Research paperExperimental CharacterizationComputational Kinetic ModelSimultaneously monitoring Ga adsorption and desorption kinetics on GaN(0001) using four in situ techniquesHuaide Zhang, Philipp John, Jingxuan Kang, Lutz Geelhaar et al.2026·arXiv:2605.22279AbstractWe present a systematic investigation of Ga adsorption and desorption kinetics on the wurtzite GaN(0001) surface using four in situ techniques operated simultaneously: reflection high-energy electron diffraction, laser reflectometry, line-of-sight quadrupole mass spectrometry, and optical pyrometry. Flux- and temperature-dependent experiments are performed for Ga coverages ranging from the submonolayer to the droplet regime. Despite their distinct transient responses, the signals from all four techniques and their trends with surface coverage are quantitatively reproduced by a unified kinetic model of Ga adsorption, diffusion, and desorption. An Arrhenius analysis of the Ga adlayer desorption yields an activation energy of (2.87 ± 0.04) eV.Read more
Commercial unintentionally doped GaN/Al₂O₃ template fabricated by MOCVD, with a Ti backside coating used for radiative heating.3 characterizations3 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand
GaN buffer layer grown by plasma-assisted MBE on the GaN/Al₂O₃ template under Ga-stable conditions, used for the adsorption-desorption experiments.5 characterizations7 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand
Research paperExperimental CharacterizationComputational Kinetic ModelSimultaneously monitoring Ga adsorption and desorption kinetics on GaN(0001) using four in situ techniquesHuaide Zhang, Philipp John, Jingxuan Kang, Lutz Geelhaar et al.2026·arXiv:2605.22279AbstractWe present a systematic investigation of Ga adsorption and desorption kinetics on the wurtzite GaN(0001) surface using four in situ techniques operated simultaneously: reflection high-energy electron diffraction, laser reflectometry, line-of-sight quadrupole mass spectrometry, and optical pyrometry. Flux- and temperature-dependent experiments are performed for Ga coverages ranging from the submonolayer to the droplet regime. Despite their distinct transient responses, the signals from all four techniques and their trends with surface coverage are quantitatively reproduced by a unified kinetic model of Ga adsorption, diffusion, and desorption. An Arrhenius analysis of the Ga adlayer desorption yields an activation energy of (2.87 ± 0.04) eV.Read more
Commercial unintentionally doped GaN/Al₂O₃ template fabricated by MOCVD, with a Ti backside coating used for radiative heating.3 characterizations3 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand
GaN buffer layer grown by plasma-assisted MBE on the GaN/Al₂O₃ template under Ga-stable conditions, used for the adsorption-desorption experiments.5 characterizations7 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand
Research paperExperimental CharacterizationComputational Kinetic ModelSimultaneously monitoring Ga adsorption and desorption kinetics on GaN(0001) using four in situ techniquesHuaide Zhang, Philipp John, Jingxuan Kang, Lutz Geelhaar et al.2026·arXiv:2605.22279AbstractWe present a systematic investigation of Ga adsorption and desorption kinetics on the wurtzite GaN(0001) surface using four in situ techniques operated simultaneously: reflection high-energy electron diffraction, laser reflectometry, line-of-sight quadrupole mass spectrometry, and optical pyrometry. Flux- and temperature-dependent experiments are performed for Ga coverages ranging from the submonolayer to the droplet regime. Despite their distinct transient responses, the signals from all four techniques and their trends with surface coverage are quantitatively reproduced by a unified kinetic model of Ga adsorption, diffusion, and desorption. An Arrhenius analysis of the Ga adlayer desorption yields an activation energy of (2.87 ± 0.04) eV.Read more
Commercial unintentionally doped GaN/Al₂O₃ template fabricated by MOCVD, with a Ti backside coating used for radiative heating.3 characterizations3 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand
GaN buffer layer grown by plasma-assisted MBE on the GaN/Al₂O₃ template under Ga-stable conditions, used for the adsorption-desorption experiments.5 characterizations7 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand
Research paperExperimental CharacterizationComputational Kinetic ModelSimultaneously monitoring Ga adsorption and desorption kinetics on GaN(0001) using four in situ techniquesHuaide Zhang, Philipp John, Jingxuan Kang, Lutz Geelhaar et al.2026·arXiv:2605.22279AbstractWe present a systematic investigation of Ga adsorption and desorption kinetics on the wurtzite GaN(0001) surface using four in situ techniques operated simultaneously: reflection high-energy electron diffraction, laser reflectometry, line-of-sight quadrupole mass spectrometry, and optical pyrometry. Flux- and temperature-dependent experiments are performed for Ga coverages ranging from the submonolayer to the droplet regime. Despite their distinct transient responses, the signals from all four techniques and their trends with surface coverage are quantitatively reproduced by a unified kinetic model of Ga adsorption, diffusion, and desorption. An Arrhenius analysis of the Ga adlayer desorption yields an activation energy of (2.87 ± 0.04) eV.Read more
Commercial unintentionally doped GaN/Al₂O₃ template fabricated by MOCVD, with a Ti backside coating used for radiative heating.3 characterizations3 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand
GaN buffer layer grown by plasma-assisted MBE on the GaN/Al₂O₃ template under Ga-stable conditions, used for the adsorption-desorption experiments.5 characterizations7 properties5 figuresExperimentalGaNStudied MaterialAl₂O₃Substrate / DielectricTiCapping Or ContactExpand