Research paperExperimental CharacterizationRb₂Ti₂O5: a layered ionic conductor at the sub-micrometer scaleValerio Digiorgio, Karen Sobnath, Maria Luisa Della Rocca, Clément Barraud et al.Applied Physics Letters·2024·10.1063/5.0225828·arXiv:2407.15490AbstractThe paper investigates the structural and electrical properties of layered Rb₂Ti₂O₅ (RTO) at the sub-micrometer scale. Mechanically exfoliated RTO nanocrystals are characterized by AFM and micro-Raman spectroscopy, and a lateral two-terminal device is fabricated on an exfoliated flake to probe electrical response. The work shows that exfoliation preserves the layered structure, Raman signatures vary primarily with sample hydration rather than thickness in the studied range, and the low-dimensional device retains the memristive-like electrical behavior known for bulk crystals.Read more
Bulk Rb₂Ti₂O₅ single crystal grown from TiO₂ and RbNO3, used as the source for exfoliation and as Raman reference.2 characterizations7 properties3 figuresExperimentalRb₂Ti₂O₅Studied MaterialExpand
Mechanically exfoliated Rb₂Ti₂O₅ nanocrystal on Si/SiO₂ substrate, measured by AFM and micro-Raman spectroscopy.1 preparation2 characterizations9 properties2 figuresExperimentalRb₂Ti₂O₅Studied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Lateral two-terminal device based on an exfoliated Rb₂Ti₂O₅ nanocrystal contacted by Ti/Au electrodes on Si/SiO2.3 preparations1 characterization2 properties1 figureExperimentalRb₂Ti₂O₅Studied MaterialTiCapping Or ContactAuCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationRb₂Ti₂O5: a layered ionic conductor at the sub-micrometer scaleValerio Digiorgio, Karen Sobnath, Maria Luisa Della Rocca, Clément Barraud et al.Applied Physics Letters·2024·10.1063/5.0225828·arXiv:2407.15490AbstractThe paper investigates the structural and electrical properties of layered Rb₂Ti₂O₅ (RTO) at the sub-micrometer scale. Mechanically exfoliated RTO nanocrystals are characterized by AFM and micro-Raman spectroscopy, and a lateral two-terminal device is fabricated on an exfoliated flake to probe electrical response. The work shows that exfoliation preserves the layered structure, Raman signatures vary primarily with sample hydration rather than thickness in the studied range, and the low-dimensional device retains the memristive-like electrical behavior known for bulk crystals.Read more
Bulk Rb₂Ti₂O₅ single crystal grown from TiO₂ and RbNO3, used as the source for exfoliation and as Raman reference.2 characterizations7 properties3 figuresExperimentalRb₂Ti₂O₅Studied MaterialExpand
Mechanically exfoliated Rb₂Ti₂O₅ nanocrystal on Si/SiO₂ substrate, measured by AFM and micro-Raman spectroscopy.1 preparation2 characterizations9 properties2 figuresExperimentalRb₂Ti₂O₅Studied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Lateral two-terminal device based on an exfoliated Rb₂Ti₂O₅ nanocrystal contacted by Ti/Au electrodes on Si/SiO2.3 preparations1 characterization2 properties1 figureExperimentalRb₂Ti₂O₅Studied MaterialTiCapping Or ContactAuCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationRb₂Ti₂O5: a layered ionic conductor at the sub-micrometer scaleValerio Digiorgio, Karen Sobnath, Maria Luisa Della Rocca, Clément Barraud et al.Applied Physics Letters·2024·10.1063/5.0225828·arXiv:2407.15490AbstractThe paper investigates the structural and electrical properties of layered Rb₂Ti₂O₅ (RTO) at the sub-micrometer scale. Mechanically exfoliated RTO nanocrystals are characterized by AFM and micro-Raman spectroscopy, and a lateral two-terminal device is fabricated on an exfoliated flake to probe electrical response. The work shows that exfoliation preserves the layered structure, Raman signatures vary primarily with sample hydration rather than thickness in the studied range, and the low-dimensional device retains the memristive-like electrical behavior known for bulk crystals.Read more
Bulk Rb₂Ti₂O₅ single crystal grown from TiO₂ and RbNO3, used as the source for exfoliation and as Raman reference.2 characterizations7 properties3 figuresExperimentalRb₂Ti₂O₅Studied MaterialExpand
Mechanically exfoliated Rb₂Ti₂O₅ nanocrystal on Si/SiO₂ substrate, measured by AFM and micro-Raman spectroscopy.1 preparation2 characterizations9 properties2 figuresExperimentalRb₂Ti₂O₅Studied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Lateral two-terminal device based on an exfoliated Rb₂Ti₂O₅ nanocrystal contacted by Ti/Au electrodes on Si/SiO2.3 preparations1 characterization2 properties1 figureExperimentalRb₂Ti₂O₅Studied MaterialTiCapping Or ContactAuCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationRb₂Ti₂O5: a layered ionic conductor at the sub-micrometer scaleValerio Digiorgio, Karen Sobnath, Maria Luisa Della Rocca, Clément Barraud et al.Applied Physics Letters·2024·10.1063/5.0225828·arXiv:2407.15490AbstractThe paper investigates the structural and electrical properties of layered Rb₂Ti₂O₅ (RTO) at the sub-micrometer scale. Mechanically exfoliated RTO nanocrystals are characterized by AFM and micro-Raman spectroscopy, and a lateral two-terminal device is fabricated on an exfoliated flake to probe electrical response. The work shows that exfoliation preserves the layered structure, Raman signatures vary primarily with sample hydration rather than thickness in the studied range, and the low-dimensional device retains the memristive-like electrical behavior known for bulk crystals.Read more
Bulk Rb₂Ti₂O₅ single crystal grown from TiO₂ and RbNO3, used as the source for exfoliation and as Raman reference.2 characterizations7 properties3 figuresExperimentalRb₂Ti₂O₅Studied MaterialExpand
Mechanically exfoliated Rb₂Ti₂O₅ nanocrystal on Si/SiO₂ substrate, measured by AFM and micro-Raman spectroscopy.1 preparation2 characterizations9 properties2 figuresExperimentalRb₂Ti₂O₅Studied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Lateral two-terminal device based on an exfoliated Rb₂Ti₂O₅ nanocrystal contacted by Ti/Au electrodes on Si/SiO2.3 preparations1 characterization2 properties1 figureExperimentalRb₂Ti₂O₅Studied MaterialTiCapping Or ContactAuCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
