Research paper
Experimental GrowthExperimental CharacterizationComputational DFT| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | regex-detected PL peak | 300nm | — | — | — | — |
Combined electronic excitation and knock-on damage in monolayer MoS2
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | regex-detected PL peak | 300nm | — | — | — | — |
Combined electronic excitation and knock-on damage in monolayer MoS2
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | regex-detected PL peak | 300nm | — | — | — | — |
Combined electronic excitation and knock-on damage in monolayer MoS2
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| PL Peak | regex-detected PL peak | 300nm | — | — | — | — |
Combined electronic excitation and knock-on damage in monolayer MoS2