Patent
absorption layer depth (embodiment) | — | GaAs |
absorption layer doping concentration (embodiment) | — | GaAs |
emitter layer depth (embodiment) | — | GaAs |
emitter layer doping concentration (embodiment) | — | GaAs |
heterojunction layer depth (embodiment) | — | AlGaAs |
heterojunction layer doping concentration (embodiment) | — | AlGaAs |
emitter-contact layer depth (embodiment) | — | GaAs |
emitter-contact layer doping concentration (embodiment) | — | GaAs |
BSF layer depth (embodiment) | — | AlGaAs |
BSF layer doping concentration (embodiment) | — | AlGaAs |
BSF-contact layer depth (embodiment) | — | GaAs |
BSF-contact layer doping concentration (embodiment) | — | GaAs |
Thickness | 1000–3000 nm | — |
Thickness | ≤ 40 nm | — |
Thickness | ≤ 3000 nm | — |
Thickness | ≤ 180 nm | — |
Thickness | ≤ 50 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 120 nm | — |
Thickness | ≥ 30 nm | — |
Thickness | ≤ 21 nm | — |
Thickness | ≤ 2200 nm | — |
Thickness | ≤ 22 nm | — |
Thickness | ≤ 155 nm | — |
Thickness | ≤ 42 nm | — |
Thickness | ≥ 19 nm | — |
Thickness | ≥ 1800 nm | — |
Thickness | ≥ 145 nm | — |
Thickness | ≥ 38 nm | — |
absorption layer depth (embodiment) | — | GaAs |
absorption layer doping concentration (embodiment) | — | GaAs |
emitter layer depth (embodiment) | — | GaAs |
emitter layer doping concentration (embodiment) | — | GaAs |
heterojunction layer depth (embodiment) | — | AlGaAs |
heterojunction layer doping concentration (embodiment) | — | AlGaAs |
emitter-contact layer depth (embodiment) | — | GaAs |
emitter-contact layer doping concentration (embodiment) | — | GaAs |
BSF layer depth (embodiment) | — | AlGaAs |
BSF layer doping concentration (embodiment) | — | AlGaAs |
BSF-contact layer depth (embodiment) | — | GaAs |
BSF-contact layer doping concentration (embodiment) | — | GaAs |
Thickness | 1000–3000 nm | — |
Thickness | ≤ 40 nm | — |
Thickness | ≤ 3000 nm | — |
Thickness | ≤ 180 nm | — |
Thickness | ≤ 50 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 120 nm | — |
Thickness | ≥ 30 nm | — |
Thickness | ≤ 21 nm | — |
Thickness | ≤ 2200 nm | — |
Thickness | ≤ 22 nm | — |
Thickness | ≤ 155 nm | — |
Thickness | ≤ 42 nm | — |
Thickness | ≥ 19 nm | — |
Thickness | ≥ 1800 nm | — |
Thickness | ≥ 145 nm | — |
Thickness | ≥ 38 nm | — |
absorption layer depth (embodiment) | — | GaAs |
absorption layer doping concentration (embodiment) | — | GaAs |
emitter layer depth (embodiment) | — | GaAs |
emitter layer doping concentration (embodiment) | — | GaAs |
heterojunction layer depth (embodiment) | — | AlGaAs |
heterojunction layer doping concentration (embodiment) | — | AlGaAs |
emitter-contact layer depth (embodiment) | — | GaAs |
emitter-contact layer doping concentration (embodiment) | — | GaAs |
BSF layer depth (embodiment) | — | AlGaAs |
BSF layer doping concentration (embodiment) | — | AlGaAs |
BSF-contact layer depth (embodiment) | — | GaAs |
BSF-contact layer doping concentration (embodiment) | — | GaAs |
Thickness | 1000–3000 nm | — |
Thickness | ≤ 40 nm | — |
Thickness | ≤ 3000 nm | — |
Thickness | ≤ 180 nm | — |
Thickness | ≤ 50 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 120 nm | — |
Thickness | ≥ 30 nm | — |
Thickness | ≤ 21 nm | — |
Thickness | ≤ 2200 nm | — |
Thickness | ≤ 22 nm | — |
Thickness | ≤ 155 nm | — |
Thickness | ≤ 42 nm | — |
Thickness | ≥ 19 nm | — |
Thickness | ≥ 1800 nm | — |
Thickness | ≥ 145 nm | — |
Thickness | ≥ 38 nm | — |
absorption layer depth (embodiment) | — | GaAs |
absorption layer doping concentration (embodiment) | — | GaAs |
emitter layer depth (embodiment) | — | GaAs |
emitter layer doping concentration (embodiment) | — | GaAs |
heterojunction layer depth (embodiment) | — | AlGaAs |
heterojunction layer doping concentration (embodiment) | — | AlGaAs |
emitter-contact layer depth (embodiment) | — | GaAs |
emitter-contact layer doping concentration (embodiment) | — | GaAs |
BSF layer depth (embodiment) | — | AlGaAs |
BSF layer doping concentration (embodiment) | — | AlGaAs |
BSF-contact layer depth (embodiment) | — | GaAs |
BSF-contact layer doping concentration (embodiment) | — | GaAs |
Thickness | 1000–3000 nm | — |
Thickness | ≤ 40 nm | — |
Thickness | ≤ 3000 nm | — |
Thickness | ≤ 180 nm | — |
Thickness | ≤ 50 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 120 nm | — |
Thickness | ≥ 30 nm | — |
Thickness | ≤ 21 nm | — |
Thickness | ≤ 2200 nm | — |
Thickness | ≤ 22 nm | — |
Thickness | ≤ 155 nm | — |
Thickness | ≤ 42 nm | — |
Thickness | ≥ 19 nm | — |
Thickness | ≥ 1800 nm | — |
Thickness | ≥ 145 nm | — |
Thickness | ≥ 38 nm | — |