Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Monolayer MoS₂ transistor grown on SiO₂/Si, transferred to Al₂O₃ back-gate dielectric on flexible PEN substrate with Au source/drain contacts; measured under uniaxial tensile strain.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Monolayer MoS₂ transistor grown on SiO₂/Si, transferred to Al₂O₃ back-gate dielectric on flexible PEN substrate with Au source/drain contacts; measured under uniaxial tensile strain.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Monolayer MoS₂ transistor grown on SiO₂/Si, transferred to Al₂O₃ back-gate dielectric on flexible PEN substrate with Au source/drain contacts; measured under uniaxial tensile strain.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Monolayer MoS₂ transistor grown on SiO₂/Si, transferred to Al₂O₃ back-gate dielectric on flexible PEN substrate with Au source/drain contacts; measured under uniaxial tensile strain.