Patent
US 12,155,005 B2sapphire
Al₂O₃
silicon dioxide mask
SiO₂
aluminum gallium nitride nucleation layer
AlGaN
n-type gallium nitride (silicon-doped)
GaN:Si
p-type gallium nitride (magnesium-doped)
GaN:Mg
indium gallium nitride quantum well layer
InGaN
FIG. 4A is a SEM image of nitride-based LED devices, according to some aspects of the present disclosure.
| — |
Thickness | 2–4 nm | — |
Temperature | 1000–1400 °C | — |
Thickness | 3–20 nm | — |
Cited non-patent literature · 3
sapphire
Al₂O₃
silicon dioxide mask
SiO₂
aluminum gallium nitride nucleation layer
AlGaN
n-type gallium nitride (silicon-doped)
GaN:Si
p-type gallium nitride (magnesium-doped)
GaN:Mg
indium gallium nitride quantum well layer
InGaN
FIG. 4A is a SEM image of nitride-based LED devices, according to some aspects of the present disclosure.
| — |
Thickness | 2–4 nm | — |
Temperature | 1000–1400 °C | — |
Thickness | 3–20 nm | — |
Cited non-patent literature · 3
sapphire
Al₂O₃
silicon dioxide mask
SiO₂
aluminum gallium nitride nucleation layer
AlGaN
n-type gallium nitride (silicon-doped)
GaN:Si
p-type gallium nitride (magnesium-doped)
GaN:Mg
indium gallium nitride quantum well layer
InGaN
FIG. 4A is a SEM image of nitride-based LED devices, according to some aspects of the present disclosure.
| — |
Thickness | 2–4 nm | — |
Temperature | 1000–1400 °C | — |
Thickness | 3–20 nm | — |
Cited non-patent literature · 3
sapphire
Al₂O₃
silicon dioxide mask
SiO₂
aluminum gallium nitride nucleation layer
AlGaN
n-type gallium nitride (silicon-doped)
GaN:Si
p-type gallium nitride (magnesium-doped)
GaN:Mg
indium gallium nitride quantum well layer
InGaN
FIG. 4A is a SEM image of nitride-based LED devices, according to some aspects of the present disclosure.
| — |
Thickness | 2–4 nm | — |
Temperature | 1000–1400 °C | — |
Thickness | 3–20 nm | — |
Cited non-patent literature · 3