0.11nm | — | |||
| Surface Roughness Rms | RMS roughness | 0.27nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.05nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.25nm | — | |||
| Xrd Lattice Constant A | in-plane lattice constant | 4.59angstrom | — | |||
| Xrd Domain Size | single-crystal domain size | 10um | — | |||
| Sample Thickness | minimum terrace thickness | 5nm | — | |||
| Sample Thickness | maximum molded thickness | 30nm | — | |||
| Sample Thickness | device thickness | 8nm | — | |||
| Sample Thickness | device thickness | 13nm | — | |||
| Sample Thickness | typical thickness lower bound | 10nm | — | |||
| Sample Thickness | typical thickness upper bound | 20nm | — | |||
| Magnetoresistance Enhancement | magnetoresistance relative to MBE films | 100x | — | |||
| Raman Peak | regex-detected Raman peak | 185.9cm⁻¹ | — | — | — | |
| Xrd Lattice Constant C | lattice constant c | 11.75Å | — | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Unconventional Spin-orbit Torques by Two-dimensional Multilayered MXenes for Future Nonvolatile Magnetic Memories
Synthesis and guided assembly of niobium trisulfide nanowires and nanowire chains by chemical vapor deposition
Synthesis and Structural Analysis of Multilayered Graphene via Microwave Atmospheric Pressure Plasma
Laser-Induced Gas-Phase Transfer and Direct Stamping of Nanomaterials: Comparison of Nanosecond and Femtosecond Pulses
Gate-tunable Exchange Bias and Voltage-controlled Magnetization Switching in a van der Waals Ferromagnet
METHOD FOR TRANSFERRING GRAPHENE USING A HOT PRESS
Free Standing Epitaxial Oxides Through Remote Epitaxy: The Role of the Evolving Graphene Microstructure
INDIUM SURFACTANT ASSISTED HVPE OF HIGH QUALITY GALLIUM NITRIDE AND GALLIUM NITRIDE ALLOY FILMS
Direct Nanoscale Pyroelectric Characterization of a CuInP2S6 van der Waals Nanogenerator
Growth of few-layer molecular crystals of PTCDI on hexagonal boron nitride by microspacing air-gap sublimation
Unveiling the Adsorption and Electronic Interactions of Drugs on 2D Graphsene: Insights from DFT and Machine Learning Approach
Exploring methods for creation of Boron-vacancies in hexagonal Boron Nitride exfoliated from bulk crystal
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
3 preparations5 characterizations9 properties3 figures
2 preparations2 characterizations2 properties3 figures
2 preparations2 characterizations2 properties6 figures
2 preparations2 characterizations2 properties6 figures
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Step Height | average step height | 3.9angstrom | — | |||
| Surface Roughness Rms | RMS roughness | 0.11nm | — | |||
| Surface Roughness Rms | RMS roughness | 0.27nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.05nm | — | |||
| Surface Roughness Rms | substrate roughness | 0.25nm | — | |||
| Xrd Lattice Constant A | in-plane lattice constant | 4.59angstrom | — | |||
| Xrd Domain Size | single-crystal domain size | 10um | — | |||
| Sample Thickness | minimum terrace thickness | 5nm | — | |||
| Sample Thickness | maximum molded thickness | 30nm | — | |||
| Sample Thickness | device thickness | 8nm | — | |||
| Sample Thickness | device thickness | 13nm | — | |||
| Sample Thickness | typical thickness lower bound | 10nm | — | |||
| Sample Thickness | typical thickness upper bound | 20nm | — | |||
| Magnetoresistance Enhancement | magnetoresistance relative to MBE films | 100x | — | |||
| Raman Peak | regex-detected Raman peak | 185.9cm⁻¹ | — | — | — | |
| Xrd Lattice Constant C | lattice constant c | 11.75Å | — | — | — | — |
Related documents with shared materials, methods, properties, or citations.
Unconventional Spin-orbit Torques by Two-dimensional Multilayered MXenes for Future Nonvolatile Magnetic Memories
Synthesis and guided assembly of niobium trisulfide nanowires and nanowire chains by chemical vapor deposition
Synthesis and Structural Analysis of Multilayered Graphene via Microwave Atmospheric Pressure Plasma
Laser-Induced Gas-Phase Transfer and Direct Stamping of Nanomaterials: Comparison of Nanosecond and Femtosecond Pulses
Gate-tunable Exchange Bias and Voltage-controlled Magnetization Switching in a van der Waals Ferromagnet
METHOD FOR TRANSFERRING GRAPHENE USING A HOT PRESS
Free Standing Epitaxial Oxides Through Remote Epitaxy: The Role of the Evolving Graphene Microstructure
INDIUM SURFACTANT ASSISTED HVPE OF HIGH QUALITY GALLIUM NITRIDE AND GALLIUM NITRIDE ALLOY FILMS
Direct Nanoscale Pyroelectric Characterization of a CuInP2S6 van der Waals Nanogenerator
Growth of few-layer molecular crystals of PTCDI on hexagonal boron nitride by microspacing air-gap sublimation
Unveiling the Adsorption and Electronic Interactions of Drugs on 2D Graphsene: Insights from DFT and Machine Learning Approach
Exploring methods for creation of Boron-vacancies in hexagonal Boron Nitride exfoliated from bulk crystal