Research paper
Experimental CharacterizationComputational DFT| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Layer Thickness | MoS₂ thickness | 0.7nm | — | |||
| Raman Peak | E2g | —cm⁻¹ | — | |||
| Raman Peak | A1g | —cm⁻¹ | — | |||
| PL Peak | exciton/trion emission | —eV | — | |||
| Fet Threshold Voltage | threshold voltage | 0.36V | — | |||
| Fet Subthreshold Swing | SS | 75mV/dec | — | |||
| Fet On Current | ON current | 400uA | — | |||
| Fet On Current | ON current | 200uA/um | — | |||
| Fet On Current | ON current | 30uA/um | — | |||
| Fet On Current | ON current | 1.5uA/um | — | |||
| Equivalent Oxide Thickness | EOT | 0.86nm | — | |||
| Fet Subthreshold Swing | SS | 80mV/dec | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Layer Thickness | MoS₂ thickness | 0.7nm | — | |||
| Raman Peak | E2g | —cm⁻¹ | — | |||
| Raman Peak | A1g | —cm⁻¹ | — | |||
| PL Peak | exciton/trion emission | —eV | — | |||
| Fet Threshold Voltage | threshold voltage | 0.36V | — | |||
| Fet Subthreshold Swing | SS | 75mV/dec | — | |||
| Fet On Current | ON current | 400uA | — | |||
| Fet On Current | ON current | 200uA/um | — | |||
| Fet On Current | ON current | 30uA/um | — | |||
| Fet On Current | ON current | 1.5uA/um | — | |||
| Equivalent Oxide Thickness | EOT | 0.86nm | — | |||
| Fet Subthreshold Swing | SS | 80mV/dec | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Layer Thickness | MoS₂ thickness | 0.7nm | — | |||
| Raman Peak | E2g | —cm⁻¹ | — | |||
| Raman Peak | A1g | —cm⁻¹ | — | |||
| PL Peak | exciton/trion emission | —eV | — | |||
| Fet Threshold Voltage | threshold voltage | 0.36V | — | |||
| Fet Subthreshold Swing | SS | 75mV/dec | — | |||
| Fet On Current | ON current | 400uA | — | |||
| Fet On Current | ON current | 200uA/um | — | |||
| Fet On Current | ON current | 30uA/um | — | |||
| Fet On Current | ON current | 1.5uA/um | — | |||
| Equivalent Oxide Thickness | EOT | 0.86nm | — | |||
| Fet Subthreshold Swing | SS | 80mV/dec | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Layer Thickness | MoS₂ thickness | 0.7nm | — | |||
| Raman Peak | E2g | —cm⁻¹ | — | |||
| Raman Peak | A1g | —cm⁻¹ | — | |||
| PL Peak | exciton/trion emission | —eV | — | |||
| Fet Threshold Voltage | threshold voltage | 0.36V | — | |||
| Fet Subthreshold Swing | SS | 75mV/dec | — | |||
| Fet On Current | ON current | 400uA | — | |||
| Fet On Current | ON current | 200uA/um | — | |||
| Fet On Current | ON current | 30uA/um | — | |||
| Fet On Current | ON current | 1.5uA/um | — | |||
| Equivalent Oxide Thickness | EOT | 0.86nm | — | |||
| Fet Subthreshold Swing | SS | 80mV/dec | — |