Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

A. Niggas; M. Hao; P. Richter; F. Simperl; F. Blödorn; M. Cap; J. Kero; D. Hofmann; A. Bellissimo; J. Burgdörfer; T. Seyller; R.A. Wilhelm; F. Libisch; W.S.M. Werner

doi:10.55776/DOC142

Paper

Atlas literature

Research paper

Experimental CharacterizationComputational DFT

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

A. Niggas, M. Hao, P. Richter, F. Simperl et al.

Physical Review Letters·2025·10.55776/DOC142·arXiv:2501.06228

Samples

Each sample groups how it was prepared, characterized, and measured. Click a card to expand.

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

2 preparations1 characterization2 properties2 figures

ExperimentalCStudied Material

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

2 preparations1 characterization1 property2 figures

ExperimentalCStudied Material

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

2 preparations1 characterization1 property2 figures

ExperimentalCStudied Material

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials | Matter42 Literature

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

Identifying Electronic Doorway States in the Secondary Electron Emission from Layered Materials

Samples

Quasi-freestanding single-layer graphene sample fabricated by annealing epitaxially grown zero-layer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Quasi-freestanding bilayer graphene sample fabricated by annealing epitaxially grown monolayer graphene on 4H-SiC(0001) in hydrogen atmosphere.

Highly oriented pyrolytic graphite (ZYB quality) sample mechanically exfoliated in air before introduction into vacuum.

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Why these are connected

Why these are connected