GAN-BASED SCHOTTKY BARRIER DIODE WITH FIELD PLATE | Matter42 Literature
Patent
Atlas literature
Patent
US 8,643,134
GAN-BASED SCHOTTKY BARRIER DIODE WITH FIELD PLATE
Madhan Raj, Richard J. Brown, Thomas R. Prunty, David P. Bour et al.
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
3 independent · 6 dependent
1
Independent
App l. No. 13/300,028 PATENT Am dt. dated Reply to Office Action of Amendments to the Claims: This listing of claims will replace all prior versions, and listings of claims in the application: Listing of Claims: 1.-13. canceled
14
IndependentIII-nitride epitaxial materialspin-on dielectric materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
A I II -nitride semiconductor device comprising: an active region for supporting current flow during operation of the I II -nitride semiconductor device, the active region comprising a I II-nitride epitaxial material; and a field plate region physically adjacent to the active region, the field plate region including: the I II -nitride epitaxial material; SVG 13300028.08-22-2013.HKOIUO₇WPXXIFW3.CLM.1.svg 0.16 5.35 Black and white and a second surface of the I II -nitride epitaxial material, wherein the second surface is angled with respect to the first surface; and a metal coupled to the spin-on dielectric material.
17
Dependent← claim 14spin-on dielectric materialIII-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein a first surface of the spin-on dielectric material is angled with respect to a second surface of the spin-on dielectric material.
20
Dependent← claim 14III-nitride epitaxial materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein the metal comprises a Schottky metal structure coupled with a portion of the I II -nitride epitaxial material, the Schottky metal structure forming a Schottky barrier with the portion of the III- nitride epitaxial material.
15
Independent
canceled
16
Dependent← claim 15III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein an angle between the first surface and the second surface is between 45 0 and 90 0.
21
Dependent← claim 15spin-on dielectric materialbenzocyclobutene (BCB)spin-on glass (SOG)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein the spin-on dielectric material includes at least one of benzocyclobutene (BCB) or spin-on glass (SOG). Page 3 of 6
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
III-nitride Schottky barrier diode with field plate
metal (field plate metal/Schottky metal)field plate metal electrode
spin-on dielectric materialfield plate dielectric
III-nitride epitaxial materialactive region epitaxial layer
Materials
Materials described outside the worked examples.
III-nitride epitaxial material
Active Region And Field Plate Semiconductor
spin-on dielectric material
Field Plate Dielectric
metal (field plate metal/Schottky metal)
Why these are connected
Related documents with shared materials, methods, properties, or citations.
Madhan Raj, Richard J. Brown, Thomas R. Prunty, David P. Bour et al.
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
3 independent · 6 dependent
1
Independent
App l. No. 13/300,028 PATENT Am dt. dated Reply to Office Action of Amendments to the Claims: This listing of claims will replace all prior versions, and listings of claims in the application: Listing of Claims: 1.-13. canceled
14
IndependentIII-nitride epitaxial materialspin-on dielectric materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
A I II -nitride semiconductor device comprising: an active region for supporting current flow during operation of the I II -nitride semiconductor device, the active region comprising a I II-nitride epitaxial material; and a field plate region physically adjacent to the active region, the field plate region including: the I II -nitride epitaxial material; SVG 13300028.08-22-2013.HKOIUO₇WPXXIFW3.CLM.1.svg 0.16 5.35 Black and white and a second surface of the I II -nitride epitaxial material, wherein the second surface is angled with respect to the first surface; and a metal coupled to the spin-on dielectric material.
17
Dependent← claim 14spin-on dielectric materialIII-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein a first surface of the spin-on dielectric material is angled with respect to a second surface of the spin-on dielectric material.
20
Dependent← claim 14III-nitride epitaxial materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein the metal comprises a Schottky metal structure coupled with a portion of the I II -nitride epitaxial material, the Schottky metal structure forming a Schottky barrier with the portion of the III- nitride epitaxial material.
15
Independent
canceled
16
Dependent← claim 15III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein an angle between the first surface and the second surface is between 45 0 and 90 0.
21
Dependent← claim 15spin-on dielectric materialbenzocyclobutene (BCB)spin-on glass (SOG)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein the spin-on dielectric material includes at least one of benzocyclobutene (BCB) or spin-on glass (SOG). Page 3 of 6
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
III-nitride Schottky barrier diode with field plate
metal (field plate metal/Schottky metal)field plate metal electrode
spin-on dielectric materialfield plate dielectric
III-nitride epitaxial materialactive region epitaxial layer
Materials
Materials described outside the worked examples.
III-nitride epitaxial material
Active Region And Field Plate Semiconductor
spin-on dielectric material
Field Plate Dielectric
metal (field plate metal/Schottky metal)
Why these are connected
Related documents with shared materials, methods, properties, or citations.
