Patent
US 8,940,576phosphine derivative
PR₁R₂R₃
halogenated phosphine derivative
phosphine oxide or phosphine oxide derivative
Si (111)
Si
SiC
phosphine fragments
n-doped graphene
diphosphine
P₂H₄
FIG. 4 is a table of electrical results for phosphine doping of graphene using different doping methods and substrates, as described in Example 2. [0025]
FIG. 5 is a table of electrical results for phosphine doping of graphene on SiC substrates, as described in Example 3.
n-doped graphene |
Pressure | 10–760 torr | — |
Duration | 60–86400 s | — |
Duration | 600–3600 s | — |
Temperature | 600–900 °C | — |
Pressure | 10–50 torr | — |
Thickness | 10–100 mm | — |
Duration | ≤ 1 hour | — |
Duration | ≤ 1 minute | — |
Temperature | ≤ 400 °C | — |
Temperature | ≤ 1200 °C | — |
Thickness | ≤ 500 nm | — |
Thickness | ≤ 1 nm | — |
Pressure | ≤ 50 torr | — |
Pressure | ≥ 10 torr | — |
phosphine derivative
PR₁R₂R₃
halogenated phosphine derivative
phosphine oxide or phosphine oxide derivative
Si (111)
Si
SiC
phosphine fragments
n-doped graphene
diphosphine
P₂H₄
FIG. 4 is a table of electrical results for phosphine doping of graphene using different doping methods and substrates, as described in Example 2. [0025]
FIG. 5 is a table of electrical results for phosphine doping of graphene on SiC substrates, as described in Example 3.
n-doped graphene |
Pressure | 10–760 torr | — |
Duration | 60–86400 s | — |
Duration | 600–3600 s | — |
Temperature | 600–900 °C | — |
Pressure | 10–50 torr | — |
Thickness | 10–100 mm | — |
Duration | ≤ 1 hour | — |
Duration | ≤ 1 minute | — |
Temperature | ≤ 400 °C | — |
Temperature | ≤ 1200 °C | — |
Thickness | ≤ 500 nm | — |
Thickness | ≤ 1 nm | — |
Pressure | ≤ 50 torr | — |
Pressure | ≥ 10 torr | — |
phosphine derivative
PR₁R₂R₃
halogenated phosphine derivative
phosphine oxide or phosphine oxide derivative
Si (111)
Si
SiC
phosphine fragments
n-doped graphene
diphosphine
P₂H₄
FIG. 4 is a table of electrical results for phosphine doping of graphene using different doping methods and substrates, as described in Example 2. [0025]
FIG. 5 is a table of electrical results for phosphine doping of graphene on SiC substrates, as described in Example 3.
n-doped graphene |
Pressure | 10–760 torr | — |
Duration | 60–86400 s | — |
Duration | 600–3600 s | — |
Temperature | 600–900 °C | — |
Pressure | 10–50 torr | — |
Thickness | 10–100 mm | — |
Duration | ≤ 1 hour | — |
Duration | ≤ 1 minute | — |
Temperature | ≤ 400 °C | — |
Temperature | ≤ 1200 °C | — |
Thickness | ≤ 500 nm | — |
Thickness | ≤ 1 nm | — |
Pressure | ≤ 50 torr | — |
Pressure | ≥ 10 torr | — |
phosphine derivative
PR₁R₂R₃
halogenated phosphine derivative
phosphine oxide or phosphine oxide derivative
Si (111)
Si
SiC
phosphine fragments
n-doped graphene
diphosphine
P₂H₄
FIG. 4 is a table of electrical results for phosphine doping of graphene using different doping methods and substrates, as described in Example 2. [0025]
FIG. 5 is a table of electrical results for phosphine doping of graphene on SiC substrates, as described in Example 3.
n-doped graphene |
Pressure | 10–760 torr | — |
Duration | 60–86400 s | — |
Duration | 600–3600 s | — |
Temperature | 600–900 °C | — |
Pressure | 10–50 torr | — |
Thickness | 10–100 mm | — |
Duration | ≤ 1 hour | — |
Duration | ≤ 1 minute | — |
Temperature | ≤ 400 °C | — |
Temperature | ≤ 1200 °C | — |
Thickness | ≤ 500 nm | — |
Thickness | ≤ 1 nm | — |
Pressure | ≤ 50 torr | — |
Pressure | ≥ 10 torr | — |