Research paper
Experimental GrowthExperimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Xrd Rocking Fwhm | (001) | 1.3deg | — | |||
| Xrd Rocking Fwhm | (100) | 2.1deg | — | |||
| Afm Rms Roughness | RMS surface roughness | 1.4nm | — | |||
| Afm Rms Roughness | RMS surface roughness | 0.9nm | — | |||
| Fet Carrier Concentration | carrier density | 10^21-10^22cm⁻³ | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Xrd Rocking Fwhm | (001) | 1.3deg | — | |||
| Xrd Rocking Fwhm | (100) | 2.1deg | — | |||
| Afm Rms Roughness | RMS surface roughness | 1.4nm | — | |||
| Afm Rms Roughness | RMS surface roughness | 0.9nm | — | |||
| Fet Carrier Concentration | carrier density | 10^21-10^22cm⁻³ | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Xrd Rocking Fwhm | (001) | 1.3deg | — | |||
| Xrd Rocking Fwhm | (100) | 2.1deg | — | |||
| Afm Rms Roughness | RMS surface roughness | 1.4nm | — | |||
| Afm Rms Roughness | RMS surface roughness | 0.9nm | — | |||
| Fet Carrier Concentration | carrier density | 10^21-10^22cm⁻³ | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Xrd Rocking Fwhm | (001) | 1.3deg | — | |||
| Xrd Rocking Fwhm | (100) | 2.1deg | — | |||
| Afm Rms Roughness | RMS surface roughness | 1.4nm | — | |||
| Afm Rms Roughness | RMS surface roughness | 0.9nm | — | |||
| Fet Carrier Concentration | carrier density | 10^21-10^22cm⁻³ | — |