Madhan Raj, Richard J. Brown, Thomas R. Prunty, David P. Bour et al.
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
3 independent · 6 dependent
1
Independent
App l. No. 13/300,028 PATENT Am dt. dated Reply to Office Action of Amendments to the Claims: This listing of claims will replace all prior versions, and listings of claims in the application: Listing of Claims: 1.-13. canceled
14
IndependentIII-nitride epitaxial materialspin-on dielectric materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
A I II -nitride semiconductor device comprising: an active region for supporting current flow during operation of the I II -nitride semiconductor device, the active region comprising a I II-nitride epitaxial material; and a field plate region physically adjacent to the active region, the field plate region including: the I II -nitride epitaxial material; SVG 13300028.08-22-2013.HKOIUO₇WPXXIFW3.CLM.1.svg 0.16 5.35 Black and white and a second surface of the I II -nitride epitaxial material, wherein the second surface is angled with respect to the first surface; and a metal coupled to the spin-on dielectric material.
17
Dependent← claim 14spin-on dielectric materialIII-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein a first surface of the spin-on dielectric material is angled with respect to a second surface of the spin-on dielectric material.
20
Dependent← claim 14III-nitride epitaxial materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein the metal comprises a Schottky metal structure coupled with a portion of the I II -nitride epitaxial material, the Schottky metal structure forming a Schottky barrier with the portion of the III- nitride epitaxial material.
15
Independent
canceled
16
Dependent← claim 15III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein an angle between the first surface and the second surface is between 45 0 and 90 0.
21
Dependent← claim 15spin-on dielectric materialbenzocyclobutene (BCB)spin-on glass (SOG)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein the spin-on dielectric material includes at least one of benzocyclobutene (BCB) or spin-on glass (SOG). Page 3 of 6
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
III-nitride Schottky barrier diode with field plate
metal (field plate metal/Schottky metal)field plate metal electrode
spin-on dielectric materialfield plate dielectric
III-nitride epitaxial materialactive region epitaxial layer
Materials
Materials described outside the worked examples.
III-nitride epitaxial material
Active Region And Field Plate Semiconductor
spin-on dielectric material
Field Plate Dielectric
metal (field plate metal/Schottky metal)
Why these are connected
Related documents with shared materials, methods, properties, or citations.
Madhan Raj, Richard J. Brown, Thomas R. Prunty, David P. Bour et al.
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
3 independent · 6 dependent
1
Independent
App l. No. 13/300,028 PATENT Am dt. dated Reply to Office Action of Amendments to the Claims: This listing of claims will replace all prior versions, and listings of claims in the application: Listing of Claims: 1.-13. canceled
14
IndependentIII-nitride epitaxial materialspin-on dielectric materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
A I II -nitride semiconductor device comprising: an active region for supporting current flow during operation of the I II -nitride semiconductor device, the active region comprising a I II-nitride epitaxial material; and a field plate region physically adjacent to the active region, the field plate region including: the I II -nitride epitaxial material; SVG 13300028.08-22-2013.HKOIUO₇WPXXIFW3.CLM.1.svg 0.16 5.35 Black and white and a second surface of the I II -nitride epitaxial material, wherein the second surface is angled with respect to the first surface; and a metal coupled to the spin-on dielectric material.
17
Dependent← claim 14spin-on dielectric materialIII-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein a first surface of the spin-on dielectric material is angled with respect to a second surface of the spin-on dielectric material.
20
Dependent← claim 14III-nitride epitaxial materialmetal (field plate metal/Schottky metal)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 14 wherein the metal comprises a Schottky metal structure coupled with a portion of the I II -nitride epitaxial material, the Schottky metal structure forming a Schottky barrier with the portion of the III- nitride epitaxial material.
15
Independent
canceled
16
Dependent← claim 15III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein an angle between the first surface and the second surface is between 45 0 and 90 0.
21
Dependent← claim 15spin-on dielectric materialbenzocyclobutene (BCB)spin-on glass (SOG)III-nitride Schottky barrier diode with field plate
The I II -nitride semiconductor device of claim 15 wherein the spin-on dielectric material includes at least one of benzocyclobutene (BCB) or spin-on glass (SOG). Page 3 of 6
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
III-nitride Schottky barrier diode with field plate
metal (field plate metal/Schottky metal)field plate metal electrode
spin-on dielectric materialfield plate dielectric
III-nitride epitaxial materialactive region epitaxial layer
Materials
Materials described outside the worked examples.
III-nitride epitaxial material
Active Region And Field Plate Semiconductor
spin-on dielectric material
Field Plate Dielectric
metal (field plate metal/Schottky metal)
Why these are connected
Related documents with shared materials, methods, properties, or citations.