Abstract

We report the design and fabrication of guiding patterns for topography-based searching of two-dimensional (2D) devices for scanning tunneling microscopy (STM) measurements. Sub-micron geometric coordinate markers were etched into SiO₂/Si wafers, serving as both substrates for 2D device integration and guiding maps for sample navigation. Here, we used a monolayer graphene/h-BN device with an active area of smaller than 20 µm × 20 µm as a model system and demonstrated that the device could be reliably located in STM solely through topographic imaging of the guiding patterns and in situ stage calibration, without reliance on optical viewports or capacitive sensing. Atomically resolved topographic imaging and tunneling spectroscopy were also obtained.

Abstract

We report the design and fabrication of guiding patterns for topography-based searching of two-dimensional (2D) devices for scanning tunneling microscopy (STM) measurements. Sub-micron geometric coordinate markers were etched into SiO₂/Si wafers, serving as both substrates for 2D device integration and guiding maps for sample navigation. Here, we used a monolayer graphene/h-BN device with an active area of smaller than 20 µm × 20 µm as a model system and demonstrated that the device could be reliably located in STM solely through topographic imaging of the guiding patterns and in situ stage calibration, without reliance on optical viewports or capacitive sensing. Atomically resolved topographic imaging and tunneling spectroscopy were also obtained.

Abstract

We report the design and fabrication of guiding patterns for topography-based searching of two-dimensional (2D) devices for scanning tunneling microscopy (STM) measurements. Sub-micron geometric coordinate markers were etched into SiO₂/Si wafers, serving as both substrates for 2D device integration and guiding maps for sample navigation. Here, we used a monolayer graphene/h-BN device with an active area of smaller than 20 µm × 20 µm as a model system and demonstrated that the device could be reliably located in STM solely through topographic imaging of the guiding patterns and in situ stage calibration, without reliance on optical viewports or capacitive sensing. Atomically resolved topographic imaging and tunneling spectroscopy were also obtained.

Abstract

We report the design and fabrication of guiding patterns for topography-based searching of two-dimensional (2D) devices for scanning tunneling microscopy (STM) measurements. Sub-micron geometric coordinate markers were etched into SiO₂/Si wafers, serving as both substrates for 2D device integration and guiding maps for sample navigation. Here, we used a monolayer graphene/h-BN device with an active area of smaller than 20 µm × 20 µm as a model system and demonstrated that the device could be reliably located in STM solely through topographic imaging of the guiding patterns and in situ stage calibration, without reliance on optical viewports or capacitive sensing. Atomically resolved topographic imaging and tunneling spectroscopy were also obtained.