Research paper
Experimental GrowthExperimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | InAs0.84Sb0.16 buffer thickness | 300nm | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 8.3% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 1.5% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 0.8% | — | |||
| Growth Temperature | PbSe growth temperature | 320°C | — | |||
| Growth Rate | PbSe growth rate | 2-3nm/min | — | |||
| Critical Thickness | equilibrium critical thickness for 60° misfit dislocations | 80nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 70nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 100nm | — |
Kinetics micro-parameters not linked to a specific simulation record.
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | InAs0.84Sb0.16 buffer thickness | 300nm | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 8.3% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 1.5% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 0.8% | — | |||
| Growth Temperature | PbSe growth temperature | 320°C | — | |||
| Growth Rate | PbSe growth rate | 2-3nm/min | — | |||
| Critical Thickness | equilibrium critical thickness for 60° misfit dislocations | 80nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 70nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 100nm | — |
Kinetics micro-parameters not linked to a specific simulation record.
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | InAs0.84Sb0.16 buffer thickness | 300nm | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 8.3% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 1.5% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 0.8% | — | |||
| Growth Temperature | PbSe growth temperature | 320°C | — | |||
| Growth Rate | PbSe growth rate | 2-3nm/min | — | |||
| Critical Thickness | equilibrium critical thickness for 60° misfit dislocations | 80nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 70nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 100nm | — |
Kinetics micro-parameters not linked to a specific simulation record.
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | PbSe film thickness | 50nm | — | |||
| Film Thickness | InAs0.84Sb0.16 buffer thickness | 300nm | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 8.3% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 1.5% | — | |||
| Lattice Mismatch | compressive mismatch at growth temperature | 0.8% | — | |||
| Growth Temperature | PbSe growth temperature | 320°C | — | |||
| Growth Rate | PbSe growth rate | 2-3nm/min | — | |||
| Critical Thickness | equilibrium critical thickness for 60° misfit dislocations | 80nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 70nm | — | |||
| Critical Thickness | equilibrium critical thickness for edge misfit dislocations | 100nm | — |
Kinetics micro-parameters not linked to a specific simulation record.
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